Brunfeld Andrei

Person

Cupertino, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optical inspection system with polarization isolation of detection...
- Patent number 8,436,997
- Issue date May 7, 2013
- Xyratex Technology Limited
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Grant
Time dependent fluorescence measurements
- Patent number 7,812,956
- Issue date Oct 12, 2010
- Blueshift Biotechnologies, Inc.
- Evan F. Cromwell
- G01 - MEASURING TESTING
Information Patent Grant
Scatterometer-interferometer and method for detecting and distingui...
- Patent number 7,671,978
- Issue date Mar 2, 2010
- Xyratex Technology Limited
- Bryan Clark
- G01 - MEASURING TESTING
Information Patent Grant
Measuring time dependent fluorescence
- Patent number 7,576,862
- Issue date Aug 18, 2009
- Blueshift Biotechnologies, Inc.
- Evan F. Cromwell
- G01 - MEASURING TESTING
Information Patent Grant
Resonant ellipsometer and method for determining ellipsometric para...
- Patent number 7,330,277
- Issue date Feb 12, 2008
- Xyratex Technology Limited
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Grant
Fabry-perot resonator apparatus and method including an in-resonato...
- Patent number 7,294,825
- Issue date Nov 13, 2007
- Xyratex Technology Limited
- Gregory Toker
- G01 - MEASURING TESTING
Information Patent Grant
Fabry-Perot resonator apparatus and method for observing low reflec...
- Patent number 7,282,729
- Issue date Oct 16, 2007
- Xyratex Technology Limited
- Brunfeld Andrei
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for simultaneous 2-D and topographical inspection
- Patent number 7,253,891
- Issue date Aug 7, 2007
- Orbotech Ltd.
- Gregory Toker
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional imaging resonator and method therefor
- Patent number 7,220,955
- Issue date May 22, 2007
- Xyratex Technology Limited
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Grant
Resonator method and system for distinguishing characteristics of s...
- Patent number 7,214,932
- Issue date May 8, 2007
- Xyratex Technology Limited
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for optical measurement via a resonator having a...
- Patent number 7,193,725
- Issue date Mar 20, 2007
- Xyratex Technology Ltd.
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Grant
Active sensor and method for optical illumination and detection
- Patent number 7,170,605
- Issue date Jan 30, 2007
- Evan Francis Cromwell
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for determining surface feature characteristics u...
- Patent number 7,102,740
- Issue date Sep 5, 2006
- Xyratex Technology Ltd.
- Bryan Clark
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus including in-resonator imaging lens for improv...
- Patent number 7,022,978
- Issue date Apr 4, 2006
- Xyratex Technology Limited
- Bryan Clark
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for performing swept-wavelength measurements with...
- Patent number 6,879,421
- Issue date Apr 12, 2005
- Beyond 3, Inc.
- Bryan Clark
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for illumination and entertainment by light em...
- Patent number 6,629,772
- Issue date Oct 7, 2003
- Andrei Brunfeld
- G02 - OPTICS
Information Patent Grant
Differential phase contrast inspection system with multiple detectors
- Patent number 5,638,175
- Issue date Jun 10, 1997
- Display Inspection Systems, Inc.
- Andrei Brunfeld
- G02 - OPTICS
Information Patent Grant
Differential phase contrast inspection system
- Patent number 5,459,576
- Issue date Oct 17, 1995
- Display Inspection Systems, Inc.
- Andrei Brunfeld
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL INSPECTION SYSTEM WITH POLARIZATION ISOLATION OF DETECTION...
- Publication number 20120154806
- Publication date Jun 21, 2012
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING SYSTEM WITH MATCHED COLLECTION LENS AND DETECTOR...
- Publication number 20120057154
- Publication date Mar 8, 2012
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING SYSTEM WITH ILLUMINATION PROVIDED THROUGH A VOID...
- Publication number 20120057172
- Publication date Mar 8, 2012
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENCE-DETECTING DISK INSPECTION SYSTEM
- Publication number 20120008135
- Publication date Jan 12, 2012
- Gregory Toker
- G01 - MEASURING TESTING
Information Patent Application
SCATTEROMETER-INTERFEROMETER AND METHOD FOR DETECTING AND DISTINGUI...
- Publication number 20080266547
- Publication date Oct 30, 2008
- Bryan Clark
- G01 - MEASURING TESTING
Information Patent Application
Time dependent fluorescence measurements
- Publication number 20080174842
- Publication date Jul 24, 2008
- Blueshift Biotechnologies, Inc.
- Evan F. Cromwell
- G02 - OPTICS
Information Patent Application
Three-dimensional imaging resonator and method therefor
- Publication number 20050279954
- Publication date Dec 22, 2005
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Application
Resonator method and system for distinguishing characteristics of s...
- Publication number 20050236589
- Publication date Oct 27, 2005
- Xyratex Technology Limited
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Application
Fabry-perot resonator apparatus and method including an in-resonato...
- Publication number 20050232330
- Publication date Oct 20, 2005
- Xyratex Technology Limited
- Gregory Toker
- G01 - MEASURING TESTING
Information Patent Application
Resonant ellipsometer and method for determining ellipsometric para...
- Publication number 20050225775
- Publication date Oct 13, 2005
- Xyratex Technology Limited
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Application
Fabry-perot resonator apparatus and method for observing low reflec...
- Publication number 20050218350
- Publication date Oct 6, 2005
- Xyratex Technology Limited
- Andrei Brunfeld
- G02 - OPTICS
Information Patent Application
Apparatus and method for measuring thickness variation of wax film
- Publication number 20050157308
- Publication date Jul 21, 2005
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Application
Active sensor and method for optical illumination and detection
- Publication number 20050046847
- Publication date Mar 3, 2005
- Evan Francis Cromwell
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Method and system for determining surface feature characteristics u...
- Publication number 20050046829
- Publication date Mar 3, 2005
- Bryan Clark
- G01 - MEASURING TESTING
Information Patent Application
Time dependent fluorescence measurements
- Publication number 20050046848
- Publication date Mar 3, 2005
- Blueshift Biotechnologies, Inc.
- Evan F. Cromwell
- G02 - OPTICS
Information Patent Application
Measuring time dependent fluorescence
- Publication number 20050046849
- Publication date Mar 3, 2005
- Blueshift Biotechnologies, Inc.
- Evan F. Cromwell
- G02 - OPTICS
Information Patent Application
Method and system for performing swept-wavelength measurements with...
- Publication number 20040190148
- Publication date Sep 30, 2004
- Bryan Clark
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for simultaneous 2-D and topographical inspection
- Publication number 20040156043
- Publication date Aug 12, 2004
- ORBOTECH LTD.
- Gregory Toker
- G01 - MEASURING TESTING
Information Patent Application
Method and system for optical measurement via a resonator having a...
- Publication number 20040156085
- Publication date Aug 12, 2004
- Andrei Brunfeld
- G02 - OPTICS
Information Patent Application
Method and apparatus for illumination and entertainment by light em...
- Publication number 20030081431
- Publication date May 1, 2003
- Andrei Brunfeld
- G02 - OPTICS

