Boumy Sayavong

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Ottawa, CA

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for on-wafer testing of an individual optical...
- Patent number 6,925,238
- Issue date Aug 2, 2005
- Enablence Holdings LLC
- Kevin Kidoo Lee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for on-wafer testing of an individual optical...
- Publication number 20040013378
- Publication date Jan 22, 2004
- Kevin Kidoo Lee
- G02 - OPTICS