BRUCE W. PORTH

Person

JERICHO, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor on insulator wafer with cavity structures
- Patent number 12,027,580
- Issue date Jul 2, 2024
- GLOBALFOUNDRIES U.S. Inc.
- Anthony K. Stamper
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer with localized semiconductor on insulator regions with cavity...
- Patent number 11,488,980
- Issue date Nov 1, 2022
- GLOBALFOUNDRIES U.S. Inc.
- Siva P. Adusumilli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor isolation structures comprising shallow trench and de...
- Patent number 11,049,932
- Issue date Jun 29, 2021
- GLOBALFOUNDRIES U.S. INC.
- Steven M. Shank
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated photodetector waveguide structure with alignment tolerance
- Patent number 10,957,805
- Issue date Mar 23, 2021
- International Business Machines Corporation
- Solomon Assefa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated photodetector waveguide structure with alignment tolerance
- Patent number 10,784,386
- Issue date Sep 22, 2020
- International Business Machines Corporation
- Solomon Assefa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated photodetector waveguide structure with alignment tolerance
- Patent number 10,763,379
- Issue date Sep 1, 2020
- International Business Machines Corporation
- Solomon Assefa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated photodetector waveguide structure with alignment tolerance
- Patent number 10,720,538
- Issue date Jul 21, 2020
- International Business Machines Corporation
- Solomon Assefa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated photodetector waveguide structure with alignment tolerance
- Patent number 10,622,496
- Issue date Apr 14, 2020
- International Business Machines Corporation
- Solomon Assefa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated photodetector waveguide structure with alignment tolerance
- Patent number 10,535,787
- Issue date Jan 14, 2020
- International Business Machines Corporation
- Solomon Assefa
- G02 - OPTICS
Information Patent Grant
Integrated photodetector waveguide structure with alignment tolerance
- Patent number 10,367,106
- Issue date Jul 30, 2019
- International Business Machines Corporation
- Solomon Assefa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated photodetector waveguide structure with alignment tolerance
- Patent number 10,170,661
- Issue date Jan 1, 2019
- International Business Machines Corporation
- Solomon Assefa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated photodetector waveguide structure with alignment tolerance
- Patent number 10,090,422
- Issue date Oct 2, 2018
- International Business Machines Corporation
- Solomon Assefa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated photodetector waveguide structure with alignment tolerance
- Patent number 10,043,940
- Issue date Aug 7, 2018
- International Business Machines Corporation
- Solomon Assefa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Handle wafer
- Patent number 9,716,010
- Issue date Jul 25, 2017
- GLOBALFOUNDRIES Inc.
- Jeffrey P. Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated photodetector waveguide structure with alignment tolerance
- Patent number 9,640,684
- Issue date May 2, 2017
- International Business Machines Corporation
- Solomon Assefa
- G02 - OPTICS
Information Patent Grant
Integrated photodetector waveguide structure with alignment tolerance
- Patent number 9,634,159
- Issue date Apr 25, 2017
- International Business Machines Corporation
- Solomon Assefa
- G02 - OPTICS
Information Patent Grant
Integrated photodetector waveguide structure with alignment tolerance
- Patent number 9,466,740
- Issue date Oct 11, 2016
- International Business Machines Corporation
- Solomon Assefa
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Integrated photodetector waveguide structure with alignment tolerance
- Patent number 9,423,582
- Issue date Aug 23, 2016
- International Business Machines Corporation
- Solomon Assefa
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Integrated photodetector waveguide structure with alignment tolerance
- Patent number 9,356,164
- Issue date May 31, 2016
- International Business Machines Corporation
- Solomon Assefa
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Integrated photodetector waveguide structure with alignment tolerance
- Patent number 9,231,131
- Issue date Jan 5, 2016
- International Business Machines Corporation
- Solomon Assefa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for compensating for variations in structures of an integrat...
- Patent number 8,881,072
- Issue date Nov 4, 2014
- International Business Machines Corporation
- Santo Credendino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ferroelectric random access memory with optimized hardmask
- Patent number 8,796,044
- Issue date Aug 5, 2014
- International Business Machines Corporation
- James E. Beecher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for compensating for variations in structures of an integrat...
- Patent number 8,458,628
- Issue date Jun 4, 2013
- International Business Machines Corporation
- Santo Credendino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for compensating for variations in structures of an integrat...
- Patent number 8,176,446
- Issue date May 8, 2012
- International Business Machines Corporation
- Santo Credendino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deep trench in a semiconductor structure
- Patent number 7,893,479
- Issue date Feb 22, 2011
- International Business Machines Corporation
- June Cline
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Deep trench formation in semiconductor device fabrication
- Patent number 7,573,085
- Issue date Aug 11, 2009
- International Business Machines Corporation
- June Cline
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating doped polysilicon lines
- Patent number 7,303,952
- Issue date Dec 4, 2007
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chemical mechanical polishing method
- Patent number 7,223,697
- Issue date May 29, 2007
- International Business Machines Corporation
- Garth A. Brooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deep trench formation in semiconductor device fabrication
- Patent number 7,101,806
- Issue date Sep 5, 2006
- International Business Machines Corporation
- June Cline
