Chad S. Dawson

Person

Tempe, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Stress isolated device package and method of manufacture
- Patent number 12,012,328
- Issue date Jun 18, 2024
- NXP USA, INC.
- Chad Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Pressure sensor device and method for testing the pressure sensor d...
- Patent number 10,436,659
- Issue date Oct 8, 2019
- NXP USA, INC.
- Chad Dawson
- G01 - MEASURING TESTING
Information Patent Grant
Accelerometer calibration in a rotating member
- Patent number 10,295,559
- Issue date May 21, 2019
- NXP USA, INC.
- Chad S. Dawson
- G01 - MEASURING TESTING
Information Patent Grant
Sensor device and method for continuous fault monitoring of sensor...
- Patent number 9,983,032
- Issue date May 29, 2018
- NXP USA, INC.
- Keith L. Kraver
- G01 - MEASURING TESTING
Information Patent Grant
Microelectromechanical system devices having crack resistant membra...
- Patent number 9,926,187
- Issue date Mar 27, 2018
- NXP USA, INC.
- Chad S Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Multi-chip device with temperature control element for temperature...
- Patent number 9,927,266
- Issue date Mar 27, 2018
- NXP USA, INC.
- Chad S. Dawson
- G01 - MEASURING TESTING
Information Patent Grant
Differential capacitive output pressure sensor and method
- Patent number 9,829,406
- Issue date Nov 28, 2017
- NXP USA, INC.
- Aaron A Geisberger
- G01 - MEASURING TESTING
Information Patent Grant
Devices and methods for testing integrated circuit devices
- Patent number 9,818,656
- Issue date Nov 14, 2017
- NXP USA, INC.
- Mark Edward Schlarmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MEMS sensor with side port and method of fabricating same
- Patent number 9,790,089
- Issue date Oct 17, 2017
- NXP USA, INC.
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Self test for capacitive pressure sensors
- Patent number 9,791,340
- Issue date Oct 17, 2017
- NXP USA, INC.
- Dubravka Bilic
- G01 - MEASURING TESTING
Information Patent Grant
Actively preventing charge induced leakage of semiconductor devices
- Patent number 9,790,085
- Issue date Oct 17, 2017
- NXP USA, INC.
- Dubravka Bilic
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Electrically conductive barriers for integrated circuits
- Patent number 9,714,879
- Issue date Jul 25, 2017
- NXP USA, INC.
- Chad S. Dawson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stress isolated differential pressure sensor
- Patent number 9,663,350
- Issue date May 30, 2017
- NXP USA, INC.
- Stephen R. Hooper
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS device with over-travel stop structure and method of fabrication
- Patent number 9,638,712
- Issue date May 2, 2017
- NXP USA, INC.
- Jun Tang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Packaged sensor with integrated offset calibration
- Patent number 9,546,925
- Issue date Jan 17, 2017
- NXP USA, INC.
- Chad S. Dawson
- G01 - MEASURING TESTING
Information Patent Grant
Inhibiting propagation of surface cracks in a MEMS device
- Patent number 9,540,227
- Issue date Jan 10, 2017
- NXP USA, INC.
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Stress isolated detector element and microbolometer detector incorp...
- Patent number 9,528,881
- Issue date Dec 27, 2016
- NXP USA, INC.
- Chad Dawson
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensor having multiple pressure cells and sensitivity esti...
- Patent number 9,488,542
- Issue date Nov 8, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- G01 - MEASURING TESTING
Information Patent Grant
Method of making a MEMS die having a MEMS device on a suspended str...
- Patent number 9,458,008
- Issue date Oct 4, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Stress isolation for MEMS device
- Patent number 9,446,940
- Issue date Sep 20, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Sensor device and related operating methods
- Patent number 9,417,146
- Issue date Aug 16, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- G01 - MEASURING TESTING
