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Bernhard Buettgen
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Adliswil, CH
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Patents Grants
last 30 patents
Information
Patent Grant
Optoelectronic modules operable to recognize spurious reflections a...
Patent number
11,543,505
Issue date
Jan 3, 2023
ams Sensors Singapore Pte. Ltd.
Jens Kubacki
G01 - MEASURING TESTING
Information
Patent Grant
Optoelectronic modules operable to recognize spurious reflections a...
Patent number
11,536,815
Issue date
Dec 27, 2022
ams Sensors Singapore Pte. Ltd.
Jens Kubacki
G01 - MEASURING TESTING
Information
Patent Grant
Optical ranging systems including optical cross-talk reducing features
Patent number
11,226,402
Issue date
Jan 18, 2022
ams Sensors Singapore Pte. Ltd.
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor devices
Patent number
10,861,889
Issue date
Dec 8, 2020
ams Sensors Singapore Pte. Ltd.
Bernhard Buettgen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optoelectronic modules operable to recognize spurious reflections a...
Patent number
10,705,192
Issue date
Jul 7, 2020
ams Sensors Singapore Pte. Ltd.
Jens Kubacki
G01 - MEASURING TESTING
Information
Patent Grant
Optoelectronic modules for the acquisition of spectral and distance...
Patent number
10,578,739
Issue date
Mar 3, 2020
ams Sensors Singapore Pte. Ltd.
Bernhard Buettgen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optoelectronic modules for distance measurements and supplemental m...
Patent number
10,466,355
Issue date
Nov 5, 2019
ams Sensors Singapore Pte. Ltd.
Bernhard Buettgen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optoelectronic modules operable to collect spectral data and distan...
Patent number
10,418,410
Issue date
Sep 17, 2019
ams Sensors Singapore Pte. Ltd.
Bernhard Buettgen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optoelectronic modules operable to collect distance data via time-o...
Patent number
10,401,496
Issue date
Sep 3, 2019
ams Sensors Singapore Pte. Ltd.
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Grant
Optical imaging modules and optical detection modules including a t...
Patent number
10,359,505
Issue date
Jul 23, 2019
ams Sensors Singapore Pte. Ltd.
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Grant
Time of flight-based systems operable for ambient light and distanc...
Patent number
10,295,657
Issue date
May 21, 2019
ams Sensors Singapore Pte. Ltd.
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Grant
Quantum dot film based demodulation structures
Patent number
10,236,400
Issue date
Mar 19, 2019
Heptagon Micro Optics Pte. Ltd.
Daniel Furrer
G01 - MEASURING TESTING
Information
Patent Grant
System and method for multi TOF camera operation using phase hopping
Patent number
9,857,469
Issue date
Jan 2, 2018
Heptagon Micro Optics Pte. Ltd.
Thierry Oggier
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Multi-path compensation using multiple modulation frequencies in ti...
Patent number
9,753,128
Issue date
Sep 5, 2017
Heptagon Micro Optics Pte. Ltd.
Matthias Schweizer
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Demodulation pixel incorporating majority carrier current, buried c...
Patent number
9,698,196
Issue date
Jul 4, 2017
Heptagon Micro Optics Pte. Ltd.
Bernhard Buettgen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Demodulation sensor with separate pixel and storage arrays
Patent number
9,442,196
Issue date
Sep 13, 2016
Heptagon Micro Optics Pte. Ltd.
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Grant
Multi-level digital modulation for time of flight method and system
Patent number
9,341,715
Issue date
May 17, 2016
Heptagon Micro Optics Pte. Ltd.
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Grant
PN-structured gate demodulation pixel
Patent number
9,343,607
Issue date
May 17, 2016
Heptagon Micro Optics Pte. Ltd.
Bernhard Buettgen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Time of flight sensor with subframe compression and method
Patent number
9,140,795
Issue date
Sep 22, 2015
Mesa Imaging AG
Michael Lehmann
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
3D CCD-style imaging sensor with rolling readout
Patent number
9,076,709
Issue date
Jul 7, 2015
Mesa Imaging AG
Jonas Felber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sense node capacitive structure for time of flight sensor
Patent number
9,000,349
Issue date
Apr 7, 2015
Mesa Imaging AG
Michael Lehmann
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sensor pixel array and separated array of storage and accumulation...