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned trench capacitor capping process for high density DRAM...
- Patent number 6,372,573
- Issue date Apr 16, 2002
- Kabushiki Kaisha Toshiba
- Masami Aoki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR ON INSULATOR WAFER WITH CAVITY STRUCTURES
- Publication number 20240297216
- Publication date Sep 5, 2024
- GLOBALFOUNDRIES U.S. Inc.
- Anthony K. STAMPER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LINER-FREE THROUGH-SILICON-VIAS FORMED BY SELECTIVE METAL DEPOSITION
- Publication number 20230307321
- Publication date Sep 28, 2023
- GLOBALFOUNDRIES U.S. Inc.
- David Thomas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR ON INSULATOR WAFER WITH CAVITY STRUCTURES
- Publication number 20220093731
- Publication date Mar 24, 2022
- GLOBALFOUNDRIES U.S. Inc.
- Anthony K. STAMPER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER WITH LOCALIZED SEMICONDUCTOR ON INSULATOR REGIONS WITH CAVITY...
- Publication number 20220068975
- Publication date Mar 3, 2022
- GLOBALFOUNDRIES U.S. Inc.
- Siva P. ADUSUMILLI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR ISOLATION STRUCTURES AND METHODS OF FORMING SAME
- Publication number 20200203478
- Publication date Jun 25, 2020
- GLOBALFOUNDRIES INC.
- STEVEN M. SHANK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE
- Publication number 20200075783
- Publication date Mar 5, 2020
- International Business Machines Corporation
- Solomon Assefa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE
- Publication number 20200058807
- Publication date Feb 20, 2020
- International Business Machines Corporation
- Solomon Assefa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE
- Publication number 20190348550
- Publication date Nov 14, 2019
- International Business Machines Corporation
- Solomon Assefa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE
- Publication number 20190305148
- Publication date Oct 3, 2019
- International Business Machines Corporation
- Solomon Assefa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE
- Publication number 20190051771
- Publication date Feb 14, 2019
- International Business Machines Corporation
- Solomon Assefa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE
- Publication number 20180331249
- Publication date Nov 15, 2018
- International Business Machines Corporation
- Solomon Assefa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE
- Publication number 20180090629
- Publication date Mar 29, 2018
- International Business Machines Corporation
- Solomon Assefa
- G02 - OPTICS
Information Patent Application
INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE
- Publication number 20170133524
- Publication date May 11, 2017
- International Business Machines Corporation
- Solomon Assefa
- G02 - OPTICS
Information Patent Application
INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE
- Publication number 20170125628
- Publication date May 4, 2017
- International Business Machines Corporation
- Solomon ASSEFA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE
- Publication number 20160322518
- Publication date Nov 3, 2016
- International Business Machines Corporation
- Solomon Assefa
- G02 - OPTICS
Information Patent Application
INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE
- Publication number 20160260849
- Publication date Sep 8, 2016
- International Business Machines Corporation
- Solomon Assefa
- G02 - OPTICS
Information Patent Application
INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE
- Publication number 20160085039
- Publication date Mar 24, 2016
- International Business Machines Corporation
- Solomon Assefa
- G02 - OPTICS
Information Patent Application
INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE
- Publication number 20150364636
- Publication date Dec 17, 2015
- International Business Machines Corporation
- Solomon Assefa
- G02 - OPTICS
Information Patent Application
INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE
- Publication number 20150364620
- Publication date Dec 17, 2015
- International Business Machines Corporation
- Solomon Assefa
- G02 - OPTICS
Information Patent Application
INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE
- Publication number 20150364619
- Publication date Dec 17, 2015
- International Business Machines Corporation
- Solomon Assefa
- G02 - OPTICS
Information Patent Application
INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE
- Publication number 20150194543
- Publication date Jul 9, 2015
- International Business Machines Corporation
- Solomon ASSEFA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HANDLE WAFER
- Publication number 20150132527
- Publication date May 14, 2015
- International Business Machines Corporation
- Jeffrey P. GAMBINO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FERROELECTRIC RANDOM ACCESS MEMORY WITH OPTIMIZED HARDMASK
- Publication number 20140203342
- Publication date Jul 24, 2014
- International Business Machines Corporation
- James E. Beecher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FERROELECTRIC RANDOM ACCESS MEMORY WITH OPTIMIZED HARDMASK
- Publication number 20140084352
- Publication date Mar 27, 2014
- International Business Machines Corporation
- James E. Beecher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR COMPENSATING FOR VARIATIONS IN STRUCTURES OF AN INTEGRAT...
- Publication number 20130152027
- Publication date Jun 13, 2013
- International Business Machines Corporation
- Santo Credendino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR COMPENSATING FOR VARIATIONS IN STRUCTURES OF AN INTEGRAT...
- Publication number 20120174046
- Publication date Jul 5, 2012
- International Business Machines Corporation
- Santo Credendino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Compensating for Variations in Structures of an Integrat...
- Publication number 20100064273
- Publication date Mar 11, 2010
- Santo Credendino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEEP TRENCH IN A SEMICONDUCTOR STRUCTURE
- Publication number 20090294926
- Publication date Dec 3, 2009
- International Business Machines Corporation
- June Cline
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING DOPED POLYSILICON LINES
- Publication number 20070287275
- Publication date Dec 13, 2007
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEEP TRENCH FORMATION IN SEMICONDUCTOR DEVICE FABRICATION
- Publication number 20060275978
- Publication date Dec 7, 2006
- June Cline
- H01 - BASIC ELECTRIC ELEMENTS

