Carole D. Graas

Person

Garland, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 11,054,459
- Issue date Jul 6, 2021
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Grant
Overhang model for reducing passivation stress and method for produ...
- Patent number 11,031,358
- Issue date Jun 8, 2021
- Marvell Asia Pte, Ltd.
- Aarthi Sridharan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 10,996,259
- Issue date May 4, 2021
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 10,989,754
- Issue date Apr 27, 2021
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Grant
Moisture detection and ingression monitoring systems and methods of...
- Patent number 10,900,923
- Issue date Jan 26, 2021
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 10,564,214
- Issue date Feb 18, 2020
- International Business Machines Corporation
- Carole D. Graas
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Moisture detection and ingression monitoring systems and methods of...
- Patent number 10,545,110
- Issue date Jan 28, 2020
- International Business Machines Corporation
- Fen Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Moisture detection and ingression monitoring systems and methods of...
- Patent number 10,545,111
- Issue date Jan 28, 2020
- International Business Machines Corporation
- Fen Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Thru-silicon-via structures
- Patent number 10,388,567
- Issue date Aug 20, 2019
- GLOBALFOUNDRIES Inc.
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Moisture detection and ingression monitoring systems and methods of...
- Patent number 10,324,056
- Issue date Jun 18, 2019
- International Business Machines Corporation
- Fen Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Moisture detection and ingression monitoring systems and methods of...
- Patent number 10,309,919
- Issue date Jun 4, 2019
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Grant
Moisture detection and ingression monitoring systems and methods of...
- Patent number 10,126,260
- Issue date Nov 13, 2018
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Grant
Thru-silicon-via structures
- Patent number 9,812,359
- Issue date Nov 7, 2017
- GLOBALFOUNDRIES Inc.
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 9,739,824
- Issue date Aug 22, 2017
- International Business Machines Corporation
- Carole D. Graas
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 9,395,403
- Issue date Jul 19, 2016
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method for RAS-enabled and self-regulated frequency and...
- Patent number 8,729,920
- Issue date May 20, 2014
- International Business Machines Corporation
- Carole D. Graas
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrating design for reliability technology into integrated circuits
- Patent number 8,201,038
- Issue date Jun 12, 2012
- International Business Machines Corporation
- Carole D. Graas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for accelerated determination of electromigrat...
- Patent number 6,603,321
- Issue date Aug 5, 2003
- International Business Machines Corporation
- Ronald G. Filippi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor metal interconnect reliability test structure
- Patent number 6,570,181
- Issue date May 27, 2003
- Texas Instruments Incorporated
- Carole D. Graas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Buffered capped interconnect for a semiconductor device
- Patent number 5,360,995
- Issue date Nov 1, 1994
- Texas Instruments Incorporated
- Carole D. Graas
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20200141996
- Publication date May 7, 2020
- International Business Machines Corporation
- Carole D. Graas
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20200072897
- Publication date Mar 5, 2020
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS AND METHODS OF...
- Publication number 20200049651
- Publication date Feb 13, 2020
- International Business Machines Corporation
- Fen CHEN
- G01 - MEASURING TESTING
Information Patent Application
OVERHANG MODEL FOR REDUCING PASSIVATION STRESS AND METHOD FOR PRODU...
- Publication number 20190273051
- Publication date Sep 5, 2019
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Aarthi SRIDHARAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS AND METHODS OF...
- Publication number 20190250116
- Publication date Aug 15, 2019
- International Business Machines Corporation
- Fen CHEN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS AND METHODS OF...
- Publication number 20180356359
- Publication date Dec 13, 2018
- International Business Machines Corporation
- Fen CHEN
- G01 - MEASURING TESTING
Information Patent Application
MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS AND METHODS OF...
- Publication number 20180356358
- Publication date Dec 13, 2018
- International Business Machines Corporation
- Fen CHEN
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR SUBSTRATE WITH METALLIC DOPED BURIED OXIDE
- Publication number 20180138209
- Publication date May 17, 2018
- GLOBALFOUNDRIES INC.
- Wen Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20180074114
- Publication date Mar 15, 2018
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
THRU-SILICON-VIA STRUCTURES
- Publication number 20180047626
- Publication date Feb 15, 2018
- GLOBALFOUNDRIES INC.
- Fen CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20170285094
- Publication date Oct 5, 2017
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
THRU-SILICON-VIA STRUCTURES
- Publication number 20160358821
- Publication date Dec 8, 2016
- International Business Machines Corporation
- Fen CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS
- Publication number 20160327502
- Publication date Nov 10, 2016
- International Business Machines Corporation
- Fen CHEN
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20160258994
- Publication date Sep 8, 2016
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
DEVICE STRUCTURE WITH NEGATIVE RESISTANCE CHARACTERISTICS
- Publication number 20160225919
- Publication date Aug 4, 2016
- GLOBALFOUNDRIES INC.
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20150115994
- Publication date Apr 30, 2015
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT CHIP INCORPORATING A TEST CIRCUIT THAT ALLOWS FO...
- Publication number 20120259575
- Publication date Oct 11, 2012
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT AND METHOD FOR RAS-ENABLED AND SELF-REGULATED FREQUENCY AND...
- Publication number 20120126870
- Publication date May 24, 2012
- International Business Machines Corporation
- Carole D. GRAAS
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATING DESIGN FOR RELIABILITY TECHNOLOGY INTO INTEGRATED CIRCUITS
- Publication number 20110078506
- Publication date Mar 31, 2011
- International Business Machines Corporation
- Carole D. Graas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR ACCELERATED DETERMINATION OF ELECTROMIGRAT...
- Publication number 20030080761
- Publication date May 1, 2003
- International Business Machines Corporation and Infineon Technologies North A...
- Ronald G. Filippi
- G01 - MEASURING TESTING

