Gilroy, CA, US
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Patent Grant
Applied Materials, Inc.
Upendra V. Ummethala
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Applied Materials, Inc.
Upendra Ummethala
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Applied Materials, Inc.
Varoujan Chakarian
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Applied Materials, Inc.
Patrick Tae
G01 - MEASURING TESTING
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Patent Grant
Applied Materials, Inc.
Patrick Tae
G01 - MEASURING TESTING
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Patent Grant
Applied Materials, Inc.
Blake Erickson
G01 - MEASURING TESTING
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Patent Grant
Applied Materials, Inc.
Keith Berding
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Applied Materials, Inc.
Upendra Ummethala
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Applied Materials, Inc.
Upendra V. Ummethala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Applied Materials, Inc.
Blake Erickson
G01 - MEASURING TESTING
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Patent Grant
Applied Materials, Inc.
Blake Erickson
G01 - MEASURING TESTING
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Patent Grant
Applied Materials, Inc.
Upendra V. Ummethala
D14 - Recording, communication, or information retrieval equipment
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Patent Grant
Applied Materials, Inc.
Upendra Ummethala
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Applied Materials, Inc.
Patrick Tae
G01 - MEASURING TESTING
Information
Patent Application
Applied Materials, Inc.
Upendra Ummethala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Applied Materials, Inc.
Patrick Tae
G01 - MEASURING TESTING
Information
Patent Application
Applied Materials, Inc.
Keith Berding
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Applied Materials, Inc.
Upendra Ummethala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Applied Materials, Inc.
Upendra V. Ummethala
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Applied Materials, Inc.
Jeffrey Yat Shan Au
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Applied Materials, Inc.
Blake Erickson
G01 - MEASURING TESTING
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Patent Application
Applied Materials, Inc.
Blake Erickson
G01 - MEASURING TESTING
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Patent Application
Applied Materials, Inc.
Patrick Tae
G01 - MEASURING TESTING
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Patent Application
Applied Materials, Inc.
Thomas Li
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Application
Applied Materials, Inc.
Blake Erickson
G01 - MEASURING TESTING
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Patent Application
Applied Materials, Inc.
Blake Erickson
G01 - MEASURING TESTING
Information
Patent Application
Applied Materials, Inc.
Upendra Ummethala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Applied Materials, Inc.
Upendra Ummethala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Applied Materials, Inc.
Upendra V. Ummethala
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
Applied Materials, Inc.
Keith Berding
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Applied Materials, Inc.
Keith Berding
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Applied Materials, Inc.
Upendra V. Ummethala
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Applied Materials, Inc.
Upendra V. Ummethala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Applied Materials, Inc.
Upendra V. Ummethala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Applied Materials, Inc.
Varoujan Chakarian
G01 - MEASURING TESTING
Information
Patent Application
Applied Materials, Inc.
Patrick Tae
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Applied Materials, Inc.
Philip Allan Kraus
G02 - OPTICS