BRUCE W. PORTH

Person

Patents Grantslast 30 patents

Semiconductor on insulator wafer with cavity structures

Wafer with localized semiconductor on insulator regions with cavity...

Semiconductor isolation structures comprising shallow trench and de...

Integrated photodetector waveguide structure with alignment tolerance

Integrated photodetector waveguide structure with alignment tolerance

Integrated photodetector waveguide structure with alignment tolerance

Integrated photodetector waveguide structure with alignment tolerance

Integrated photodetector waveguide structure with alignment tolerance

Integrated photodetector waveguide structure with alignment tolerance

Integrated photodetector waveguide structure with alignment tolerance

Integrated photodetector waveguide structure with alignment tolerance

Integrated photodetector waveguide structure with alignment tolerance

Integrated photodetector waveguide structure with alignment tolerance

Handle wafer

Integrated photodetector waveguide structure with alignment tolerance

Integrated photodetector waveguide structure with alignment tolerance

Integrated photodetector waveguide structure with alignment tolerance

Integrated photodetector waveguide structure with alignment tolerance

Integrated photodetector waveguide structure with alignment tolerance

Integrated photodetector waveguide structure with alignment tolerance

Method for compensating for variations in structures of an integrat...

Ferroelectric random access memory with optimized hardmask

Method for compensating for variations in structures of an integrat...

Method for compensating for variations in structures of an integrat...

Deep trench in a semiconductor structure

Deep trench formation in semiconductor device fabrication

Method for fabricating doped polysilicon lines

Chemical mechanical polishing method

Deep trench formation in semiconductor device fabrication

Self-aligned trench capacitor capping process for high density DRAM...

Patents Applicationslast 30 patents

SEMICONDUCTOR ON INSULATOR WAFER WITH CAVITY STRUCTURES

LINER-FREE THROUGH-SILICON-VIAS FORMED BY SELECTIVE METAL DEPOSITION

SEMICONDUCTOR ON INSULATOR WAFER WITH CAVITY STRUCTURES

WAFER WITH LOCALIZED SEMICONDUCTOR ON INSULATOR REGIONS WITH CAVITY...

SEMICONDUCTOR ISOLATION STRUCTURES AND METHODS OF FORMING SAME

INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE

INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE

INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE

INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE

INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE

INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE

INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE

INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE

INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE

INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE

INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE

INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE

INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE

INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE

INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE

INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE

HANDLE WAFER

FERROELECTRIC RANDOM ACCESS MEMORY WITH OPTIMIZED HARDMASK

FERROELECTRIC RANDOM ACCESS MEMORY WITH OPTIMIZED HARDMASK

METHOD FOR COMPENSATING FOR VARIATIONS IN STRUCTURES OF AN INTEGRAT...

METHOD FOR COMPENSATING FOR VARIATIONS IN STRUCTURES OF AN INTEGRAT...

Method for Compensating for Variations in Structures of an Integrat...

DEEP TRENCH IN A SEMICONDUCTOR STRUCTURE

METHOD FOR FABRICATING DOPED POLYSILICON LINES

DEEP TRENCH FORMATION IN SEMICONDUCTOR DEVICE FABRICATION