Byung-Soo EUN

Person

Gyeonggi-do, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Method for fabricating an inter dielectric layer in semiconductor d...
- Patent number 9,437,423
- Issue date Sep 6, 2016
- SK hynix Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for fabricating the same
- Patent number 9,018,708
- Issue date Apr 28, 2015
- SK Hynix Inc.
- Byung-Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating an inter dielectric layer in semiconductor d...
- Patent number 8,592,326
- Issue date Nov 26, 2013
- SK hynix Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming isolation layer in semiconductor device
- Patent number 8,211,779
- Issue date Jul 3, 2012
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation structure in a memory device
- Patent number 8,169,048
- Issue date May 1, 2012
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device for preventing the leaning of storage nodes an...
- Patent number 8,114,733
- Issue date Feb 14, 2012
- Hynix Semiconductor Inc.
- Hun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating cylinder type capacitor
- Patent number 8,105,497
- Issue date Jan 31, 2012
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming isolation layer in semiconductor device
- Patent number 8,003,489
- Issue date Aug 23, 2011
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device for preventing the leaning of storage nodes
- Patent number 7,994,561
- Issue date Aug 9, 2011
- Hynix Semiconductor Inc.
- Hun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating storage node electrode in semiconductor device
- Patent number 7,989,287
- Issue date Aug 2, 2011
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Trench isolation structure in a semiconductor device and method for...
- Patent number 7,968,948
- Issue date Jun 28, 2011
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating bitline in semiconductor device
- Patent number 7,932,168
- Issue date Apr 26, 2011
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitor of semiconductor device and method for forming the same
- Patent number 7,923,343
- Issue date Apr 12, 2011
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation structure in memory device and method for fabricating the...
- Patent number 7,919,390
- Issue date Apr 5, 2011
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for insulating wires of semiconductor device
- Patent number 7,910,480
- Issue date Mar 22, 2011
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation structure in memory device and method for fabricating the...
- Patent number 7,902,037
- Issue date Mar 8, 2011
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device free from layer-lifti...
- Patent number 7,879,733
- Issue date Feb 1, 2011
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating isolation film in semiconductor device
- Patent number 7,754,561
- Issue date Jul 13, 2010
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having recess gate and isolation structure and...
- Patent number 7,737,017
- Issue date Jun 15, 2010
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming storage electrode of semiconductor memory device
- Patent number 7,736,972
- Issue date Jun 15, 2010
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming isolation layer in semiconductor device
- Patent number 7,713,887
- Issue date May 11, 2010
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having step gates and method of manufacturing...
- Patent number 7,652,323
- Issue date Jan 26, 2010
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a recess channel and method for fabrica...
- Patent number 7,618,885
- Issue date Nov 17, 2009
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating a dual poly gate in semiconductor device
- Patent number 7,537,995
- Issue date May 26, 2009
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Trench isolation structure in a semiconductor device and method for...
- Patent number 7,482,246
- Issue date Jan 27, 2009
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a recess channel and method for fabrica...
- Patent number 7,442,990
- Issue date Oct 28, 2008
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bit line barrier metal layer for semiconductor device and process f...
- Patent number 7,435,670
- Issue date Oct 14, 2008
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bit line barrier metal layer for semiconductor device and process f...
- Patent number 7,276,725
- Issue date Oct 2, 2007
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming metal contact in semiconductor device
- Patent number 7,153,771
- Issue date Dec 26, 2006
- Hynix Semiconductor Inc.
- Byung-Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20140061806
- Publication date Mar 6, 2014
- SK HYNIX INC.
- Byung-Soo EUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING AN INTER DIELECTRIC LAYER IN SEMICONDUCTOR D...
- Publication number 20140045325
- Publication date Feb 13, 2014
- SK HYNIX INC.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING ISOLATION LAYER IN SEMICONDUCTOR DEVICE
