Casper Juffermans

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Valkenswaard, NL

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit with sensor and method of manufacturing such an...
- Patent number 9,766,195
- Issue date Sep 19, 2017
- ams International AG
- Roel Daamen
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with ion sensitive sensor and manufacturing method
- Patent number 9,099,486
- Issue date Aug 4, 2015
- NXP, B.V.
- Matthias Merz
- G01 - MEASURING TESTING
Information Patent Grant
Double patterning for lithography to increase feature spatial density
- Patent number 8,148,052
- Issue date Apr 3, 2012
- NXP B.V.
- Anja Monique Vanleenhove
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT WITH ION SENSITIVE SENSOR AND MANUFACTURING METHOD
- Publication number 20130334619
- Publication date Dec 19, 2013
- Matthias Merz
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH SENSOR AND METHOD OF MANUFACTURING SUCH AN...
- Publication number 20120299126
- Publication date Nov 29, 2012
- NXP B.V.
- Roel Daamen
- G01 - MEASURING TESTING
Information Patent Application
DOUBLE PATTERNING FOR LITHOGRAPHY TO INCREASE FEATURE SPATIAL DENSITY
- Publication number 20100028809
- Publication date Feb 4, 2010
- NXP, B.V.
- Anja Monique Vanleenhove
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY