BORIS VERMAN

Person

TROY, MI, US

People

Patents Grantslast 30 patents

Information Patent Grant
Total reflection x-ray fluorescence spectrometer
- Patent number 11,867,646
- Issue date Jan 9, 2024
- Rigaku Corporation
- Makoto Kambe
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspecting device, X-ray thin film inspecting method, and met...
- Patent number 10,876,978
- Issue date Dec 29, 2020
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
X-ray generator and x-ray analysis device
- Patent number 10,854,348
- Issue date Dec 1, 2020
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffractometer with multilayer reflection-type monochromator
- Patent number 10,436,723
- Issue date Oct 8, 2019
- Rigaku Corporation
- Takeshi Osakabe
- G01 - MEASURING TESTING
Information Patent Grant
X-ray apparatus, method of using the same and X-ray irradiation method
- Patent number 9,336,917
- Issue date May 10, 2016
- Rigaku Corporation
- Tetsuya Ozawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray beam system offering 1D and 2D beams
- Patent number 9,031,203
- Issue date May 12, 2015
- Rigaku Innovative Technologies, Inc.
- Licai Jiang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray scattering measurement device and X-ray scattering measuremen...
- Patent number 8,767,918
- Issue date Jul 1, 2014
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Grant
Nanotube based device for guiding X-ray photons and neutrons
- Patent number 8,488,743
- Issue date Jul 16, 2013
- Rigaku Innovative Technologies, Inc.
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray optical systems with adjustable convergence and focal spot size
- Patent number 8,406,374
- Issue date Mar 26, 2013
- Rigaku Innovative Technologies, Inc.
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multiconfiguration X-ray optical system
- Patent number 8,249,220
- Issue date Aug 21, 2012
- Rigaku Innovative Technologies, Inc.
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multi-beam X-ray system
- Patent number 8,126,117
- Issue date Feb 28, 2012
- Rigaku Innovative Technologies, Inc.
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray generator with polycapillary optic
- Patent number 7,933,383
- Issue date Apr 26, 2011
- Rigaku Innovative Technologies, Inc.
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Beam conditioning system with sequential optic
- Patent number 7,280,634
- Issue date Oct 9, 2007
- Osmic, Inc.
- Boris Verman
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray optical system with adjustable convergence
- Patent number 7,245,699
- Issue date Jul 17, 2007
- Osmic, Inc.
- Boris Verman
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Beam conditioning system
- Patent number 7,076,026
- Issue date Jul 11, 2006
- Osmic, Inc.
- Boris Verman
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Protective layer for multilayers exposed to x-rays
- Patent number 6,643,353
- Issue date Nov 4, 2003
- Osmic, Inc.
- Boris Verman
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray optical device and multilayer mirror for small angle scatteri...
- Patent number 6,504,902
- Issue date Jan 7, 2003
- Rigaku Corporation
- Yoshio Iwasaki
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multilayer optics with adjustable working wavelength
- Patent number 6,421,417
- Issue date Jul 16, 2002
- Osmic, Inc.
- Licai Jiang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray lens system
- Patent number 6,389,100
- Issue date May 14, 2002
- Osmic, Inc.
- Boris Verman
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray diffractometer with adjustable image distance
- Patent number 6,069,934
- Issue date May 30, 2000
- Osmic, Inc.
- Boris Verman
- G01 - MEASURING TESTING
Information Patent Grant
Single corner kirkpatrick-baez beam conditioning optic assembly
- Patent number 6,041,099
- Issue date Mar 21, 2000
- Osmic, Inc.
- George Gutman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multiple corner Kirkpatrick-Baez beam conditioning optic assembly
- Patent number 6,014,423
- Issue date Jan 11, 2000
- Osmic, Inc.
- George Gutman
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20230400423
- Publication date Dec 14, 2023
- Rigaku Corporation
- Makoto KAMBE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY GENERATOR AND X-RAY ANALYSIS DEVICE
- Publication number 20190272929
- Publication date Sep 5, 2019
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTING DEVICE, X-RAY THIN FILM INSPECTING METHOD, AND MET...
- Publication number 20190227005
- Publication date Jul 25, 2019
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTOMETER
- Publication number 20170191950
- Publication date Jul 6, 2017
- Rigaku Corporation
- Takeshi OSAKABE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY BEAM SYSTEM OFFERING 1D AND 2D BEAMS
- Publication number 20130329861
- Publication date Dec 12, 2013
- Licai Jiang
- G01 - MEASURING TESTING
Information Patent Application
NANOTUBE BASED DEVICE FOR GUIDING X-RAY PHOTONS AND NEUTRONS
- Publication number 20120248345
- Publication date Oct 4, 2012
- Rigaku Innovative Technologies, Inc.
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Application
X-RAY SCATTERING MEASUREMENT DEVICE AND X-RAY SCATTERING MEASUREMEN...
- Publication number 20120051518
- Publication date Mar 1, 2012
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Application
X-RAY OPTICAL SYSTEMS WITH ADJUSTABLE CONVERGENCE AND FOCAL SPOT SIZE
- Publication number 20110317814
- Publication date Dec 29, 2011
- Rigaku Innovative Technologies, Inc.
- BORIS VERMAN
- B82 - NANO-TECHNOLOGY
Information Patent Application
X-RAY GENERATOR WITH POLYCAPILLARY OPTIC
- Publication number 20110280530
- Publication date Nov 17, 2011
- Rigaku Innovative Technologies, Inc.
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Application
X-RAY APPARATUS, METHOD OF USING THE SAME AND X-RAY IRRADIATION METHOD
- Publication number 20110268252
- Publication date Nov 3, 2011
- Rigaku Corporation
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Application
Multi-Beam X-Ray System
- Publication number 20110188636
- Publication date Aug 4, 2011
- Rigaku Innovative Technologies, Inc.
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Application
Multiconfiguration X-ray Optical System
- Publication number 20110085644
- Publication date Apr 14, 2011
- Rigaku Innovative Technology
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Application
X-RAY GENERATOR WITH POLYCAPILLARY OPTIC
- Publication number 20090279670
- Publication date Nov 12, 2009
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Application
Beam conditioning system with sequential optic
- Publication number 20060239405
- Publication date Oct 26, 2006
- Osmic, Inc.
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Application
Beam conditioning system
- Publication number 20050025281
- Publication date Feb 3, 2005
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Application
X-ray optical system with adjustable convergence
- Publication number 20040170250
- Publication date Sep 2, 2004
- Osmic, Inc.
- Boris Verman
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-ray lens system
- Publication number 20030128811
- Publication date Jul 10, 2003
- Osmic, Inc.
- Boris Verman
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
PROTECTIVE LAYER FOR MULTILAYERS EXPOSED TO X-RAYS
- Publication number 20030128810
- Publication date Jul 10, 2003
- Osmic, Inc.
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Application
MULTILAYER OPTICS WITH ADJUSTABLE WORKING WAVELENGTH
- Publication number 20020080916
- Publication date Jun 27, 2002
- LICAI JIANG
- B82 - NANO-TECHNOLOGY
Information Patent Application
X-RAY LENS SYSTEM
- Publication number 20020044626
- Publication date Apr 18, 2002
- BORIS VERMAN
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

