Bruno Schueler

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 11,764,050
- Issue date Sep 19, 2023
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 11,430,647
- Issue date Aug 30, 2022
- NOVA MEASURING INSTRUMENTS, INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 10,910,208
- Issue date Feb 2, 2021
- NOVA MEASURING INSTRUMENTS, INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for measuring periodic structures using multi-a...
- Patent number 10,859,519
- Issue date Dec 8, 2020
- NOVA MEASURING INSTRUMENTS, INC.
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 10,636,644
- Issue date Apr 28, 2020
- Nova Measuring Instruments Inc.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for measuring periodic structures using multi-a...
- Patent number 10,481,112
- Issue date Nov 19, 2019
- Nova Measuring Instruments Inc.
- Heath A. Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 10,403,489
- Issue date Sep 3, 2019
- Nova Measuring Instruments Inc.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for measuring periodic structures using multi-a...
- Patent number 10,119,925
- Issue date Nov 6, 2018
- Nova Measuring Instruments Inc.
- Heath A. Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 10,056,242
- Issue date Aug 21, 2018
- Nova Measuring Instruments Inc.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for measuring periodic structures using multi-a...
- Patent number 9,588,066
- Issue date Mar 7, 2017
- ReVera, Incorporated
- Heath A. Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for fabricating platelets of a monochromator fo...
- Patent number 9,297,771
- Issue date Mar 29, 2016
- ReVera, Incorporated
- Jeffrey T. Fanton
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System and method for characterizing a film by X-ray photoelectron...
- Patent number 9,240,254
- Issue date Jan 19, 2016
- Revera, Incorporated
- Bruno W. Schueler
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive distribution profiling of an...
- Patent number 9,201,030
- Issue date Dec 1, 2015
- ReVera, Incorporated
- Paola deCecco
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive distribution profiling of an...
- Patent number 8,916,823
- Issue date Dec 23, 2014
- ReVara, Incorporated
- Paolo deCecco
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive distribution profiling of an...
- Patent number 8,610,059
- Issue date Dec 17, 2013
- Revera, Incorporated
- Paola deCecco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for non-destructive distribution profiling of an...
- Patent number 8,269,167
- Issue date Sep 18, 2012
- Revera, Incorporated
- Paola deCecco
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for calibrating an X-ray photoelectron spectrosco...
- Patent number 8,011,830
- Issue date Sep 6, 2011
- Revera Incorporated
- Bruno W. Schueler
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive distribution profiling of an...
- Patent number 7,884,321
- Issue date Feb 8, 2011
- Revera, Incorporated
- Paola deCecco
- G01 - MEASURING TESTING
Information Patent Grant
Determining layer thickness using photoelectron spectroscopy
- Patent number 7,420,163
- Issue date Sep 2, 2008
- ReVera Incorporated
- Bruno Schueler
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive distribution profiling of an...
- Patent number 7,411,188
- Issue date Aug 12, 2008
- ReVera Incorporated
- Paola deCecco
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectron spectroscopy apparatus and method of use
- Patent number 7,399,963
- Issue date Jul 15, 2008
- ReVera Incorporated
- Bruno W. Schueler
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for analyzing data generated by instruments
- Patent number 7,231,324
- Issue date Jun 12, 2007
- ReVera Incorporated
- James Orrock
- G01 - MEASURING TESTING
Information Patent Grant
Focused ion beam column with electrically variable blanking aperture
- Patent number 5,637,879
- Issue date Jun 10, 1997
- Bruno W. Schueler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle analyzer apparatus and method
- Patent number 5,128,543
- Issue date Jul 7, 1992
- Charles Evans & Associates
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATT...
- Publication number 20240345006
- Publication date Oct 17, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20240087869
- Publication date Mar 14, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20230091625
- Publication date Mar 23, 2023
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- G01 - MEASURING TESTING
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20220390395
- Publication date Dec 8, 2022
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20210305037
- Publication date Sep 30, 2021
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20200258733
- Publication date Aug 13, 2020
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR MEASURING PERIODIC STRUCTURES USING MULTI-A...
- Publication number 20200088656
- Publication date Mar 19, 2020
- Nova Measuring Instruments, Inc.
- Heath A. Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20190385831
- Publication date Dec 19, 2019
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR MEASURING PERIODIC STRUCTURES USING MULTI-A...
- Publication number 20190086342
- Publication date Mar 21, 2019
- Nova Measuring Instruments, Inc.
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20180330935
- Publication date Nov 15, 2018
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20180025897
- Publication date Jan 25, 2018
- ReVera, Incorporated
- David A. REED
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR MEASURING PERIODIC STRUCTURES USING MULTI-A...
- Publication number 20170176354
- Publication date Jun 22, 2017
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR MEASURING PERIODIC STRUCTURES USING MULTI-A...
- Publication number 20150204802
- Publication date Jul 23, 2015
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE DISTRIBUTION PROFILING OF AN...
- Publication number 20150069230
- Publication date Mar 12, 2015
- Paola deCecco
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Fabricating Platelets of a Monochromator fo...
- Publication number 20150052723
- Publication date Feb 26, 2015
- Jeffrey T. Fanton
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE DISTRIBUTION PROFILING OF AN...
- Publication number 20140070096
- Publication date Mar 13, 2014
- Paolo deCecco
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CHARACTERIZING A FILM BY X-RAY PHOTOELECTRON...
- Publication number 20130077742
- Publication date Mar 28, 2013
- Bruno W. Schueler
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE DISTRIBUTION PROFILING OF AN...
- Publication number 20120318974
- Publication date Dec 20, 2012
- Paola deCecco
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE DISTRIBUTION PROFILING OF AN...
- Publication number 20110144787
- Publication date Jun 16, 2011
- Paola deCecco
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND SYSTEM FOR CALIBRATING AN X-RAY PHOTOELECTRON SPECTROSCO...
- Publication number 20090268877
- Publication date Oct 29, 2009
- Bruno W. Schueler
- G01 - MEASURING TESTING
Information Patent Application
Method and system for non-destructive distribution profiling of an...
- Publication number 20080283743
- Publication date Nov 20, 2008
- Paola deCecco
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Photoelectron spectroscopy apparatus and method of use
- Publication number 20070069125
- Publication date Mar 29, 2007
- Bruno W. Schueler
- G01 - MEASURING TESTING
Information Patent Application
Method and system for non-destructive distribution profiling of an...
- Publication number 20070010973
- Publication date Jan 11, 2007
- Paola deCecco
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Determining layer thickness using photoelectron spectroscopy
- Publication number 20060243904
- Publication date Nov 2, 2006
- Bruno Schueler
- G01 - MEASURING TESTING
Information Patent Application
Techniques for analyzing data generated by instruments
- Publication number 20060247899
- Publication date Nov 2, 2006
- James Orrock
- G01 - MEASURING TESTING

