Bernd Srocka

Person

Berlin, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method and assembly for determining the thickness of a layer in a s...
- Patent number 10,132,612
- Issue date Nov 20, 2018
- HSEB Dresden GmbH
- Bernd Srocka
- G01 - MEASURING TESTING
Information Patent Grant
Measurement method for height profiles of surfaces using a differen...
- Patent number 9,671,602
- Issue date Jun 6, 2017
- HSEB Dresden GmbH
- Christine Schmidt
- G02 - OPTICS
Information Patent Grant
Inspection apparatus
- Patent number 9,646,372
- Issue date May 9, 2017
- HSEB Dresden GmbH
- Bernd Srocka
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and assembly for determining the thickness of a layer in a s...
- Patent number 9,587,930
- Issue date Mar 7, 2017
- HSEB Dresden GmbH
- Bernd Srocka
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting buried layers
- Patent number 9,500,582
- Issue date Nov 22, 2016
- HSEB Dresden GmbH
- Bernd Srocka
- G01 - MEASURING TESTING
Information Patent Grant
Inspection arrangement
- Patent number 9,217,633
- Issue date Dec 22, 2015
- HSEB Dresden GmbH
- Bernd Srocka
- G01 - MEASURING TESTING
Information Patent Grant
Inspection assembly
- Patent number 9,176,070
- Issue date Nov 3, 2015
- HSEB Dresden GmbH
- Bernd Srocka
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method with color correction
- Patent number 8,837,807
- Issue date Sep 16, 2014
- HSEB Dresden GmbH
- Bernd Srocka
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system
- Patent number 8,817,089
- Issue date Aug 26, 2014
- HSEB Dresden GmbH
- Bernd Srocka
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for determining a characteristic of a semiconduct...
- Patent number 7,265,571
- Issue date Sep 4, 2007
- Accent Optical Technologies Nanometrics, Inc.
- Bernd Srocka
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for determining the dependence of a first measuri...
- Patent number 6,526,372
- Issue date Feb 25, 2003
- Aoti Operating Company, Inc.
- Benno Orschel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Assembly for Determining the Thickness of a Layer in a S...
- Publication number 20170115112
- Publication date Apr 27, 2017
- HSEB Dresden GmbH
- Bernd Srocka
- G01 - MEASURING TESTING
Information Patent Application
Method and Assembly for Determining the Thickness of a Layer in a S...
- Publication number 20170030707
- Publication date Feb 2, 2017
- HSEB Dresden GmbH
- Bernd Srocka
- G01 - MEASURING TESTING
Information Patent Application
Inspection Apparatus
- Publication number 20150317783
- Publication date Nov 5, 2015
- HSEB Dresden GmbH
- Bernd SROCKA
- G01 - MEASURING TESTING
Information Patent Application
Inspection Assembly
- Publication number 20150285745
- Publication date Oct 8, 2015
- HSEB Dresden GmbH
- Bernd Srocka
- G01 - MEASURING TESTING
Information Patent Application
Inspection Arrangement
- Publication number 20150124245
- Publication date May 7, 2015
- HSEB Dresden GmbH
- Bernd Srocka
- G01 - MEASURING TESTING
Information Patent Application
Measurement Method For Height Profiles Of Surfaces
- Publication number 20150049348
- Publication date Feb 19, 2015
- Christine Schmidt
- G02 - OPTICS
Information Patent Application
Inspection Method
- Publication number 20150036915
- Publication date Feb 5, 2015
- Arman Siahkali
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method For Detecting Buried Layers
- Publication number 20150014542
- Publication date Jan 15, 2015
- HSEB Dresden GmbH
- Bernd Srocka
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD
- Publication number 20120114220
- Publication date May 10, 2012
- HSEB Dresden GmbH
- Bernd Srocka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM
- Publication number 20120113243
- Publication date May 10, 2012
- HSEB Dresden GmbH
- Bernd Srocka
- G01 - MEASURING TESTING
Information Patent Application
Method and device for determining a characteristic of a semicondcto...
- Publication number 20060192573
- Publication date Aug 31, 2006
- Accent Optical Technologies, Inc.
- Bernd Srocka
- G01 - MEASURING TESTING

Bernd Srocka

Person

Patents Grantslast 30 patents

Method and assembly for determining the thickness of a layer in a s...

Measurement method for height profiles of surfaces using a differen...

Inspection apparatus

Method and assembly for determining the thickness of a layer in a s...

Method for detecting buried layers

Inspection arrangement

Inspection assembly

Inspection method with color correction

Inspection system

Method and device for determining a characteristic of a semiconduct...

Method and device for determining the dependence of a first measuri...

Patents Applicationslast 30 patents

Method and Assembly for Determining the Thickness of a Layer in a S...

Method and Assembly for Determining the Thickness of a Layer in a S...

Inspection Apparatus

Inspection Assembly

Inspection Arrangement

Measurement Method For Height Profiles Of Surfaces

Inspection Method

Method For Detecting Buried Layers

INSPECTION METHOD

INSPECTION SYSTEM

Method and device for determining a characteristic of a semicondcto...