BORIS VERMAN

Person

Patents Grantslast 30 patents

Total reflection x-ray fluorescence spectrometer

X-ray inspecting device, X-ray thin film inspecting method, and met...

X-ray generator and x-ray analysis device

X-ray diffractometer with multilayer reflection-type monochromator

X-ray apparatus, method of using the same and X-ray irradiation method

X-ray beam system offering 1D and 2D beams

X-ray scattering measurement device and X-ray scattering measuremen...

Nanotube based device for guiding X-ray photons and neutrons

X-ray optical systems with adjustable convergence and focal spot size

Multiconfiguration X-ray optical system

Multi-beam X-ray system

X-ray generator with polycapillary optic

Beam conditioning system with sequential optic

X-ray optical system with adjustable convergence

Beam conditioning system

Protective layer for multilayers exposed to x-rays

X-ray optical device and multilayer mirror for small angle scatteri...

Multilayer optics with adjustable working wavelength

X-ray lens system

X-ray diffractometer with adjustable image distance

Single corner kirkpatrick-baez beam conditioning optic assembly

Multiple corner Kirkpatrick-Baez beam conditioning optic assembly

Patents Applicationslast 30 patents

TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETER

X-RAY GENERATOR AND X-RAY ANALYSIS DEVICE

X-RAY INSPECTING DEVICE, X-RAY THIN FILM INSPECTING METHOD, AND MET...

X-RAY DIFFRACTOMETER

X-RAY BEAM SYSTEM OFFERING 1D AND 2D BEAMS

NANOTUBE BASED DEVICE FOR GUIDING X-RAY PHOTONS AND NEUTRONS

X-RAY SCATTERING MEASUREMENT DEVICE AND X-RAY SCATTERING MEASUREMEN...

X-RAY OPTICAL SYSTEMS WITH ADJUSTABLE CONVERGENCE AND FOCAL SPOT SIZE

X-RAY GENERATOR WITH POLYCAPILLARY OPTIC

X-RAY APPARATUS, METHOD OF USING THE SAME AND X-RAY IRRADIATION METHOD

Multi-Beam X-Ray System

Multiconfiguration X-ray Optical System

X-RAY GENERATOR WITH POLYCAPILLARY OPTIC

Beam conditioning system with sequential optic

Beam conditioning system

X-ray optical system with adjustable convergence

X-ray lens system

PROTECTIVE LAYER FOR MULTILAYERS EXPOSED TO X-RAYS

MULTILAYER OPTICS WITH ADJUSTABLE WORKING WAVELENGTH

X-RAY LENS SYSTEM