Brad Froemke

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Chuck with integrated wafer support
- Patent number 7,688,091
- Issue date Mar 30, 2010
- Cascade Microtech, Inc.
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Grant
Probe station with two platens
- Patent number 7,368,925
- Issue date May 6, 2008
- Cascade Microtech, Inc.
- Peter Navratil
- G01 - MEASURING TESTING
Information Patent Grant
Chuck with integrated wafer support
- Patent number 7,362,115
- Issue date Apr 22, 2008
- Cascade Microtech, Inc.
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Grant
Chuck with integrated wafer support
- Patent number 7,187,188
- Issue date Mar 6, 2007
- Cascade Microtech, Inc.
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Grant
Probe station
- Patent number 6,777,964
- Issue date Aug 17, 2004
- Cascade Microtech, Inc.
- Peter Navratil
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Chuck with integrated wafer support
- Publication number 20080157796
- Publication date Jul 3, 2008
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Application
Probe station
- Publication number 20080042675
- Publication date Feb 21, 2008
- Cascade Microtech, Inc.
- Peter Navratil
- G01 - MEASURING TESTING
Information Patent Application
Chuck with integrated wafer support
- Publication number 20070115013
- Publication date May 24, 2007
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Application
Probe station
- Publication number 20050156610
- Publication date Jul 21, 2005
- Peter Navratil
- G01 - MEASURING TESTING
Information Patent Application
Chuck with integrated wafer support
- Publication number 20050140384
- Publication date Jun 30, 2005
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Application
Probe station
- Publication number 20030141861
- Publication date Jul 31, 2003
- Peter Navratil
- G01 - MEASURING TESTING