- Publication number 20120270380
- Publication date Oct 25, 2012
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE FOR PREVENTING THE LEANING OF STORAGE NODES AN...
- Publication number 20110256696
- Publication date Oct 20, 2011
- Hynix Semiconductor Inc.
- Hun KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Isolation Structure in a Memory Device
- Publication number 20110127634
- Publication date Jun 2, 2011
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING STORAGE NODE ELECTRODE IN SEMICONDUCTOR DEVICE
- Publication number 20110065251
- Publication date Mar 17, 2011
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Fabricating Bitline in Semiconductor Device
- Publication number 20100330804
- Publication date Dec 30, 2010
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR INSULATING WIRES OF SEMICONDUCTOR DEVICE
- Publication number 20100167539
- Publication date Jul 1, 2010
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Fabricating Cylinder Type Capacitor
- Publication number 20100159700
- Publication date Jun 24, 2010
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE HAVING STEP GATES
- Publication number 20100124807
- Publication date May 20, 2010
- HYNIX SEMICONDUCTOR INC.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING RECESS GATE AND ISOLATION STRUCTURE AND...
- Publication number 20100078757
- Publication date Apr 1, 2010
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITOR OF SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME
- Publication number 20100052097
- Publication date Mar 4, 2010
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE FOR PREVENTING THE LEANING OF STORAGE NODES AN...
- Publication number 20090267197
- Publication date Oct 29, 2009
- Hun KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Isolation Structure in Memory Device and Method for Fabricating the...
- Publication number 20090256233
- Publication date Oct 15, 2009
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Isolation Structure in Memory Device and Method for Fabricating the...
- Publication number 20090243050
- Publication date Oct 1, 2009
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRENCH ISOLATION STRUCTURE IN A SEMICONDUCTOR DEVICE AND METHOD FOR...
- Publication number 20090127650
- Publication date May 21, 2009
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING ISOLATION LAYER IN SEMICONDUCTOR DEVICE
- Publication number 20090068817
- Publication date Mar 12, 2009
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING ISOLATION LAYER IN SEMICONDUCTOR DEVICE
- Publication number 20090068816
- Publication date Mar 12, 2009
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING AN INTER DIELECTRIC LAYER IN SEMICONDUCTOR D...
- Publication number 20090004849
- Publication date Jan 1, 2009
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING AN INTERLAYER DIELECTRIC IN A SEMICONDUCTOR...
- Publication number 20090004839
- Publication date Jan 1, 2009
- Hynix Semiconductor Inc.
- Byung Soo EUN
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SEMICONDUCTOR DEVICE HAVING A RECESS CHANNEL AND METHOD FOR FABRICA...
- Publication number 20080318402
- Publication date Dec 25, 2008
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Forming Storage Electrode of Semiconductor Memory Device
- Publication number 20080318407
- Publication date Dec 25, 2008
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Fabricating Isolation Layer in Semiconductor Device
- Publication number 20080254593
- Publication date Oct 16, 2008
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method For Fabricating Isolation Film In Semiconductor Device
- Publication number 20080160721
- Publication date Jul 3, 2008
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method For Fabricating A Dual Poly Gate In Semiconductor Device
- Publication number 20080160745
- Publication date Jul 3, 2008
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device Manufacturing Method
- Publication number 20080067685
- Publication date Mar 20, 2008
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Bit Line Barrier Metal Layer for Semiconductor Device and Process f...
- Publication number 20080026571
- Publication date Jan 31, 2008
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for manufacturing semiconductor device free from layer-lifti...
- Publication number 20080003766
- Publication date Jan 3, 2008
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Forming Isolation Layer in Semiconductor Device
- Publication number 20070232021
- Publication date Oct 4, 2007
- Hynix Semiconductor Inc.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for fabricating semiconductor device and semiconductor devic...
- Publication number 20070026616
- Publication date Feb 1, 2007
- HYNIX SEMICONDUCTOR INC.
- Byung Soo Eun
- H01 - BASIC ELECTRIC ELEMENTS

Byung-Soo EUN

Person

Patents Grantslast 30 patents

Method for fabricating an inter dielectric layer in semiconductor d...