Information Patent Grant
Shielding MEMS structures during wafer dicing
- Patent number 9,346,671
- Issue date May 24, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Alan J. Magnus
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Test structure and methodology for estimating sensitivity of pressu...
- Patent number 9,285,404
- Issue date Mar 15, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Tester and method for testing a strip of devices
- Patent number 9,285,422
- Issue date Mar 15, 2016
- Freescale Semiconductor Inc.
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Pressure sensor with built-in calibration capability
- Patent number 9,285,289
- Issue date Mar 15, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Pressure sensor having multiple pressure cells and sensitivity esti...
- Patent number 9,176,020
- Issue date Nov 3, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- G01 - MEASURING TESTING
Information Patent Grant
Method and system to compensate for temperature and pressure in pie...
- Patent number 9,157,826
- Issue date Oct 13, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Siddhartha Gopal Krishna
- G01 - MEASURING TESTING
Information Patent Grant
Inhibiting propagation of surface cracks in a MEMS Device
- Patent number 9,102,514
- Issue date Aug 11, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Systems and methods for detecting surface charge
- Patent number 8,922,227
- Issue date Dec 30, 2014
- Freescale Semiconductor Inc.
- Chad S. Dawson
- G01 - MEASURING TESTING
Information Patent Grant
Microelectromechanical system devices having crack resistant membra...
- Patent number 8,921,952
- Issue date Dec 30, 2014
- Freescale Semiconductor Inc.
- Chad S Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR READING PRESSURE OF A PRESSURE SENSOR AND METHOD THEREFOR
- Publication number 20240192072
- Publication date Jun 13, 2024
- NXP USA, Inc.
- Andrew C. McNeil
- B60 - VEHICLES IN GENERAL
Information Patent Application
STRESS ISOLATED DEVICE PACKAGE AND METHOD OF MANUFACTURE
- Publication number 20220348456
- Publication date Nov 3, 2022
- NXP USA, Inc.
- Chad Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MICROELECTROMECHANICAL SYSTEM DEVICES HAVING CRACK RESISTANT MEMBRA...
- Publication number 20170341926
- Publication date Nov 30, 2017
- Chad S Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PRESSURE SENSOR DEVICE AND METHOD FOR TESTING THE PRESSURE SENSOR D...
- Publication number 20170322098
- Publication date Nov 9, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Chad Dawson
- G01 - MEASURING TESTING
Information Patent Application
MEMS SENSOR WITH SIDE PORT AND METHOD OF FABRICATING SAME
- Publication number 20170174509
- Publication date Jun 22, 2017
- NXP USA, Inc.
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEMS SENSOR DEVICE HAVING INTEGRATED MULTIPLE STIMULUS SENSING
- Publication number 20170115322
- Publication date Apr 27, 2017
- FREESCALE SEMICONDUCTOR, INC.
- FENGYUAN LI
- G01 - MEASURING TESTING
Information Patent Application
MEMS SENSOR WITH SIDE PORT AND METHOD OF FABRICATING SAME
- Publication number 20170081179
- Publication date Mar 23, 2017
- FREESCALE SEMICONDUCTOR, INC.
- CHAD S. DAWSON
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
DIFFERENTIAL CAPACITIVE OUTPUT PRESSURE SENSOR AND METHOD
- Publication number 20170074738
- Publication date Mar 16, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Aaron A. GEISBERGER
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICALLY CONDUCTIVE BARRIERS FOR INTEGRATED CIRCUITS
- Publication number 20170052082
- Publication date Feb 23, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- G01 - MEASURING TESTING
Information Patent Application
SELF TEST FOR CAPACITIVE PRESSURE SENSORS
- Publication number 20170023427
- Publication date Jan 26, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Dubravka BILIC
- G01 - MEASURING TESTING
Information Patent Application
FABRICATION METHOD FOR SUSPENDED MEMS DEVICE