Bruno Schueler

Person

Patents Grantslast 30 patents

Patterned x-ray emitting target

Systems and approaches for semiconductor metrology and surface anal...

Systems and approaches for semiconductor metrology and surface anal...

Systems and approaches for semiconductor metrology and surface anal...

Methods and systems for measuring periodic structures using multi-a...

Systems and approaches for semiconductor metrology and surface anal...

Methods and systems for measuring periodic structures using multi-a...

Systems and approaches for semiconductor metrology and surface anal...

Methods and systems for measuring periodic structures using multi-a...

Systems and approaches for semiconductor metrology and surface anal...

Methods and systems for measuring periodic structures using multi-a...

Methods and systems for fabricating platelets of a monochromator fo...

System and method for characterizing a film by X-ray photoelectron...

Method and system for non-destructive distribution profiling of an...

Method and system for non-destructive distribution profiling of an...

Method and system for non-destructive distribution profiling of an...

Method and system for non-destructive distribution profiling of an...

Method and system for calibrating an X-ray photoelectron spectrosco...

Method and system for non-destructive distribution profiling of an...

Determining layer thickness using photoelectron spectroscopy

Method and system for non-destructive distribution profiling of an...

Photoelectron spectroscopy apparatus and method of use

Techniques for analyzing data generated by instruments

Focused ion beam column with electrically variable blanking aperture

Particle analyzer apparatus and method

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATT...

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

PATTERNED X-RAY EMITTING TARGET

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

METHODS AND SYSTEMS FOR MEASURING PERIODIC STRUCTURES USING MULTI-A...

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

METHODS AND SYSTEMS FOR MEASURING PERIODIC STRUCTURES USING MULTI-A...

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

METHODS AND SYSTEMS FOR MEASURING PERIODIC STRUCTURES USING MULTI-A...

METHODS AND SYSTEMS FOR MEASURING PERIODIC STRUCTURES USING MULTI-A...

METHOD AND SYSTEM FOR NON-DESTRUCTIVE DISTRIBUTION PROFILING OF AN...

Methods and Systems for Fabricating Platelets of a Monochromator fo...

METHOD AND SYSTEM FOR NON-DESTRUCTIVE DISTRIBUTION PROFILING OF AN...

SYSTEM AND METHOD FOR CHARACTERIZING A FILM BY X-RAY PHOTOELECTRON...

METHOD AND SYSTEM FOR NON-DESTRUCTIVE DISTRIBUTION PROFILING OF AN...

METHOD AND SYSTEM FOR NON-DESTRUCTIVE DISTRIBUTION PROFILING OF AN...

METHOD AND SYSTEM FOR CALIBRATING AN X-RAY PHOTOELECTRON SPECTROSCO...

Method and system for non-destructive distribution profiling of an...

Photoelectron spectroscopy apparatus and method of use

Method and system for non-destructive distribution profiling of an...

Determining layer thickness using photoelectron spectroscopy

Techniques for analyzing data generated by instruments