Brunfeld Andrei

Person

Patents Grantslast 30 patents

Optical inspection system with polarization isolation of detection...

Time dependent fluorescence measurements

Scatterometer-interferometer and method for detecting and distingui...

Measuring time dependent fluorescence

Resonant ellipsometer and method for determining ellipsometric para...

Fabry-perot resonator apparatus and method including an in-resonato...

Fabry-Perot resonator apparatus and method for observing low reflec...

Method and apparatus for simultaneous 2-D and topographical inspection

Three-dimensional imaging resonator and method therefor

Resonator method and system for distinguishing characteristics of s...

Method and system for optical measurement via a resonator having a...

Active sensor and method for optical illumination and detection

Method and system for determining surface feature characteristics u...

Method and apparatus including in-resonator imaging lens for improv...

Method and system for performing swept-wavelength measurements with...

Method and apparatus for illumination and entertainment by light em...

Differential phase contrast inspection system with multiple detectors

Differential phase contrast inspection system

Patents Applicationslast 30 patents

OPTICAL INSPECTION SYSTEM WITH POLARIZATION ISOLATION OF DETECTION...

OPTICAL MEASURING SYSTEM WITH MATCHED COLLECTION LENS AND DETECTOR...

OPTICAL MEASURING SYSTEM WITH ILLUMINATION PROVIDED THROUGH A VOID...

FLUORESCENCE-DETECTING DISK INSPECTION SYSTEM

SCATTEROMETER-INTERFEROMETER AND METHOD FOR DETECTING AND DISTINGUI...

Time dependent fluorescence measurements

Three-dimensional imaging resonator and method therefor

Resonator method and system for distinguishing characteristics of s...

Fabry-perot resonator apparatus and method including an in-resonato...

Resonant ellipsometer and method for determining ellipsometric para...

Fabry-perot resonator apparatus and method for observing low reflec...

Apparatus and method for measuring thickness variation of wax film

Active sensor and method for optical illumination and detection

Method and system for determining surface feature characteristics u...

Time dependent fluorescence measurements

Measuring time dependent fluorescence

Method and system for performing swept-wavelength measurements with...

Method and apparatus for simultaneous 2-D and topographical inspection

Method and system for optical measurement via a resonator having a...

Method and apparatus for illumination and entertainment by light em...