Brian C. Wadell

Person

Reading, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Generating a waveform based on digital pulses
- Patent number 11,442,098
- Issue date Sep 13, 2022
- Teradyne, Inc.
- Brian Charles Wadell
- G01 - MEASURING TESTING
Information Patent Grant
Front-end module
- Patent number 11,431,379
- Issue date Aug 30, 2022
- Teradyne, Inc.
- Brian C. Wadell
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Handler change kit for a test system
- Patent number 10,972,192
- Issue date Apr 6, 2021
- Teradyne, Inc.
- Brian Charles Wadell
- G01 - MEASURING TESTING
Information Patent Grant
Calibration device for automatic test equipment
- Patent number 10,345,418
- Issue date Jul 9, 2019
- Teradyne, Inc.
- Brian C. Wadell
- G01 - MEASURING TESTING
Information Patent Grant
Pocketed circuit board
- Patent number 9,786,977
- Issue date Oct 10, 2017
- Teradyne, Inc.
- Timothy Daniel Lyons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Front end module for automatic test equipment
- Patent number 9,755,766
- Issue date Sep 5, 2017
- Teradyne, Inc.
- Brian C. Wadell
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Local area multiple object tracking system
- Patent number 6,204,813
- Issue date Mar 20, 2001
- Trakus, Inc.
- Brian C. Wadell
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Architecture for RF signal automatic test equipment
- Patent number 6,066,953
- Issue date May 23, 2000
- Teradyne, Inc.
- Brian C. Wadell
- G01 - MEASURING TESTING
Information Patent Grant
Architecture for RF signal automatic test equipment
- Patent number 5,572,160
- Issue date Nov 5, 1996
- Teradyne, Inc.
- Brian C. Wadell
- G01 - MEASURING TESTING
Information Patent Grant
Electrical circuitry support apparatus
- Patent number 4,894,753
- Issue date Jan 16, 1990
- Teradyne, Inc.
- Brian C. Wadell
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Shielded enclosure
- Patent number 4,864,077
- Issue date Sep 5, 1989
- Teradyne, Inc.
- Brian C. Wadell
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
CABLE ASSEMBLY CONTAINING SELF-CALIBRATION DATA
- Publication number 20240275112
- Publication date Aug 15, 2024
- Teradyne, Inc.
- Brian Charles Wadell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GENERATING A WAVEFORM BASED ON DIGITAL PULSES
- Publication number 20200400742
- Publication date Dec 24, 2020
- Teradyne, Inc.
- Brian Charles Wadell
- G01 - MEASURING TESTING
Information Patent Application
HANDLER CHANGE KIT FOR A TEST SYSTEM
- Publication number 20190349096
- Publication date Nov 14, 2019
- Teradyne, Inc.
- Brian Charles Wadell
- G01 - MEASURING TESTING
Information Patent Application
Pocketed Circuit Board
- Publication number 20170170537
- Publication date Jun 15, 2017
- Teradyne, Inc.
- Timothy Daniel Lyons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FRONT END MODULE FOR AUTOMATIC TEST EQUIPMENT
- Publication number 20170163358
- Publication date Jun 8, 2017
- Teradyne, Inc.
- Brian C. Wadell
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CALIBRATION DEVICE FOR AUTOMATIC TEST EQUIPMENT
- Publication number 20170146632
- Publication date May 25, 2017
- Teradyne, Inc.
- Brian C. Wadell
- G01 - MEASURING TESTING

Brian C. Wadell

Person

Patents Grantslast 30 patents

Generating a waveform based on digital pulses

Front-end module

Handler change kit for a test system

Calibration device for automatic test equipment

Pocketed circuit board

Front end module for automatic test equipment

Local area multiple object tracking system

Architecture for RF signal automatic test equipment

Architecture for RF signal automatic test equipment

Electrical circuitry support apparatus

Shielded enclosure

Patents Applicationslast 30 patents

CABLE ASSEMBLY CONTAINING SELF-CALIBRATION DATA

GENERATING A WAVEFORM BASED ON DIGITAL PULSES

HANDLER CHANGE KIT FOR A TEST SYSTEM

Pocketed Circuit Board

FRONT END MODULE FOR AUTOMATIC TEST EQUIPMENT

CALIBRATION DEVICE FOR AUTOMATIC TEST EQUIPMENT