- Publication number 20160272482
- Publication date Sep 22, 2016
- FREESCALE SEMICONDUCTOR, INC.
- CHAD S. DAWSON
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEMS DEVICE WITH OVER-TRAVEL STOP STRUCTURE AND METHOD OF FABRICATION
- Publication number 20160216290
- Publication date Jul 28, 2016
- FREESCALE SEMICONDUCTOR, INC.
- JUN TANG
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
STRESS ISOLATED DIFFERENTIAL PRESSURE SENSOR
- Publication number 20160169758
- Publication date Jun 16, 2016
- FREESCALE SEMICONDUCTOR, INC.
- STEPHEN R. HOOPER
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PACKAGED SENSOR WITH INTEGRATED OFFSET CALIBRATION
- Publication number 20160161355
- Publication date Jun 9, 2016
- FREESCALE SEMICONDUCTOR, INC.
- CHAD S. DAWSON
- G01 - MEASURING TESTING
Information Patent Application
STRESS ISOLATED MEMS DEVICE WITH ASIC AS CAP
- Publication number 20160159642
- Publication date Jun 9, 2016
- FREESCALE SEMICONDUCTOR, INC.
- STEPHEN R. HOOPER
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
STRESS ISOLATION FOR MEMS DEVICE
- Publication number 20160096724
- Publication date Apr 7, 2016
- FREESCALE SEMICONDUCTOR, INC.
- CHAD S. DAWSON
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ACCELEROMETER CALIBRATION IN A ROTATING MEMBER
- Publication number 20160091529
- Publication date Mar 31, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE SENSOR HAVING MULTIPLE PRESSURE CELLS AND SENSITIVITY ESTI...
- Publication number 20150346046
- Publication date Dec 3, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- G01 - MEASURING TESTING
Information Patent Application
INHIBITING PROPAGATION OF SURFACE CRACKS IN A MEMS DEVICE
- Publication number 20150298964
- Publication date Oct 22, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SHIELDING MEMS STRUCTURES DURING WAFER DICING
- Publication number 20150217998
- Publication date Aug 6, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Alan J. Magnus
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PRESSURE SENSOR WITH BUILT-IN CALIBRATION CAPABILITY
- Publication number 20150160089
- Publication date Jun 11, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PRESSURE SENSOR HAVING MULTIPLE PRESSURE CELLS AND SENSITIVITY ESTI...
- Publication number 20150090052
- Publication date Apr 2, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- G01 - MEASURING TESTING
Information Patent Application
MICROELECTROMECHANICAL SYSTEM DEVICES HAVING CRACK RESISTANT MEMBRA...
- Publication number 20150059484
- Publication date Mar 5, 2015
- Chad S Dawson
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURE AND METHODOLOGY FOR ESTIMATING SENSITIVITY OF PRESSU...
- Publication number 20150048848
- Publication date Feb 19, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- G01 - MEASURING TESTING
Information Patent Application
MULTI-CHIP DEVICE WITH TEMPERATURE CONTROL ELEMENT FOR TEMPERATURE...
- Publication number 20140376586
- Publication date Dec 25, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- G01 - MEASURING TESTING
Information Patent Application
INHIBITING PROPAGATION OF SURFACE CRACKS IN A MEMS DEVICE
- Publication number 20140287547
- Publication date Sep 25, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PRESSURE LEVEL ADJUSTMENT IN A CAVITY OF A SEMICONDUCTOR DIE
- Publication number 20140225206
- Publication date Aug 14, 2014
- Yizhen Lin
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MICROELECTROMECHANICAL SYSTEM DEVICES HAVING CRACK RESISTANT MEMBRA...
- Publication number 20140210018
- Publication date Jul 31, 2014
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD AND SYSTEM TO COMPENSATE FOR TEMPERATURE AND PRESSURE IN PIE...
- Publication number 20140182353
- Publication date Jul 3, 2014
- Siddhartha Gopal Krishna
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE AND RELATED OPERATING METHODS
- Publication number 20130317772
- Publication date Nov 28, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- G01 - MEASURING TESTING

