CHARLES J. JOHNSTON

Person

WALNUT, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Spring contact assembly
- Patent number 8,523,579
- Issue date Sep 3, 2013
- Delaware Capital Formation, Inc.
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Grant
Spring contact assembly
- Patent number 8,231,416
- Issue date Jul 31, 2012
- Delaware Capital Formation, Inc.
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Grant
Flat plunger round barrel test probe
- Patent number 8,105,119
- Issue date Jan 31, 2012
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Spring contact assembly
- Patent number 7,862,391
- Issue date Jan 4, 2011
- Delaware Capital Formation, Inc.
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Grant
Self-retained spring probe
- Patent number 6,462,567
- Issue date Oct 8, 2002
- Delaware Capital Formation, Inc.
- Gordon A. Vinther
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial tilt pin fixture for testing high frequency circuit boards
- Patent number 6,414,504
- Issue date Jul 2, 2002
- Delaware Capital Formation, Inc.
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Grant
Self-closing spring probe
- Patent number 6,396,293
- Issue date May 28, 2002
- Delaware Capital Formation, Inc.
- Gordon A. Vinther
- G01 - MEASURING TESTING
Information Patent Grant
Biased BGA contactor probe tip
- Patent number 6,271,672
- Issue date Aug 7, 2001
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Test socket
- Patent number 6,204,680
- Issue date Mar 20, 2001
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Test socket
- Patent number 6,084,421
- Issue date Jul 4, 2000
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Solid spring electrical contacts for electrical connectors and probes
- Patent number 5,865,641
- Issue date Feb 2, 1999
- Delaware Capital Formation
- Mark A. Swart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test probe plunger tip
- Patent number D400811
- Issue date Nov 10, 1998
- Delaware Capital Formation, Inc.
- Mark A. Swart
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Hollow plunger test probe
- Patent number 5,781,023
- Issue date Jul 14, 1998
- Delware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial test probe with quadrature ground provision
- Patent number D395016
- Issue date Jun 9, 1998
- Everett Charles Technologies, Inc.
- Robert R. Kornowski
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
One-piece compliant probe
- Patent number 5,667,410
- Issue date Sep 16, 1997
- Everett Charles Technologies, Inc.
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Grant
ESD protection for universal grid type test fixtures
- Patent number 5,663,655
- Issue date Sep 2, 1997
- Everett Charles Technologies, Inc.
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum test fixture for printed circuit boards
- Patent number 5,557,211
- Issue date Sep 17, 1996
- Everett Charles Technologies, Inc.
- Mary E. Ferrer
- G01 - MEASURING TESTING
Information Patent Grant
Test module hanger for test fixtures
- Patent number 5,444,387
- Issue date Aug 22, 1995
- Everett Charles Technologies, Inc.
- David R. Van Loan
- G01 - MEASURING TESTING
Information Patent Grant
Test fixture with adjustable bearings and optical alignment system
- Patent number 5,422,575
- Issue date Jun 6, 1995
- Everett Charles Technologies, Inc.
- Mary E. Ferrer
- G01 - MEASURING TESTING
Information Patent Grant
Test fixture alignment system for printed circuit boards
- Patent number 5,408,189
- Issue date Apr 18, 1995
- Everett Charles Technologies, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Twisting electrical test probe with controlled pointing accuracy
- Patent number 5,391,995
- Issue date Feb 21, 1995
- Everett Charles Technologies, Inc.
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Grant
Test fixture alignment system
- Patent number 5,321,351
- Issue date Jun 14, 1994
- Everett Charles Technologies, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Test fixture
- Patent number 5,300,881
- Issue date Apr 5, 1994
- Everett Charles Technologies, Inc.
- Mary E. Ferrer
- G01 - MEASURING TESTING
Information Patent Grant
Testing of integrated circuit devices on loaded printed circuit
- Patent number 5,289,117
- Issue date Feb 22, 1994
- Everett Charles Technologies, Inc.
- David R. Van Loan
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial test probe
- Patent number D343802
- Issue date Feb 1, 1994
- Everett Charles Technologies, Inc.
- Robert R. Kornowski
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Dual side access test fixture
- Patent number 5,270,641
- Issue date Dec 14, 1993
- Everett Charles Technologies, Inc.
- David R. Van Loan
- G01 - MEASURING TESTING
Information Patent Grant
Testing of integrated circuit devices on loaded printed circuit boards
- Patent number 5,247,246
- Issue date Sep 21, 1993
- Everett Charles Technologies, Inc.
- David R. Van Loan
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit carrier having built-in circuit verification
- Patent number 5,180,976
- Issue date Jan 19, 1993
- Everett/Charles Contact Products, Inc.
- David R. Van Loan
- G01 - MEASURING TESTING
Information Patent Grant
Optical fiber test probe having a sleeve-like plunger movable in a...
- Patent number 5,134,280
- Issue date Jul 28, 1992
- Everett/Charles Contact Products, Inc.
- Charles J. Johnston
- G02 - OPTICS
Information Patent Grant
Testing of integrated circuit devices on loaded printed circuit boards
- Patent number 5,049,813
- Issue date Sep 17, 1991
- Everett/Charles Contact Products, Inc.
- David R. Van Loan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPRING CONTACT ASSEMBLY
- Publication number 20120282821
- Publication date Nov 8, 2012
- Delaware Capital Formation, Inc.
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Application
SPRING CONTACT ASSEMBLY
- Publication number 20110039457
- Publication date Feb 17, 2011
- Delaware Capital Formation, Inc.
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Application
FLAT PLUNGER ROUND BARREL TEST PROBE
- Publication number 20100197176
- Publication date Aug 5, 2010
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Application
SPRING CONTACT ASSEMBLY
- Publication number 20090075529
- Publication date Mar 19, 2009
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Application
COAXIAL TILT PIN FIXTURE FOR TESTING HIGH FREQUENCY CIRCUIT BOARDS
- Publication number 20010050571
- Publication date Dec 13, 2001
- CHARLES J. JOHNSTON
- G01 - MEASURING TESTING
Information Patent Application
Test socket
- Publication number 20010000947
- Publication date May 10, 2001
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING

