Chad Rue

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method of material deposition
- Patent number 11,798,804
- Issue date Oct 24, 2023
- FEI Company
- Brian Roberts Routh
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method, device and system for the treatment of biological cryogenic...
- Patent number 11,735,404
- Issue date Aug 22, 2023
- FEI Company
- Alex De Marco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing microrods for electron emitters, and associated...
- Patent number 11,651,924
- Issue date May 16, 2023
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of material deposition
- Patent number 11,069,523
- Issue date Jul 20, 2021
- FEI Company
- Brian Roberts Routh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Face-on, gas-assisted etching for plan-view lamellae preparation
- Patent number 11,062,879
- Issue date Jul 13, 2021
- FEI Company
- Noel Thomas Franco
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for the planarization of surfaces
- Patent number 10,930,514
- Issue date Feb 23, 2021
- FEI Company
- Philip Brundage
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Face-on, gas-assisted etching for plan-view lamellae preparation
- Patent number 10,546,719
- Issue date Jan 28, 2020
- FEI Company
- Noel Thomas Franco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhanced charged particle beam processes for carbon removal
- Patent number 10,347,463
- Issue date Jul 9, 2019
- FEI Company
- Chad Rue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion implantation to alter etch rate
- Patent number 10,325,754
- Issue date Jun 18, 2019
- FEI Company
- David Foord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tomography sample preparation systems and methods with improved spe...
- Patent number 10,190,953
- Issue date Jan 29, 2019
- Guillaume Delpy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Material characterization using ion channeling imaging
- Patent number 9,983,152
- Issue date May 29, 2018
- FEI Company
- Steven Randolph
- G01 - MEASURING TESTING
Information Patent Grant
Method of material deposition
- Patent number 9,978,586
- Issue date May 22, 2018
- FEI Company
- Brian Roberts Routh
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Gas injection system with precursor for planar deprocessing of semi...
- Patent number 9,761,467
- Issue date Sep 12, 2017
- FEI Company
- Chad Rue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low energy ion beam etch
- Patent number 9,443,697
- Issue date Sep 13, 2016
- FEI Company
- Chad Rue
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
High accuracy beam placement for local area navigation
- Patent number 9,087,366
- Issue date Jul 21, 2015
- FEI Company
- Richard J. Young
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Precursor for planar deprocessing of semiconductor devices using a...
- Patent number 9,064,811
- Issue date Jun 23, 2015
- FEI Company
- Chad Rue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High accuracy beam placement for local area navigation
- Patent number 8,781,219
- Issue date Jul 15, 2014
- FEI Company
- Reinier Louis Warschauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam processing system with visual and infrared im...
- Patent number 8,610,092
- Issue date Dec 17, 2013
- FEI Company
- Chad Rue
- G01 - MEASURING TESTING
Information Patent Grant
Navigation and sample processing using an ion source containing bot...
- Patent number 8,455,822
- Issue date Jun 4, 2013
- FEI Company
- Chad Rue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High accuracy beam placement for local area navigation
- Patent number 8,358,832
- Issue date Jan 22, 2013
- FEI Company
- Richard J. Young
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High accuracy beam placement for local area navigation
- Patent number 8,059,918
- Issue date Nov 15, 2011
- FEI Company
- Richard J. Young
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
In-situ high-resolution light-optical channel for optical viewing a...
- Patent number 7,781,733
- Issue date Aug 24, 2010
- International Business Machines Corporation
- Steven B. Herschbein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-resolution optical channel for non-destructive navigation and...
- Patent number 7,351,966
- Issue date Apr 1, 2008
- International Business Machines Corporation
- Herschel M. Marchman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detector for ion beam applications
- Patent number 7,119,333
- Issue date Oct 10, 2006
- International Business Machines Corporation
- Steven B. Herschbein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample mount for performing sputter-deposition in a focused ion bea...
- Patent number 6,946,064
- Issue date Sep 20, 2005
- International Business Machines Corporation
- Lawrence S. Fischer
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Dry etch process to edit copper lines
- Patent number 6,900,137
- Issue date May 31, 2005
- International Business Machines Corporation
- Steven B. Herschbein
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Metal dry etch using electronic field
- Patent number 6,843,893
- Issue date Jan 18, 2005
- International Business Machines Corporation
- Steven B. Herschbein
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
CRENELLATED SAMPLE HOLDER AND SPUTTER TARGET FOR SAMPLE PREPARATION...
- Publication number 20240331969
- Publication date Oct 3, 2024
- FEI Company
- Chad Rue
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
CONDENSATE PRECURSORS AND CONTAMINANT PURGE APPARATUS AND METHODS
- Publication number 20240222068
- Publication date Jul 4, 2024
- FEI Company
