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Bing Ren
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Cary, NC, US
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Patents Grants
last 30 patents
Information
Patent Grant
System and method for testing one or more dies on a semiconductor w...
Patent number
7,449,909
Issue date
Nov 11, 2008
Infineon Technologies AG
David SuitWai Ma
G11 - INFORMATION STORAGE
Information
Patent Grant
System and method for testing one or more dies on a semiconductor w...
Patent number
7,242,208
Issue date
Jul 10, 2007
Infineon Technologies AG
David SuitWai Ma
G11 - INFORMATION STORAGE
Information
Patent Grant
System and method for testing one or more dies on a semiconductor w...
Patent number
7,119,567
Issue date
Oct 10, 2006
Infineon Technologies North America Corp.
David SuitWai Ma
G11 - INFORMATION STORAGE
Information
Patent Grant
Leadless socket for decapped semiconductor device
Patent number
6,702,589
Issue date
Mar 9, 2004
Infineon Technologies AG
David SuitWai Ma
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
System and method for testing one or more dies on a semiconductor w...
Publication number
20070152700
Publication date
Jul 5, 2007
David SuitWai Ma
G01 - MEASURING TESTING
Information
Patent Application
System and method for testing one or more dies on a semiconductor w...
Publication number
20060158209
Publication date
Jul 20, 2006
Infineon Technologies AG
David SuitWai Ma
G01 - MEASURING TESTING
Information
Patent Application
System and method for testing one or more dies on a semiconductor w...
Publication number
20040054951
Publication date
Mar 18, 2004
David SuitWai Ma
G01 - MEASURING TESTING
Information
Patent Application
LEADLESS SOCKET FOR DECAPPED SEMICONDUCTOR DEVICE
Publication number
20040033707
Publication date
Feb 19, 2004
Infineon Technologies North America Corp.
David SuitWai Ma
G01 - MEASURING TESTING