Chad S. Dawson

Person

Patents Grantslast 30 patents

Stress isolated device package and method of manufacture

Pressure sensor device and method for testing the pressure sensor d...

Accelerometer calibration in a rotating member

Sensor device and method for continuous fault monitoring of sensor...

Microelectromechanical system devices having crack resistant membra...

Multi-chip device with temperature control element for temperature...

Differential capacitive output pressure sensor and method

Devices and methods for testing integrated circuit devices

MEMS sensor with side port and method of fabricating same

Self test for capacitive pressure sensors

Actively preventing charge induced leakage of semiconductor devices

Electrically conductive barriers for integrated circuits

Stress isolated differential pressure sensor

MEMS device with over-travel stop structure and method of fabrication

Packaged sensor with integrated offset calibration

Inhibiting propagation of surface cracks in a MEMS device

Stress isolated detector element and microbolometer detector incorp...

Pressure sensor having multiple pressure cells and sensitivity esti...

Method of making a MEMS die having a MEMS device on a suspended str...

Stress isolation for MEMS device

Sensor device and related operating methods

Shielding MEMS structures during wafer dicing

Test structure and methodology for estimating sensitivity of pressu...

Tester and method for testing a strip of devices

Pressure sensor with built-in calibration capability

Pressure sensor having multiple pressure cells and sensitivity esti...

Method and system to compensate for temperature and pressure in pie...

Inhibiting propagation of surface cracks in a MEMS Device

Systems and methods for detecting surface charge

Microelectromechanical system devices having crack resistant membra...

Patents Applicationslast 30 patents

SYSTEM FOR READING PRESSURE OF A PRESSURE SENSOR AND METHOD THEREFOR

STRESS ISOLATED DEVICE PACKAGE AND METHOD OF MANUFACTURE

MICROELECTROMECHANICAL SYSTEM DEVICES HAVING CRACK RESISTANT MEMBRA...

PRESSURE SENSOR DEVICE AND METHOD FOR TESTING THE PRESSURE SENSOR D...

MEMS SENSOR WITH SIDE PORT AND METHOD OF FABRICATING SAME

MEMS SENSOR DEVICE HAVING INTEGRATED MULTIPLE STIMULUS SENSING

MEMS SENSOR WITH SIDE PORT AND METHOD OF FABRICATING SAME

DIFFERENTIAL CAPACITIVE OUTPUT PRESSURE SENSOR AND METHOD

ELECTRICALLY CONDUCTIVE BARRIERS FOR INTEGRATED CIRCUITS

SELF TEST FOR CAPACITIVE PRESSURE SENSORS

FABRICATION METHOD FOR SUSPENDED MEMS DEVICE

MEMS DEVICE WITH OVER-TRAVEL STOP STRUCTURE AND METHOD OF FABRICATION

STRESS ISOLATED DIFFERENTIAL PRESSURE SENSOR

PACKAGED SENSOR WITH INTEGRATED OFFSET CALIBRATION

STRESS ISOLATED MEMS DEVICE WITH ASIC AS CAP

STRESS ISOLATION FOR MEMS DEVICE

ACCELEROMETER CALIBRATION IN A ROTATING MEMBER

PRESSURE SENSOR HAVING MULTIPLE PRESSURE CELLS AND SENSITIVITY ESTI...

INHIBITING PROPAGATION OF SURFACE CRACKS IN A MEMS DEVICE

SHIELDING MEMS STRUCTURES DURING WAFER DICING

PRESSURE SENSOR WITH BUILT-IN CALIBRATION CAPABILITY

PRESSURE SENSOR HAVING MULTIPLE PRESSURE CELLS AND SENSITIVITY ESTI...

MICROELECTROMECHANICAL SYSTEM DEVICES HAVING CRACK RESISTANT MEMBRA...

TEST STRUCTURE AND METHODOLOGY FOR ESTIMATING SENSITIVITY OF PRESSU...

MULTI-CHIP DEVICE WITH TEMPERATURE CONTROL ELEMENT FOR TEMPERATURE...

INHIBITING PROPAGATION OF SURFACE CRACKS IN A MEMS DEVICE

PRESSURE LEVEL ADJUSTMENT IN A CAVITY OF A SEMICONDUCTOR DIE

MICROELECTROMECHANICAL SYSTEM DEVICES HAVING CRACK RESISTANT MEMBRA...

METHOD AND SYSTEM TO COMPENSATE FOR TEMPERATURE AND PRESSURE IN PIE...

SENSOR DEVICE AND RELATED OPERATING METHODS