Charles Allen Brown

Person

Corvallis, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Self-testing input/output pad
- Patent number 6,963,212
- Issue date Nov 8, 2005
- Agilent Technologies, Inc.
- Charles Allen Brown
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit having memory built-in self test (BIST) for diff...
- Patent number 6,151,692
- Issue date Nov 21, 2000
- Agilent Technologies, Inc.
- Damir Smitlener
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for determining IDDQ
- Patent number 5,789,933
- Issue date Aug 4, 1998
- Hewlett-Packard Co.
- Charles Allen Brown
- G01 - MEASURING TESTING
Information Patent Grant
Multiple on-chip IDDQ monitors
- Patent number 5,757,203
- Issue date May 26, 1998
- Hewlett-Packard Company
- Charles Allen Brown
- G01 - MEASURING TESTING
Information Patent Grant
Precision reference current generator
- Patent number 5,291,123
- Issue date Mar 1, 1994
- Hewlett-Packard Company
- Charles A. Brown
- G05 - CONTROLLING REGULATING
Information Patent Grant
Light-emitting diode array current power supply including switched...
- Patent number 5,289,112
- Issue date Feb 22, 1994
- Hewlett-Packard Company
- Charles A. Brown
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Light emitting diode array current power supply
- Patent number 5,099,192
- Issue date Mar 24, 1992
- Hewlett-Packard Company
- Billy E. Thayer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Light emitting diode array current power supply
- Patent number 4,864,216
- Issue date Sep 5, 1989
- Hewlett-Packard Company
- Steven Kalata
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SELF-TESTING INPUT/OUTPUT PAD
- Publication number 20050212542
- Publication date Sep 29, 2005
- Charles Allen Brown
- G01 - MEASURING TESTING

Charles Allen Brown

Person

Patents Grantslast 30 patents

Self-testing input/output pad

Integrated circuit having memory built-in self test (BIST) for diff...

Method and apparatus for determining IDDQ

Multiple on-chip IDDQ monitors

Precision reference current generator

Light-emitting diode array current power supply including switched...

Light emitting diode array current power supply

Light emitting diode array current power supply

Patents Applicationslast 30 patents

SELF-TESTING INPUT/OUTPUT PAD