Bernhard Gunter MUELLER

Person

Finsing, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for automated critical dimension measurement on a substrate...
- Patent number 11,687,008
- Issue date Jun 27, 2023
- Applied Materials, Inc.
- Bernhard G. Mueller
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of automatically focusing a charged particle beam on a surfa...
- Patent number 11,610,755
- Issue date Mar 21, 2023
- Applied Materials, Inc.
- Robert Trauner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of automatically focusing a charged particle beam on a surfa...
- Patent number 11,195,691
- Issue date Dec 7, 2021
- Applied Materials, Inc.
- Robert Trauner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting a sample with a charged particle beam device,...
- Patent number 10,345,250
- Issue date Jul 9, 2019
- Applied Materials, Inc.
- Bernhard G. Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus configured for enhanced vacuum ultraviolet (VUV) spectral...
- Patent number 10,109,451
- Issue date Oct 23, 2018
- Applied Materials, Inc.
- Georg Jost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for electrostatic discharge (ESD) reduction
- Patent number 8,531,198
- Issue date Sep 10, 2013
- Applied Materials, Inc.
- Bernhard Gunter Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for active voltage compensation of electrostat...
- Patent number 8,493,084
- Issue date Jul 23, 2013
- Applied Materials, Inc.
- Bernhard Mueller
- G01 - MEASURING TESTING
Information Patent Grant
Light-assisted testing of an optoelectronic module
- Patent number 8,222,911
- Issue date Jul 17, 2012
- Applied Materials GmbH
- Bernhard Gunter Mueller
- G02 - OPTICS
Information Patent Grant
Method for beam calibration and usage of a calibration body
- Patent number 8,009,299
- Issue date Aug 30, 2011
- Applied Materials GmbH
- Matthias Brunner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF IMAGING A SAMPLE WITH A CHARGED PARTICLE BEAM DEVICE, MET...
- Publication number 20230253177
- Publication date Aug 10, 2023
- Applied Materials, Inc.
- Kulpreet Singh VIRDI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF INSPECTING A SAMPLE, AND MULTI-ELECTRON BEAM INSPECTION S...
- Publication number 20230133404
- Publication date May 4, 2023
- Applied Materials, Inc.
- Bernhard G. MUELLER
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AUTOMATICALLY FOCUSING A CHARGED PARTICLE BEAM ON A SURFA...
- Publication number 20220044907
- Publication date Feb 10, 2022
- Applied Materials, Inc.
- Robert TRAUNER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR AUTOMATED CRITICAL DIMENSION MEASUREMENT ON A SUBSTRATE...
- Publication number 20210373444
- Publication date Dec 2, 2021
- Applied Materials, Inc.
- Bernhard G. MUELLER
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AUTOMATICALLY FOCUSING A CHARGED PARTICLE BEAM ON A SURFA...
- Publication number 20210249220
- Publication date Aug 12, 2021
- Applied Materials, Inc.
- Robert TRAUNER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR SELECTIVE AUTOFOCUS
- Publication number 20200118786
- Publication date Apr 16, 2020
- Applied Materials, Inc.
- Bernhard G. MUELLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF INSPECTING A SAMPLE WITH A CHARGED PARTICLE BEAM DEVICE,...
- Publication number 20190113470
- Publication date Apr 18, 2019
- Applied Materials, Inc.
- Bernhard G. MUELLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING A SAMPLE
- Publication number 20180364563
- Publication date Dec 20, 2018
- Applied Materials, Inc.
- Kulpreet Singh VIRDI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS CONFIGURED FOR ENHANCED VACUUM ULTRAVIOLET (VUV) SPECTRAL...
- Publication number 20180233317
- Publication date Aug 16, 2018
- Applied Materials, Inc.
- Georg JOST
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR ACTIVE VOLTAGE COMPENSATION OF ELECTROSTAT...
- Publication number 20130278280
- Publication date Oct 24, 2013
- Bernhard G. MUELLER
- G01 - MEASURING TESTING
Information Patent Application
ELECTROSTATIC DISCHARGE PREVENTION FOR LARGE AREA SUBSTRATE PROCESS...
- Publication number 20120113559
- Publication date May 10, 2012
- Applied Materials, Inc.
- Hung T. Nguyen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR ELECTROSTATIC DISCHARGE (ESD) REDUCTION
- Publication number 20110291683
- Publication date Dec 1, 2011
- Applied Materials, Inc.
- Bernhard Gunter MUELLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR BEAM CALIBRATION AND USAGE OF A CALIBRATION BODY
- Publication number 20100188666
- Publication date Jul 29, 2010
- APPLIED MATERIALS GMBH
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
APPARATUS AND METHOD FOR ACTIVE VOLTAGE COMPENSATION
- Publication number 20100097086
- Publication date Apr 22, 2010
- Applied Materials, Inc.
- Bernhard MUELLER
- G01 - MEASURING TESTING
Information Patent Application
LIGHT-ASSISTED TESTING OF AN OPTOELECTRONIC MODULE
- Publication number 20090179656
- Publication date Jul 16, 2009
- APPLIED MATERIALS GMBH
- Bernhard Gunter Mueller
- G02 - OPTICS

Bernhard Gunter MUELLER

Person

Patents Grantslast 30 patents

Method for automated critical dimension measurement on a substrate...

Method of automatically focusing a charged particle beam on a surfa...

Method of automatically focusing a charged particle beam on a surfa...

Method of inspecting a sample with a charged particle beam device,...

Apparatus configured for enhanced vacuum ultraviolet (VUV) spectral...

Apparatus and method for electrostatic discharge (ESD) reduction

Apparatus and method for active voltage compensation of electrostat...

Light-assisted testing of an optoelectronic module

Method for beam calibration and usage of a calibration body

Patents Applicationslast 30 patents

METHOD OF IMAGING A SAMPLE WITH A CHARGED PARTICLE BEAM DEVICE, MET...

METHOD OF INSPECTING A SAMPLE, AND MULTI-ELECTRON BEAM INSPECTION S...

METHOD OF AUTOMATICALLY FOCUSING A CHARGED PARTICLE BEAM ON A SURFA...

METHOD FOR AUTOMATED CRITICAL DIMENSION MEASUREMENT ON A SUBSTRATE...

METHOD OF AUTOMATICALLY FOCUSING A CHARGED PARTICLE BEAM ON A SURFA...

SYSTEM AND METHOD FOR SELECTIVE AUTOFOCUS

METHOD OF INSPECTING A SAMPLE WITH A CHARGED PARTICLE BEAM DEVICE,...

METHOD AND APPARATUS FOR INSPECTING A SAMPLE

APPARATUS CONFIGURED FOR ENHANCED VACUUM ULTRAVIOLET (VUV) SPECTRAL...

APPARATUS AND METHOD FOR ACTIVE VOLTAGE COMPENSATION OF ELECTROSTAT...

ELECTROSTATIC DISCHARGE PREVENTION FOR LARGE AREA SUBSTRATE PROCESS...

APPARATUS AND METHOD FOR ELECTROSTATIC DISCHARGE (ESD) REDUCTION

METHOD FOR BEAM CALIBRATION AND USAGE OF A CALIBRATION BODY

APPARATUS AND METHOD FOR ACTIVE VOLTAGE COMPENSATION

LIGHT-ASSISTED TESTING OF AN OPTOELECTRONIC MODULE