Patent number
8,829,408
Issue date
Sep 9, 2014
Mesa Imaging AG
Thierry Oggier
G01 - MEASURING TESTING
Information
Patent Grant
Multistage demodulation pixel and method
Patent number
8,754,939
Issue date
Jun 17, 2014
Mesa Imaging AG
Thierry Oggier
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Adaptive neighborhood filtering (ANF) system and method for 3D time...
Patent number
8,223,215
Issue date
Jul 17, 2012
Mesa Imaging AG
Thierry Oggier
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for the demodulation of modulated electromagnetic...
Patent number
8,115,158
Issue date
Feb 14, 2012
Mesa Imaging AG
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Grant
On-chip time-based digital conversion of pixel outputs
Patent number
7,889,257
Issue date
Feb 15, 2011
Mesa Imaging AG
Thierry Oggier
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for the demodulation electromagnetic wave fields...
Patent number
7,884,310
Issue date
Feb 8, 2011
Mesa Imaging AG
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for the demodulation of modulated electric signals
Patent number
7,671,671
Issue date
Mar 2, 2010
Mesa Imaging AG
Bernhard Buettgen
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Reference pixel array with varying sensitivities for time of flight...
Patent number
7,586,077
Issue date
Sep 8, 2009
Mesa Imaging AG
Michael Lehmann
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTOELECTRONIC MODULES OPERABLE TO RECOGNIZE SPURIOUS REFLECTIONS A...
Publication number
20200319320
Publication date
Oct 8, 2020
ams Sensors Singapore Pte. Ltd.
Jens Kubacki
G01 - MEASURING TESTING
Information
Patent Application
OPTOELECTRONIC MODULES OPERABLE TO RECOGNIZE SPURIOUS REFLECTIONS A...
Publication number
20200319321
Publication date
Oct 8, 2020
ams Sensors Singapore Pte. Ltd.
Jens Kubacki
G01 - MEASURING TESTING
Information
Patent Application
DEMODULATION PIXEL DEVICES, ARRAYS OF PIXEL DEVICES AND OPTOELECTRO...
Publication number
20200066771
Publication date
Feb 27, 2020
HEPTAGON MICRO OPTICS PTE. LTD.
Gözen Köklü
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICES
Publication number
20190027516
Publication date
Jan 24, 2019
HEPTAGON MICRO OPTICS PTE. LTD.
Bernhard Buettgen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTOELECTRONIC MODULES OPERABLE TO COLLECT SPECTRAL DATA AND DISTAN...
Publication number
20180301498
Publication date
Oct 18, 2018
HEPTAGON MICRO OPTICS PTE. LTD.
Bernhard Buettgen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTOELECTRONIC MODULES FOR THE ACQUISITION OF SPECTRAL AND DISTANCE...
Publication number
20180284273
Publication date
Oct 4, 2018
HEPTAGON MICRO OPTICS PTE. LTD.
Bernhard Buettgen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGING SYSTEMS INCLUDING MULTI-TAP DEMODULATION PIXELS FOR BIOMETR...
Publication number
20180064399
Publication date
Mar 8, 2018
HEPTAGON MICRO OPTICS PTE. LTD.
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Application
TIME OF FLIGHT-BASED SYSTEMS OPERABLE FOR AMBIENT LIGHT AND DISTANC...
Publication number
20180059218
Publication date
Mar 1, 2018
HEPTAGON MICRO OPTICS PTE. LTD.
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Application
OPTOELECTRONIC MODULES FOR DISTANCE MEASUREMENTS AND SUPPLEMENTAL M...
Publication number
20180059246
Publication date
Mar 1, 2018
HEPTAGON MICRO OPTICS PTE. LTD.
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL RANGING SYSTEMS INCLUDING OPTICAL CROSS-TALK REDUCING FEATURES
Publication number
20170356982
Publication date
Dec 14, 2017
HEPTAGON MICRO OPTICS PTE. LTD.
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Application
QUANTUM DOT FILM BASED DEMODULATION STRUCTURES
Publication number
20170222076
Publication date
Aug 3, 2017
HEPTAGON MICRO OPTICS PTE. LTD.