- Jing Wang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHODS AND SYSTEMS FOR ELEMENTAL MAPPING
- Publication number 20230095798
- Publication date Mar 30, 2023
- FEI Company
- Garrett BUDNIK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MATERIAL DEPOSITION
- Publication number 20210118678
- Publication date Apr 22, 2021
- FEI Company
- Brian Roberts Routh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR LARGE-AREA 3D ANALYSIS OF SAMPLES USING GLANCING INCIDEN...
- Publication number 20210118646
- Publication date Apr 22, 2021
- FEI Company
- Chad Rue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, DEVICE AND SYSTEM FOR THE TREATMENT OF BIOLOGICAL CRYOGENIC...
- Publication number 20210066056
- Publication date Mar 4, 2021
- FEI Company
- Alex DE MARCO
- G01 - MEASURING TESTING
Information Patent Application
FACE-ON, GAS-ASSISTED ETCHING FOR PLAN-VIEW LAMELLAE PREPARATION
- Publication number 20200126756
- Publication date Apr 23, 2020
- FEI Company
- Noel Thomas Franco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for the Planarization of Surfaces
- Publication number 20190378689
- Publication date Dec 12, 2019
- FEI Company
- Philip BRUNDAGE
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD, DEVICE AND SYSTEM FOR THE TREATMENT OF BIOLOGICAL CRYOGENIC...
- Publication number 20190206664
- Publication date Jul 4, 2019
- FEI Company
- Alex DE MARCO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FACE-ON, GAS-ASSISTED ETCHING FOR PLAN-VIEW LAMELLAE PREPARATION
- Publication number 20180350558
- Publication date Dec 6, 2018
- FEI Company
- Noel Thomas Franco
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MATERIAL DEPOSITION
- Publication number 20180277361
- Publication date Sep 27, 2018
- FEI Company
- Brian Roberts Routh
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED CHARGED PARTICLE BEAM PROCESSES FOR CARBON REMOVAL
- Publication number 20180166272
- Publication date Jun 14, 2018
- FEI Company
- Chad Rue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOMOGRAPHY SAMPLE PREPARATION SYSTEMS AND METHODS WITH IMPROVED SPE...
- Publication number 20180143110
- Publication date May 24, 2018
- FEI Company
- Guillaume Delpy
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL CHARACTERIZATION USING ION CHANNELING IMAGING
- Publication number 20180136147
- Publication date May 17, 2018
- FEI Company
- Steven Randolph
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MATERIAL DEPOSITION
- Publication number 20170133220
- Publication date May 11, 2017
- FEI Company
- Brian Roberts Routh
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ADAPTIVE CONTROL FOR CHARGED PARTICLE BEAM PROCESSING
- Publication number 20170002467
- Publication date Jan 5, 2017
- FEI Company
- Marcus Straw
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Ion Implantation to Alter Etch Rate
- Publication number 20150348752
- Publication date Dec 3, 2015
- FEI Company
- David Foord
- G01 - MEASURING TESTING
Information Patent Application
GAS INJECTION SYSTEM WITH PRECURSOR FOR PLANAR DEPROCESSING OF SEMI...
- Publication number 20150294885
- Publication date Oct 15, 2015
- FEI Company
- Chad Rue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH ACCURACY BEAM PLACEMENT FOR LOCAL AREA NAVIGATION
- Publication number 20150016677
- Publication date Jan 15, 2015
- FEI Company
- Richard J. Young
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Precursor for Planar Deprocessing of Semiconductor Devices using a...
- Publication number 20140357088
- Publication date Dec 4, 2014
- FEI Company
- Chad Rue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Low Energy Ion Beam Etch
- Publication number 20130248356
- Publication date Sep 26, 2013
- Chad Rue
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
High Accuracy Beam Placement for Local Area Navigation
- Publication number 20120328151
- Publication date Dec 27, 2012
- FEI Company
- Reinier Louis Warschauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Navigation and Sample Processing Using an Ion Source Containing bot...
- Publication number 20120056088
- Publication date Mar 8, 2012
- FEI Company
- Chad Rue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH ACCURACY BEAM PLACEMENT FOR LOCAL AREA NAVIGATION
- Publication number 20120045097
- Publication date Feb 23, 2012
- FEI Company
- RICHARD J. YOUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam Processing System with Visual and Infrared Im...
- Publication number 20120006987
- Publication date Jan 12, 2012
- FEI Company
- Chad Rue
- G01 - MEASURING TESTING
Information Patent Application
HIGH ACCURACY BEAM PLACEMENT FOR LOCAL AREA NAVIGATION
- Publication number 20100092070
- Publication date Apr 15, 2010
- FEI Company
- RICHARD J. YOUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IN-SITU HIGH-RESOLUTION LIGHT-OPTICAL CHANNEL FOR OPTICAL VIEWING A...
- Publication number 20080283777
- Publication date Nov 20, 2008
- International Business Machines Corporation
- Steven B. Herschbein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-RESOLUTION OPTICAL CHANNEL FOR NON-DESTRUCTIVE NAVIGATION AND...
- Publication number 20080067369
- Publication date Mar 20, 2008
- International Business Machines Corporation
- Herschel M. Marchman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVED ION DETECTOR FOR IONBEAM APPLICATIONS
- Publication number 20060097159
- Publication date May 11, 2006
- International Business Machines Corporation
- Steven B. Herschbein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR MANIPULATING SAMPLE TEMPERATURE FOR FOCUSE...
- Publication number 20060065853
- Publication date Mar 30, 2006
- Chad Rue
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Method of material deposition

