Brian E. Stine

Person

Los Altos Hills, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Collaborative learning model for semiconductor applications
- Patent number 12,038,802
- Issue date Jul 16, 2024
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterization vehicles for printed circuit board and system design
- Patent number 10,897,814
- Issue date Jan 19, 2021
- PDF Solutions, Inc.
- Brian E. Stine
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Failure detection for wire bonding in semiconductors
- Patent number 10,656,204
- Issue date May 19, 2020
- PDF Solutions, Inc.
- Brian Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterization vehicles for printed circuit board and system design
- Patent number 10,517,169
- Issue date Dec 24, 2019
- PDF Solutions, Inc.
- Brian E. Stine
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Advanced manufacturing insight system for semiconductor application
- Patent number 10,268,562
- Issue date Apr 23, 2019
- PDF Solutions, Inc.
- Brian Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test cells for semiconductor yield improvement
- Patent number 7,807,480
- Issue date Oct 5, 2010
- PDF Solutions, Inc.
- Brian Stine
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for product yield prediction
- Patent number 7,673,262
- Issue date Mar 2, 2010
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Designing an integrated circuit to improve yield using a variant de...
- Patent number 7,487,474
- Issue date Feb 3, 2009
- PDF Solutions, Inc.
- Dennis Ciplickas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for product yield prediction
- Patent number 7,373,625
- Issue date May 13, 2008
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for product yield prediction
- Patent number 7,356,800
- Issue date Apr 8, 2008
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test structures and models for estimating the yield impact of dishi...
- Patent number 7,348,594
- Issue date Mar 25, 2008
- PDF Solutions, Inc.
- Dennis J. Ciplickas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structures for estimating dishing and erosion effects in coppe...
- Patent number 7,197,726
- Issue date Mar 27, 2007
- PDF Solutions, Inc.
- Dennis J. Ciplickas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for product yield prediction
- Patent number 7,174,521
- Issue date Feb 6, 2007
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Zoom in pin nest structure, test vehicle having the structure, and...
- Patent number 7,154,115
- Issue date Dec 26, 2006
- PDF Solutions, Inc.
- Brian E. Stine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Extraction method of defect density and size distributions
- Patent number 7,024,642
- Issue date Apr 4, 2006
- PDF Solutions, Inc.
- Christopher Hess
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for product yield prediction
- Patent number 6,901,564
- Issue date May 31, 2005
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for product yield prediction using a logic charac...
- Patent number 6,834,375
- Issue date Dec 21, 2004
- PDF Solutions, Inc.
- Brian E. Stine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for product yield prediction using device and pro...
- Patent number 6,795,952
- Issue date Sep 21, 2004
- PDF Solutions, Inc.
- Brian E. Stine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Passive multiplexor test structure for integrated circuit manufactu...
- Patent number 6,475,871
- Issue date Nov 5, 2002
- PDF Solutions, Inc.
- Brian E. Stine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for product yield prediction
- Patent number 6,449,749
- Issue date Sep 10, 2002
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CHARACTERIZATION VEHICLES FOR PRINTED CIRCUIT BOARD AND SYSTEM DESIGN
- Publication number 20200120791
- Publication date Apr 16, 2020
- PDF Solutions, Inc.
- Brian E. Stine
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZATION VEHICLES FOR PRINTED CIRCUIT BOARD AND SYSTEM DESIGN
- Publication number 20190320525
- Publication date Oct 17, 2019
- PDF Solutions, Inc.
- Brian E. Stine
- G01 - MEASURING TESTING
Information Patent Application
FAILURE DETECTION FOR WIRE BONDING IN SEMICONDUCTORS
- Publication number 20190146032
- Publication date May 16, 2019
- PDF Solutions, Inc.
- Brian Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System And Method For Product Yield Prediction
- Publication number 20080282210
- Publication date Nov 13, 2008
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Test Cells for semiconductor yield improvement
- Publication number 20080169466
- Publication date Jul 17, 2008
- PDF Solutions, Inc.
- Brian Stine
- G01 - MEASURING TESTING
Information Patent Application
System and method for product yield prediction
- Publication number 20070118242
- Publication date May 24, 2007
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for product yield prediction
- Publication number 20060277506
- Publication date Dec 7, 2006
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Yield improvement
- Publication number 20060101355
- Publication date May 11, 2006
- PDF Solutions, Inc.
- Dennis Ciplickas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for product yield prediction
- Publication number 20050158888
- Publication date Jul 21, 2005
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Zoom in pin nest structure, test vehicle having the structure, and...
- Publication number 20050122123
- Publication date Jun 9, 2005
- Brian E. Stine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test structures and models for estimating the yield impact of dishi...
- Publication number 20050074908
- Publication date Apr 7, 2005
- Dennis J. Ciplickas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test structures for estimating dishing and erosion effects in coppe...
- Publication number 20040232910
- Publication date Nov 25, 2004
- Dennis J Ciplickas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Extraction method of defect density and size distributions
- Publication number 20040094762
- Publication date May 20, 2004
- Christopher Hess
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for product yield prediction
- Publication number 20030145292
- Publication date Jul 31, 2003
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING

Brian E. Stine

Person

Patents Grantslast 30 patents

Collaborative learning model for semiconductor applications

Characterization vehicles for printed circuit board and system design

Failure detection for wire bonding in semiconductors

Characterization vehicles for printed circuit board and system design

Advanced manufacturing insight system for semiconductor application

Test cells for semiconductor yield improvement

System and method for product yield prediction

Designing an integrated circuit to improve yield using a variant de...

System and method for product yield prediction

System and method for product yield prediction

Test structures and models for estimating the yield impact of dishi...

Test structures for estimating dishing and erosion effects in coppe...

System and method for product yield prediction

Zoom in pin nest structure, test vehicle having the structure, and...

Extraction method of defect density and size distributions

System and method for product yield prediction

System and method for product yield prediction using a logic charac...

System and method for product yield prediction using device and pro...

Passive multiplexor test structure for integrated circuit manufactu...

System and method for product yield prediction

Patents Applicationslast 30 patents

CHARACTERIZATION VEHICLES FOR PRINTED CIRCUIT BOARD AND SYSTEM DESIGN

CHARACTERIZATION VEHICLES FOR PRINTED CIRCUIT BOARD AND SYSTEM DESIGN

FAILURE DETECTION FOR WIRE BONDING IN SEMICONDUCTORS

System And Method For Product Yield Prediction

Test Cells for semiconductor yield improvement

System and method for product yield prediction

System and method for product yield prediction

Yield improvement

System and method for product yield prediction

Zoom in pin nest structure, test vehicle having the structure, and...

Test structures and models for estimating the yield impact of dishi...

Test structures for estimating dishing and erosion effects in coppe...

Extraction method of defect density and size distributions

System and method for product yield prediction