Daniel Furrer
G01 - MEASURING TESTING
Information
Patent Application
OPTOELECTRONIC DEVICE INCLUDING EVENT-DRIVEN PHOTO-ARRAY AND METHOD...
Publication number
20170153107
Publication date
Jun 1, 2017
HEPTAGON MICRO OPTICS PTE. LTD.
Stephan Beer
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL IMAGING MODULES AND OPTICAL DETECTION MODULES INCLUDING A T...
Publication number
20170090018
Publication date
Mar 30, 2017
HEPTAGON MICRO OPTICS PTE. LTD.
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Application
OPTOELECTRONIC MODULES OPERABLE TO COLLECT DISTANCE DATA VIA TIME-O...
Publication number
20170090020
Publication date
Mar 30, 2017
HEPTAGON MICRO OPTICS PTE. LTD.
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Application
OPTOELECTRONIC MODULES OPERABLE TO RECOGNIZE SPURIOUS REFLECTIONS A...
Publication number
20170038459
Publication date
Feb 9, 2017
Heptogaon Micro Optics Pte Ltd.
Jens Kubacki
G01 - MEASURING TESTING
Information
Patent Application
PN-Structured Gate Demodulation Pixel
Publication number
20130248938
Publication date
Sep 26, 2013
Bernhard Buettgen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Sensor Pixel Array and Separated Array of Storage and Accumulation...
Publication number
20130140433
Publication date
Jun 6, 2013
MESA IMAGING AG
Thierry Oggier
G01 - MEASURING TESTING
Information
Patent Application
Time of Flight Sensor with Subframe Compression and Method
Publication number
20130070132
Publication date
Mar 21, 2013
Michael Lehmann
G01 - MEASURING TESTING
Information
Patent Application
System and Method for Multi TOF Camera Operation Using Phase Hopping
Publication number
20120098964
Publication date
Apr 26, 2012
MESA IMAGING AG
Thierry Oggier
G01 - MEASURING TESTING
Information
Patent Application
Multi-Path Compensation Using Multiple Modulation Frequencies in Ti...
Publication number
20120033045
Publication date
Feb 9, 2012
MESA IMAGING AG
Matthias Schweizer
G01 - MEASURING TESTING
Information
Patent Application
Multi-Level Digital Modulation for Time of Flight Method and System
Publication number
20110299059
Publication date
Dec 8, 2011
MESA IMAGING AG
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Application
Multistage Demodulation Pixel and Method
Publication number
20110273561
Publication date
Nov 10, 2011
MESA IMAGING AG
Thierry Oggier
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Demodulation Sensor with Separate Pixel and Storage Arrays
Publication number
20110164132
Publication date
Jul 7, 2011
MESA IMAGING AG
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Application
Device and Method for the Demodulation of Modulated Electromagnetic...
Publication number
20110101206
Publication date
May 5, 2011
MESA IMAGING AG
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Application
Demodulation Pixel Incorporating Majority Carrier Current, Buried C...
Publication number
20110089471
Publication date
Apr 21, 2011
MESA IMAGING AG
Bernhard Buettgen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Demodulation Pixel with Daisy Chain Charge Storage Sites and Method...
Publication number
20100053405
Publication date
Mar 4, 2010
MESA IMAGING AG
Michael Lehmann
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Drift Field Demodulation Pixel with Pinned Photo Diode
Publication number
20090224139
Publication date
Sep 10, 2009
MESA IMAGING AG
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Application
Adaptive Neighborhood Filtering (ANF) System and Method for 3D Time...
Publication number
20090190007
Publication date
Jul 30, 2009
MESA IMAGING AG
Thierry Oggier
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Reference Pixel Array with Varying Sensitivities for TOF Sensor
Publication number
20090020687
Publication date
Jan 22, 2009
MESA IMAGING AG
Michael Lehmann
G01 - MEASURING TESTING
Information
Patent Application
On-chip time-based digital conversion of pixel outputs
Publication number
20090021617
Publication date
Jan 22, 2009
MESA IMAGING AG
Thierry Oggier
G01 - MEASURING TESTING