Method, device and system for the treatment of biological cryogenic...

Method of producing microrods for electron emitters, and associated...

Method of material deposition

Face-on, gas-assisted etching for plan-view lamellae preparation

Method and apparatus for the planarization of surfaces

Face-on, gas-assisted etching for plan-view lamellae preparation

Enhanced charged particle beam processes for carbon removal

Ion implantation to alter etch rate

Tomography sample preparation systems and methods with improved spe...

Material characterization using ion channeling imaging

Method of material deposition

Gas injection system with precursor for planar deprocessing of semi...

Low energy ion beam etch

High accuracy beam placement for local area navigation

Precursor for planar deprocessing of semiconductor devices using a...

High accuracy beam placement for local area navigation

Charged particle beam processing system with visual and infrared im...

Navigation and sample processing using an ion source containing bot...

High accuracy beam placement for local area navigation

High accuracy beam placement for local area navigation

In-situ high-resolution light-optical channel for optical viewing a...

High-resolution optical channel for non-destructive navigation and...

Ion detector for ion beam applications

Sample mount for performing sputter-deposition in a focused ion bea...

Dry etch process to edit copper lines

Metal dry etch using electronic field

Patents Applicationslast 30 patents

CRENELLATED SAMPLE HOLDER AND SPUTTER TARGET FOR SAMPLE PREPARATION...

CONDENSATE PRECURSORS AND CONTAMINANT PURGE APPARATUS AND METHODS

METHODS AND SYSTEMS FOR ELEMENTAL MAPPING

METHOD OF MATERIAL DEPOSITION

METHOD FOR LARGE-AREA 3D ANALYSIS OF SAMPLES USING GLANCING INCIDEN...

METHOD, DEVICE AND SYSTEM FOR THE TREATMENT OF BIOLOGICAL CRYOGENIC...

FACE-ON, GAS-ASSISTED ETCHING FOR PLAN-VIEW LAMELLAE PREPARATION

Method and Apparatus for the Planarization of Surfaces

METHOD, DEVICE AND SYSTEM FOR THE TREATMENT OF BIOLOGICAL CRYOGENIC...

FACE-ON, GAS-ASSISTED ETCHING FOR PLAN-VIEW LAMELLAE PREPARATION

METHOD OF MATERIAL DEPOSITION

ENHANCED CHARGED PARTICLE BEAM PROCESSES FOR CARBON REMOVAL

TOMOGRAPHY SAMPLE PREPARATION SYSTEMS AND METHODS WITH IMPROVED SPE...

MATERIAL CHARACTERIZATION USING ION CHANNELING IMAGING

METHOD OF MATERIAL DEPOSITION

ADAPTIVE CONTROL FOR CHARGED PARTICLE BEAM PROCESSING

Ion Implantation to Alter Etch Rate

GAS INJECTION SYSTEM WITH PRECURSOR FOR PLANAR DEPROCESSING OF SEMI...

HIGH ACCURACY BEAM PLACEMENT FOR LOCAL AREA NAVIGATION

Precursor for Planar Deprocessing of Semiconductor Devices using a...

Low Energy Ion Beam Etch

High Accuracy Beam Placement for Local Area Navigation

Navigation and Sample Processing Using an Ion Source Containing bot...

HIGH ACCURACY BEAM PLACEMENT FOR LOCAL AREA NAVIGATION

Charged Particle Beam Processing System with Visual and Infrared Im...

HIGH ACCURACY BEAM PLACEMENT FOR LOCAL AREA NAVIGATION

IN-SITU HIGH-RESOLUTION LIGHT-OPTICAL CHANNEL FOR OPTICAL VIEWING A...

HIGH-RESOLUTION OPTICAL CHANNEL FOR NON-DESTRUCTIVE NAVIGATION AND...

IMPROVED ION DETECTOR FOR IONBEAM APPLICATIONS

APPARATUS AND METHOD FOR MANIPULATING SAMPLE TEMPERATURE FOR FOCUSE...