Bette Jaye Whalen

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Vestal, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for in-situ testing of integrated circuit chips
- Patent number 6,414,509
- Issue date Jul 2, 2002
- International Business Machines Corporation
- Anilkumar Chinuprasad Bhatt
- G01 - MEASURING TESTING