Carole D. Graas

Person

Patents Grantslast 30 patents

Optimization of integrated circuit reliability

Overhang model for reducing passivation stress and method for produ...

Optimization of integrated circuit reliability

Optimization of integrated circuit reliability

Moisture detection and ingression monitoring systems and methods of...

Optimization of integrated circuit reliability

Moisture detection and ingression monitoring systems and methods of...

Moisture detection and ingression monitoring systems and methods of...

Thru-silicon-via structures

Moisture detection and ingression monitoring systems and methods of...

Moisture detection and ingression monitoring systems and methods of...

Moisture detection and ingression monitoring systems and methods of...

Thru-silicon-via structures

Optimization of integrated circuit reliability

Optimization of integrated circuit reliability

Circuit and method for RAS-enabled and self-regulated frequency and...

Integrating design for reliability technology into integrated circuits

Method and apparatus for accelerated determination of electromigrat...

Semiconductor metal interconnect reliability test structure

Buffered capped interconnect for a semiconductor device

Patents Applicationslast 30 patents

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS AND METHODS OF...

OVERHANG MODEL FOR REDUCING PASSIVATION STRESS AND METHOD FOR PRODU...

MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS AND METHODS OF...

MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS AND METHODS OF...

MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS AND METHODS OF...

SEMICONDUCTOR SUBSTRATE WITH METALLIC DOPED BURIED OXIDE

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

THRU-SILICON-VIA STRUCTURES

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

THRU-SILICON-VIA STRUCTURES

MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

DEVICE STRUCTURE WITH NEGATIVE RESISTANCE CHARACTERISTICS

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

INTEGRATED CIRCUIT CHIP INCORPORATING A TEST CIRCUIT THAT ALLOWS FO...

CIRCUIT AND METHOD FOR RAS-ENABLED AND SELF-REGULATED FREQUENCY AND...

INTEGRATING DESIGN FOR RELIABILITY TECHNOLOGY INTO INTEGRATED CIRCUITS

METHOD AND APPARATUS FOR ACCELERATED DETERMINATION OF ELECTROMIGRAT...