Byong-Hui Yun

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Yongin-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for testing electrical characteristics of semi...
- Patent number 7,274,196
- Issue date Sep 25, 2007
- Samsung Electronics Co., Ltd.
- Byong-Hui Yun
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TEST SYSTEM CAPABLE OF VIRTUAL TEST AND SEMICONDUCTOR...
- Publication number 20080068036
- Publication date Mar 20, 2008
- Byong-Hui Yun
- G01 - MEASURING TESTING
Information Patent Application
Methods for testing a plurality of semiconductor devices in paralle...
- Publication number 20070061659
- Publication date Mar 15, 2007
- SAMSUNG ELECTRONICS CO., LTD.
- Byong-Hui Yun
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for testing electrical characteristics of semi...
- Publication number 20060145717
- Publication date Jul 6, 2006
- SAMSUNG ELECTRONICS CO., LTD.
- Byong-Hui Yun
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for controlling device power supply in semicon...
- Publication number 20060126248
- Publication date Jun 15, 2006
- SAMSUNG ELECTRONICS CO., LTD.
- Seung-Chul Choi
- G01 - MEASURING TESTING