Chao-Hsiung HWU

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Tainan City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Strip test method
- Patent number 7,388,396
- Issue date Jun 17, 2008
- Advanced Semiconductor Engineering Inc.
- Hsin-Chieh Lu
- G01 - MEASURING TESTING
Information Patent Grant
Method for retesting semiconductor device
- Patent number 7,109,740
- Issue date Sep 19, 2006
- Advanced Semiconductor Engineering, Inc.
- Chin-Chen Chuan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
STRIP TEST METHOD
- Publication number 20070152698
- Publication date Jul 5, 2007
- ADVANCED SEMICONDUCTOR ENGINEERING INC.
- Hsin-Chieh LU
- G01 - MEASURING TESTING
Information Patent Application
Method for retesting semiconductor device
- Publication number 20060022697
- Publication date Feb 2, 2006
- Advanced Semiconductor Engineering, Inc.
- Chin-Chen Chuan
- G01 - MEASURING TESTING