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Hsin-Chu, TW
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device structure with resistive element
Patent number
11,901,289
Issue date
Feb 13, 2024
Taiwan Semiconductor Manufacturing Company, Ltd
Wan-Te Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device structure with resistive element
Patent number
11,404,369
Issue date
Aug 2, 2022
Taiwan Semiconductor Manufacturing Co., Ltd
Wan-Te Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Circuit layout method
Patent number
10,978,440
Issue date
Apr 13, 2021
Taiwan Semiconductor Manufacturing Company, Ltd
Shou-En Liu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Circuit layout, layout method and system for implementing the method
Patent number
10,403,621
Issue date
Sep 3, 2019
Taiwan Semiconductor Manufacturing Company, Ltd
Shou-En Liu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device structure with resistive element
Patent number
10,304,772
Issue date
May 28, 2019
Taiwan Semiconductor Manufacturing Co., Ltd
Wan-Te Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device components and methods
Patent number
9,875,964
Issue date
Jan 23, 2018
Taiwan Semiconductor Manufacturing Company, Ltd.
Bi-Ling Lin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and structure for dissipating heat away from a resistor havi...
Patent number
8,848,374
Issue date
Sep 30, 2014
Taiwan Semiconductor Manufacturing Company, Ltd.
Jian-Hong Lin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device components and methods
Patent number
8,648,592
Issue date
Feb 11, 2014
Taiwan Semiconductor Manufacturing Company, Ltd.
Bi-Ling Lin
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring a property of interconnections and structure f...
Patent number
7,646,207
Issue date
Jan 12, 2010
Taiwan Semiconductor Manufacturing Co., Ltd
Jian-Hong Lin
G01 - MEASURING TESTING
Information
Patent Grant
Method to reduce the gate induced drain leakage current in CMOS dev...
Patent number
6,548,363
Issue date
Apr 15, 2003
Taiwan Semiconductor Manufacturing Company
Chung-Cheng Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Drain leakage reduction by indium transient enchanced diffusion (TE...
Patent number
6,284,579
Issue date
Sep 4, 2001
Taiwan Semiconductor Manufacturing Company
Jyh-Haur Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process to improve temperature uniformity during RTA by deposition...
Patent number
6,100,150
Issue date
Aug 8, 2000
Taiwan Semiconductor Manufacturing Company
Jiaw-Ren Shih
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE STRUCTURE WITH RESISTIVE ELEMENT
Publication number
20220319987
Publication date
Oct 6, 2022
Taiwan Semiconductor Manufacturing Company, Ltd.
Wan-Te CHEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CIRCUIT LAYOUT METHOD
Publication number
20190363075
Publication date
Nov 28, 2019
Taiwan Semiconductor Manufacturing Company, Ltd.
Shou-En LIU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE STRUCTURE WITH RESISTIVE ELEMENT
Publication number
20190279933
Publication date
Sep 12, 2019
Taiwan Semiconductor Manufacturing Co., Ltd.
Wan-Te CHEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE STRUCTURE WITH RESISTIVE ELEMENT
Publication number
20180337125
Publication date
Nov 22, 2018
Taiwan Semiconductor Manufacturing Co., Ltd.
Wan-Te CHEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CIRCUIT LAYOUT, LAYOUT METHOD AND SYSTEM FOR IMPLEMENTING THE METHOD
Publication number
20160126232
Publication date
May 5, 2016
Taiwan Semiconductor Manufacturing Company, Ltd.
Shou-En LIU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor Device Components and Methods
Publication number
20140145194
Publication date
May 29, 2014
Taiwan Semiconductor Manufacturing Company, Ltd.
Bi-Ling Lin
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor Device Components and Methods
Publication number
20130063175
Publication date
Mar 14, 2013
Taiwan Semiconductor Manufacturing Company, Ltd.
Bi-Ling Lin
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND STRUCTURE FOR DISSIPATING HEAT AWAY FROM A RESISTOR HAVI...
Publication number
20120002375
Publication date
Jan 5, 2012
Taiwan Semiconductor Manufacturing Company, Ltd.
Jian-Hong LIN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
USB CONTROLLER AND EXECUTION METHOD THEREOF
Publication number
20110219166
Publication date
Sep 8, 2011
Pixart Imaging Inc.
Bi Hue Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR MEASURING A PROPERTY OF INTERCONNECTIONS AND STRUCTURE F...
Publication number
20090058434
Publication date
Mar 5, 2009
Taiwan Semiconductor Manufacturing Co., LTD
Jian-Hong Lin
G01 - MEASURING TESTING