Semiconductor device and method for fabricating the same

Method for fabricating an inter dielectric layer in semiconductor d...

Method for forming isolation layer in semiconductor device

Isolation structure in a memory device

Semiconductor device for preventing the leaning of storage nodes an...

Method for fabricating cylinder type capacitor

Method for forming isolation layer in semiconductor device

Semiconductor device for preventing the leaning of storage nodes

Method for fabricating storage node electrode in semiconductor device

Trench isolation structure in a semiconductor device and method for...

Method for fabricating bitline in semiconductor device

Capacitor of semiconductor device and method for forming the same

Isolation structure in memory device and method for fabricating the...

Method for insulating wires of semiconductor device

Isolation structure in memory device and method for fabricating the...

Method for manufacturing semiconductor device free from layer-lifti...

Method for fabricating isolation film in semiconductor device

Semiconductor device having recess gate and isolation structure and...

Method for forming storage electrode of semiconductor memory device

Method for forming isolation layer in semiconductor device

Semiconductor device having step gates and method of manufacturing...

Semiconductor device having a recess channel and method for fabrica...

Method for fabricating a dual poly gate in semiconductor device

Trench isolation structure in a semiconductor device and method for...

Semiconductor device having a recess channel and method for fabrica...

Bit line barrier metal layer for semiconductor device and process f...

Bit line barrier metal layer for semiconductor device and process f...

Method for forming metal contact in semiconductor device

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

METHOD FOR FABRICATING AN INTER DIELECTRIC LAYER IN SEMICONDUCTOR D...

METHOD FOR FORMING ISOLATION LAYER IN SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE FOR PREVENTING THE LEANING OF STORAGE NODES AN...

Isolation Structure in a Memory Device

METHOD FOR FABRICATING STORAGE NODE ELECTRODE IN SEMICONDUCTOR DEVICE

Method for Fabricating Bitline in Semiconductor Device

METHOD FOR INSULATING WIRES OF SEMICONDUCTOR DEVICE

Method for Fabricating Cylinder Type Capacitor

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE HAVING STEP GATES

SEMICONDUCTOR DEVICE HAVING RECESS GATE AND ISOLATION STRUCTURE AND...

CAPACITOR OF SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME

SEMICONDUCTOR DEVICE FOR PREVENTING THE LEANING OF STORAGE NODES AN...

Isolation Structure in Memory Device and Method for Fabricating the...

Isolation Structure in Memory Device and Method for Fabricating the...

TRENCH ISOLATION STRUCTURE IN A SEMICONDUCTOR DEVICE AND METHOD FOR...

METHOD FOR FORMING ISOLATION LAYER IN SEMICONDUCTOR DEVICE

METHOD FOR FORMING ISOLATION LAYER IN SEMICONDUCTOR DEVICE

METHOD FOR FABRICATING AN INTER DIELECTRIC LAYER IN SEMICONDUCTOR D...

METHOD FOR FABRICATING AN INTERLAYER DIELECTRIC IN A SEMICONDUCTOR...

SEMICONDUCTOR DEVICE HAVING A RECESS CHANNEL AND METHOD FOR FABRICA...

Method for Forming Storage Electrode of Semiconductor Memory Device

Method for Fabricating Isolation Layer in Semiconductor Device

Method For Fabricating Isolation Film In Semiconductor Device

Method For Fabricating A Dual Poly Gate In Semiconductor Device

Semiconductor Device Manufacturing Method

Bit Line Barrier Metal Layer for Semiconductor Device and Process f...

Method for manufacturing semiconductor device free from layer-lifti...

Method for Forming Isolation Layer in Semiconductor Device

Method for fabricating semiconductor device and semiconductor devic...