Number | Name | Date | Kind |
---|---|---|---|
4544882 | Flora | Oct 1985 | |
4585955 | Uchida | Apr 1986 | |
4639919 | Chang et al. | Jan 1987 | |
4841485 | Prilik et al. | Jun 1989 | |
4871963 | Cozzi | Oct 1989 | |
4872168 | Aadsen et al. | Oct 1989 | |
5101409 | Hack | Mar 1992 | |
5138619 | Frasang et al. | Aug 1992 |
Entry |
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Bardell, P. H. et al., "Self-Test of Random-Access Memories," IBM Technical Disclosure Bulletin, vol. 26, No. 1, Jun. 1983, pp. 336-340. |
Cha, C. W. et al., "Array Test Pattern Generation Algorithms for a Per Pin Tester," IBM Technical Disclosure Bulletin, vol. 30, No. 10, Mar. 1988, pp. 116-122. |