"A General Purpose IDDQ Measurement Circuit", by: Kenneth M. Wallquist, Alan W. Righter, and Charles F. Hawkins, Aug. 1993, IEEE, Paper 31.3, International Test Conference 1993, pp. 642-651. |
"Achieving IDDQ/ISSQ Production Testing With QuiC-Mon", by: Kenneth M. Wallquist -Philips Semiconductor, 1995, IEEE, IEEE Design & Test of Computers, pp. 62-69. Month unavailable. |
"A New Approach To Dynamic IDD Testing", by: Mike Keating, GerRAd Inc, & Dennis Meyer, Catec Inc., 1987, IEEE, 1987 International Test Conference, Paper 13.3, pp. 316-321, Feb. 1987. |
"HP83000 Digital IC Test System--F330 User Training, Model F330", by: Hewlett-Packard Company, Printed in the Federal Republic of Germany, Sep. 1994, Revision 0.95. |