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Bernhard H. Radziuk
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Frickingen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Light source
Patent number
7,871,183
Issue date
Jan 18, 2011
PerkinElmer Singapore PTE. LTD.
David H. Tracy
G01 - MEASURING TESTING
Information
Patent Grant
Method of instrument standardization for a spectroscopic device
Patent number
7,656,521
Issue date
Feb 2, 2010
PerkinElmer LAS, Inc.
Yongdong Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method of instrument standardization for a spectroscopic device
Patent number
7,405,821
Issue date
Jul 29, 2008
PerkinElmer LAS, Inc.
Yongdong Wang
G01 - MEASURING TESTING
Information
Patent Grant
Light source
Patent number
7,372,564
Issue date
May 13, 2008
PerkinElmer Singapore PTE. LTD.
David H. Tracy
G01 - MEASURING TESTING
Information
Patent Grant
Atom absorption spectroscopy method and atom absorption spectrometer
Patent number
7,167,238
Issue date
Jan 23, 2007
PerkinElmer Singapore PTE. LTD.
Bernhard H. Radziuk
G01 - MEASURING TESTING
Information
Patent Grant
Method of instrument standardization for a spectroscopic device
Patent number
7,145,650
Issue date
Dec 5, 2006
PerkinElmer LAS, Inc.
Yongdong Wang
G01 - MEASURING TESTING
Information
Patent Grant
Light source
Patent number
7,088,445
Issue date
Aug 8, 2006
Berthold GmbH & Co. KG
David H. Tracy
G01 - MEASURING TESTING
Information
Patent Grant
Atom absorption spectroscopy method and atom absorption spectrometer
Patent number
6,977,725
Issue date
Dec 20, 2005
PerkinElmer Singapore PTE. LTD.
Bernhard H. Radziuk
G01 - MEASURING TESTING
Information
Patent Grant
Electrothermal furnace for an atomic absorption spectrometer
Patent number
6,552,786
Issue date
Apr 22, 2003
Berthold GmbH & Co. KG
Wolfgang Frech
G01 - MEASURING TESTING
Information
Patent Grant
Detector device to be used in atomic absorption spectroscopy
Patent number
6,229,604
Issue date
May 8, 2001
Bodenseewerk Perkin-Elmer GmbH
Bernhard Radziuk
G01 - MEASURING TESTING
Information
Patent Grant
Atomic absorption spectrometer
Patent number
6,222,626
Issue date
Apr 24, 2001
Bodenseewerk Perkin-Elmer GmbH
Bernhard Radziuk
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer with wavelength calibration
Patent number
5,777,733
Issue date
Jul 7, 1998
Bodenseewerk Perkin-Elmer GmbH
Bernhard Radziuk
G01 - MEASURING TESTING
Information
Patent Grant
Multielement atomic absorption spectrometer and measurement method...
Patent number
5,594,547
Issue date
Jan 14, 1997
Bodenseewerk Perkin-Elmer GmbH
Gunther Rodel
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method Of Instrument Standardization For A Spectroscopic Device
Publication number
20080246956
Publication date
Oct 9, 2008
Yongdong Wang
G01 - MEASURING TESTING
Information
Patent Application
Light Source
Publication number
20080165534
Publication date
Jul 10, 2008
PerkinElmer Singapore Pte. Ltd.
David H. Tracy
G01 - MEASURING TESTING
Information
Patent Application
Method Of Instrument Standardization For A Spectroscopic Device
Publication number
20070046933
Publication date
Mar 1, 2007
Yongdong Wang
G01 - MEASURING TESTING
Information
Patent Application
Atom absorption spectroscopy method and atom absorption spectrometer
Publication number
20060066849
Publication date
Mar 30, 2006
Bernhard H. Radziuk
G01 - MEASURING TESTING
Information
Patent Application
Light source
Publication number
20060038991
Publication date
Feb 23, 2006
David H. Tracy
G01 - MEASURING TESTING
Information
Patent Application
Atom absorption spectroscopy method and atom absorption spectrometer
Publication number
20030197861
Publication date
Oct 23, 2003
Bernhard H. Radziuk
G01 - MEASURING TESTING
Information
Patent Application
Method of instrument standardization for a spectroscopic device
Publication number
20030160954
Publication date
Aug 28, 2003
Yongdong Wang
G01 - MEASURING TESTING
Information
Patent Application
Light source
Publication number
20030151740
Publication date
Aug 14, 2003
David H. Tracy
G01 - MEASURING TESTING