Bryan J. Robbins

Person

Beavercreek, OH, US

People

Patents Grantslast 30 patents

Information Patent Grant
Selective test pattern processor
- Patent number 9,274,173
- Issue date Mar 1, 2016
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Grant
Selective test pattern processor
- Patent number 9,274,172
- Issue date Mar 1, 2016
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Grant
Logic-built-in-self-test diagnostic method for root cause identific...
- Patent number 9,244,757
- Issue date Jan 26, 2016
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Grant
Logic-built-in-self-test diagnostic method for root cause identific...
- Patent number 9,244,756
- Issue date Jan 26, 2016
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Grant
Circuit design optimization
- Patent number 8,443,313
- Issue date May 14, 2013
- International Business Machines Corporation
- Samuel I. Ward
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit design optimization
- Patent number 8,386,230
- Issue date Feb 26, 2013
- International Business Machines Corporation
- Samuel I. Ward
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for improving random pattern testing of logic...
- Patent number 8,095,837
- Issue date Jan 10, 2012
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing logic built-in self-testing of...
- Patent number 7,934,134
- Issue date Apr 26, 2011
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Grant
Verification of array built-in self-test (ABIST) design-for-test/de...
- Patent number 7,921,346
- Issue date Apr 5, 2011
- International Business Machines Corporation
- Donato Orazio Forlenza
- G11 - INFORMATION STORAGE
Information Patent Grant
Automated BIST test pattern sequence generator software system and...
- Patent number 7,117,415
- Issue date Oct 3, 2006
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Grant
Synchronous bi-directional data transfer having increased bandwidth...
- Patent number 6,990,076
- Issue date Jan 24, 2006
- Timothy G. McNamara
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for facilitating random pattern testing of log...
- Patent number 6,836,865
- Issue date Dec 28, 2004
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for determining repeatable yield detractors of in...
- Patent number 6,751,765
- Issue date Jun 15, 2004
- International Business Machines Corporation
- Richard F. Rizzolo
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for programmable LBIST channel weighting
- Patent number 6,671,838
- Issue date Dec 30, 2003
- International Business Machines Corporation
- Timothy J. Koprowski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method to improve a testability analysis of a hierarchical design
- Patent number 6,532,571
- Issue date Mar 11, 2003
- International Business Machines Corporation
- Richard M. Gabrielson
- G01 - MEASURING TESTING
Information Patent Grant
Partitioned pseudo-random logic test for improved manufacturability...
- Patent number 6,314,540
- Issue date Nov 6, 2001
- International Business Machines Corporation
- William V. Huott
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LOGIC-BUILT-IN-SELF-TEST DIAGNOSTIC METHOD FOR ROOT CAUSE IDENTIFIC...
- Publication number 20160033570
- Publication date Feb 4, 2016
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Application
LOGIC-BUILT-IN-SELF-TEST DIAGNOSTIC METHOD FOR ROOT CAUSE IDENTIFIC...
- Publication number 20160033571
- Publication date Feb 4, 2016
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Application
SELECTIVE TEST PATTERN PROCESSOR
- Publication number 20150113350
- Publication date Apr 23, 2015
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Application
SELECTIVE TEST PATTERN PROCESSOR
- Publication number 20150113349
- Publication date Apr 23, 2015
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT DESIGN OPTIMIZATION
- Publication number 20120047476
- Publication date Feb 23, 2012
- International Business Machines Corporation
- Samuel I. Ward
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT DESIGN OPTIMIZATION
- Publication number 20120046921
- Publication date Feb 23, 2012
- International Business Machines Corporation
- Samuel I. Ward
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VERIFICATION OF ARRAY BUILT-IN SELF-TEST (ABIST) DESIGN-FOR-TEST/DE...
- Publication number 20100115337
- Publication date May 6, 2010
- Donato Orazio Forlenza
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR PERFORMING LOGIC BUILT-IN SELF-TESTING OF...
- Publication number 20090307548
- Publication date Dec 10, 2009
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR IMPROVING RANDOM PATTERN TESTING OF LOGIC...
- Publication number 20090240995
- Publication date Sep 24, 2009
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Application
Automated bist test pattern sequence generator software system and...
- Publication number 20050160339
- Publication date Jul 21, 2005
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for facilitating random pattern testing of log...
- Publication number 20030070127
- Publication date Apr 10, 2003
- Mary P. Kusko
- G01 - MEASURING TESTING

Bryan J. Robbins

Person

Patents Grantslast 30 patents

Selective test pattern processor

Selective test pattern processor

Logic-built-in-self-test diagnostic method for root cause identific...

Logic-built-in-self-test diagnostic method for root cause identific...

Circuit design optimization

Circuit design optimization

Method and apparatus for improving random pattern testing of logic...

Method and apparatus for performing logic built-in self-testing of...

Verification of array built-in self-test (ABIST) design-for-test/de...

Automated BIST test pattern sequence generator software system and...

Synchronous bi-directional data transfer having increased bandwidth...

Method and apparatus for facilitating random pattern testing of log...

Method and system for determining repeatable yield detractors of in...

Method and apparatus for programmable LBIST channel weighting

Method to improve a testability analysis of a hierarchical design

Partitioned pseudo-random logic test for improved manufacturability...

Patents Applicationslast 30 patents

LOGIC-BUILT-IN-SELF-TEST DIAGNOSTIC METHOD FOR ROOT CAUSE IDENTIFIC...

LOGIC-BUILT-IN-SELF-TEST DIAGNOSTIC METHOD FOR ROOT CAUSE IDENTIFIC...

SELECTIVE TEST PATTERN PROCESSOR

SELECTIVE TEST PATTERN PROCESSOR

CIRCUIT DESIGN OPTIMIZATION

CIRCUIT DESIGN OPTIMIZATION

VERIFICATION OF ARRAY BUILT-IN SELF-TEST (ABIST) DESIGN-FOR-TEST/DE...

METHOD AND APPARATUS FOR PERFORMING LOGIC BUILT-IN SELF-TESTING OF...

METHOD AND APPARATUS FOR IMPROVING RANDOM PATTERN TESTING OF LOGIC...

Automated bist test pattern sequence generator software system and...

Method and apparatus for facilitating random pattern testing of log...