Brett M. Debenham

Person

Meridian, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Intelligent binning for electrically repairable semiconductor chips
- Patent number 7,237,158
- Issue date Jun 26, 2007
- Micron Technology, Inc.
- Brett M. Debenham
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for checking the resistance of programmable el...
- Patent number 6,983,404
- Issue date Jan 3, 2006
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Grant
Intelligent binning for electrically repairable semiconductor chips
- Patent number 6,587,980
- Issue date Jul 1, 2003
- Micron Technology, Inc.
- Brett M. Debenham
- G11 - INFORMATION STORAGE
Information Patent Grant
Intelligent binning for electrically repairable semiconductor chips...
- Patent number 6,523,144
- Issue date Feb 18, 2003
- Micron Technology, Inc.
- Brett M. Debenham
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for storage of test results within an integrat...
- Patent number 6,365,421
- Issue date Apr 2, 2002
- Micron Technology, Inc.
- Brett Debenham
- G11 - INFORMATION STORAGE
Information Patent Grant
Intelligent binning for electrically repairable semiconductor chips
- Patent number 6,321,353
- Issue date Nov 20, 2001
- Micron Technology, Inc.
- Brett M. Debenham
- G11 - INFORMATION STORAGE
Information Patent Grant
Intelligent binning for electrically repairable semiconductor chips
- Patent number 6,219,810
- Issue date Apr 17, 2001
- Micron Technology, Inc.
- Brett M. Debenham
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for storage of test results within an integrat...
- Patent number 6,194,738
- Issue date Feb 27, 2001
- Micron Technology, Inc.
- Brett Debenham
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for checking the resistance of programmable el...
- Patent number 6,185,705
- Issue date Feb 6, 2001
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for reducing antifuse programming time
- Patent number 6,154,410
- Issue date Nov 28, 2000
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Grant
Intelligent binning for electrically repairable semiconductor chips
- Patent number 6,138,256
- Issue date Oct 24, 2000
- Micron Technology, Inc.
- Brett M. Debenham
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for checking the resistance of programmable el...
- Patent number 5,982,656
- Issue date Nov 9, 1999
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Grant
Intelligent binning for electrically repairable semiconductor chips
- Patent number 5,764,650
- Issue date Jun 9, 1998
- Micron Technology, Inc.
- Brett M. Debenham
- G11 - INFORMATION STORAGE
Information Patent Grant
Self current limiting antifuse circuit
- Patent number 5,706,238
- Issue date Jan 6, 1998
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Grant
Self current limiting antifuse circuit
- Patent number 5,631,862
- Issue date May 20, 1997
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for checking the resistance of programmable el...
- Publication number 20050005208
- Publication date Jan 6, 2005
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Application
Intelligent binning for electrically repairable semiconductor chips
- Publication number 20040015764
- Publication date Jan 22, 2004
- Brett M. Debenham
- G01 - MEASURING TESTING
Information Patent Application
Intelligent binning for electrically repairable semiconductor chips
- Publication number 20030005377
- Publication date Jan 2, 2003
- Brett M. Debenham
- G01 - MEASURING TESTING
Information Patent Application
Intelligent binning for electrically repairable semiconductor chips
- Publication number 20020046361
- Publication date Apr 18, 2002
- Brett M. Debenham
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for storage of test results within an integrat...
- Publication number 20020006676
- Publication date Jan 17, 2002
- Brett Debenham
- G01 - MEASURING TESTING
Information Patent Application
Intelligent binning for electrically repairable semiconductor chips
- Publication number 20010001326
- Publication date May 17, 2001
- Brett M. Debenham
- G01 - MEASURING TESTING

Brett M. Debenham

Person

Patents Grantslast 30 patents

Intelligent binning for electrically repairable semiconductor chips

Method and apparatus for checking the resistance of programmable el...

Intelligent binning for electrically repairable semiconductor chips

Intelligent binning for electrically repairable semiconductor chips...

Method and apparatus for storage of test results within an integrat...

Intelligent binning for electrically repairable semiconductor chips

Intelligent binning for electrically repairable semiconductor chips

Method and apparatus for storage of test results within an integrat...

Method and apparatus for checking the resistance of programmable el...

Method and apparatus for reducing antifuse programming time

Intelligent binning for electrically repairable semiconductor chips

Method and apparatus for checking the resistance of programmable el...

Intelligent binning for electrically repairable semiconductor chips

Self current limiting antifuse circuit

Self current limiting antifuse circuit

Patents Applicationslast 30 patents

Method and apparatus for checking the resistance of programmable el...

Intelligent binning for electrically repairable semiconductor chips

Intelligent binning for electrically repairable semiconductor chips

Intelligent binning for electrically repairable semiconductor chips

Method and apparatus for storage of test results within an integrat...

Intelligent binning for electrically repairable semiconductor chips