CHARLES J. JOHNSTON

Person

Patents Grantslast 30 patents

Spring contact assembly

Spring contact assembly

Flat plunger round barrel test probe

Spring contact assembly

Self-retained spring probe

Coaxial tilt pin fixture for testing high frequency circuit boards

Self-closing spring probe

Biased BGA contactor probe tip

Test socket

Test socket

Solid spring electrical contacts for electrical connectors and probes

Test probe plunger tip

Hollow plunger test probe

Coaxial test probe with quadrature ground provision

One-piece compliant probe

ESD protection for universal grid type test fixtures

Vacuum test fixture for printed circuit boards

Test module hanger for test fixtures

Test fixture with adjustable bearings and optical alignment system

Test fixture alignment system for printed circuit boards

Twisting electrical test probe with controlled pointing accuracy

Test fixture alignment system

Test fixture

Testing of integrated circuit devices on loaded printed circuit

Coaxial test probe

Dual side access test fixture

Testing of integrated circuit devices on loaded printed circuit boards

Integrated circuit carrier having built-in circuit verification

Optical fiber test probe having a sleeve-like plunger movable in a...

Testing of integrated circuit devices on loaded printed circuit boards

Patents Applicationslast 30 patents

SPRING CONTACT ASSEMBLY

SPRING CONTACT ASSEMBLY

FLAT PLUNGER ROUND BARREL TEST PROBE

SPRING CONTACT ASSEMBLY

COAXIAL TILT PIN FIXTURE FOR TESTING HIGH FREQUENCY CIRCUIT BOARDS

Test socket