Charles N. Archie

Person

Granite Springs, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for planning metrology measurements
- Patent number 10,222,710
- Issue date Mar 5, 2019
- Nova Measuring Instruments Ltd.
- Matthew Sendelbach
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and systems involving measuring complex dimensions of silic...
- Patent number 8,855,401
- Issue date Oct 7, 2014
- International Business Machines Corporation
- Charles N. Archie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement tool monitoring using fleet measurement precision and t...
- Patent number 8,467,993
- Issue date Jun 18, 2013
- International Business Machines Corporation
- Charles Archie
- G05 - CONTROLLING REGULATING
Information Patent Grant
Optical measurement using fixed polarizer
- Patent number 7,791,723
- Issue date Sep 7, 2010
- International Business Machines Corporation
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring a photolithographic process using a scatterometry target
- Patent number 7,760,360
- Issue date Jul 20, 2010
- International Business Machines Corporation
- Charles N. Archie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metrology tool recipe validator using best known methods
- Patent number 7,716,009
- Issue date May 11, 2010
- International Business Machines Corporation
- Ejaj Ahmed
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Assessment and optimization for metrology instrument
- Patent number 7,688,456
- Issue date Mar 30, 2010
- International Business Machines Corporation
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system fleet optimization
- Patent number 7,571,070
- Issue date Aug 4, 2009
- International Business Machines Corporation
- Eric P. Solecky
- G01 - MEASURING TESTING
Information Patent Grant
Determining root cause of matching problem and/or fleet measurement...
- Patent number 7,532,999
- Issue date May 12, 2009
- International Business Machines Corporation
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Grant
Methodology for critical dimension metrology using stepper focus mo...
- Patent number 7,479,633
- Issue date Jan 20, 2009
- International Business Machines Corporation
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Grant
Determining fleet matching problem and root cause issue for measure...
- Patent number 7,467,063
- Issue date Dec 16, 2008
- International Business Machines Corporation
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Grant
Assessment and optimization for metrology instrument including unce...
- Patent number 7,453,583
- Issue date Nov 18, 2008
- International Business Machines Corporation
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Grant
Assessment and optimization for metrology instrument
- Patent number 7,352,478
- Issue date Apr 1, 2008
- International Business Machines Corporation
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system optimization
- Patent number 7,353,128
- Issue date Apr 1, 2008
- International Business Machines Corporation
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Grant
Determining fleet matching problem and root cause issue for measure...
- Patent number 7,340,374
- Issue date Mar 4, 2008
- International Business Machines Corporation
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Grant
Metrology tool recipe validator using best known methods
- Patent number 7,305,320
- Issue date Dec 4, 2007
- International Business Machines Corporation
- Ejaj Ahmed
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Assessment and optimization for metrology instrument including unce...
- Patent number 7,286,247
- Issue date Oct 23, 2007
- International Business Machines Corporation
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Grant
Fortified, compensated and uncompensated process-sensitive scattero...
- Patent number 7,265,850
- Issue date Sep 4, 2007
- International Business Machines Corporation
- Charles N. Archie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution cross-sectioning of polysilicon features with a dua...
- Patent number 7,094,616
- Issue date Aug 22, 2006
- International Business Machines Corporation
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for characterizing features at small dimensions
- Patent number 6,789,033
- Issue date Sep 7, 2004
- International Business Machines Corporation
- Eric P. Solecky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method to obtain transparent image of resist contact hole or featur...
- Patent number 6,683,305
- Issue date Jan 27, 2004
- International Business Machines Corporation
- Wei Lu
- G01 - MEASURING TESTING
Information Patent Grant
Automated method for determining several critical dimension propert...
- Patent number 6,472,662
- Issue date Oct 29, 2002
- International Business Machines Corporation
- Charles Neill Archie
- G01 - MEASURING TESTING
Information Patent Grant
Method characterizing a feature using measurement imaging tool
- Patent number 6,185,323
- Issue date Feb 6, 2001
- International Business Machines Corporation
- Charles N. Archie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for astigmatism correction in charged particle beam systems
- Patent number 6,025,600
- Issue date Feb 15, 2000
- International Business Machines Corporation
- Charles N. Archie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for critical dimension and tool resolution det...
- Patent number 5,969,273
- Issue date Oct 19, 1999
- International Business Machines Corporation
- Charles N. Archie
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR PLANNING METROLOGY MEASUREMENTS
- Publication number 20160363872
- Publication date Dec 15, 2016
- NOVA MEASURING INSTRUMENTS LTD.
- Matthew SENDELBACH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Systems Involving Measuring Complex Dimensions of Silic...
- Publication number 20120106824
- Publication date May 3, 2012
- International Business Machines Corporation
- Charles N. Archie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Measurement Tool Monitoring Using Fleet Measurement Precision and T...
- Publication number 20110172958
- Publication date Jul 14, 2011
- International Business Machines Corporation
- Charles Archie
- G05 - CONTROLLING REGULATING
Information Patent Application
OPTICAL MEASUREMENT USING FIXED POLARIZER
- Publication number 20090185168
- Publication date Jul 23, 2009
- International Business Machines Corporation
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Application
Monitoring a photolithographic process using a scatterometry target
- Publication number 20080158564
- Publication date Jul 3, 2008
- Charles N. Archie
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ASSESSMENT AND OPTIMIZATION FOR METROLOGY INSTRUMENT INCLUDING UNCE...
- Publication number 20080151268
- Publication date Jun 26, 2008
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Application
ASSESSMENT AND OPTIMIZATION FOR METROLOGY INSTRUMENT
- Publication number 20080140342
- Publication date Jun 12, 2008
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM FLEET OPTIMIZATION
- Publication number 20080114566
- Publication date May 15, 2008
- International Business Machines Corporation
- Eric P. Solecky
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY TOOL RECIPE VALIDATOR USING BEST KNOWN METHODS
- Publication number 20080065696
- Publication date Mar 13, 2008
- International Business Machines Corporation
- Ejaj Ahmed
- G05 - CONTROLLING REGULATING
Information Patent Application
DETERMINING FLEET MATCHING PROBLEM AND ROOT CAUSE ISSUE FOR MEASURE...
- Publication number 20080033692
- Publication date Feb 7, 2008
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY TOOL RECIPE VALIDATOR USING BEST KNOWN METHODS
- Publication number 20070192056
- Publication date Aug 16, 2007
- International Business Machines Corporation
- Ejaj Ahmed
- G05 - CONTROLLING REGULATING
Information Patent Application
MEASUREMENT SYSTEM OPTIMIZATION
- Publication number 20070192049
- Publication date Aug 16, 2007
- International Business Machines Corporation
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Application
Determining root cause of matching problem and/or fleet measurement...
- Publication number 20060195295
- Publication date Aug 31, 2006
- International Business Machines Corporation
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Application
Determining fleet matching problem and root cause issue for measure...
- Publication number 20060195294
- Publication date Aug 31, 2006
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Application
Assessment and optimization for metrology instrument
- Publication number 20050222804
- Publication date Oct 6, 2005
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION CROSS-SECTIONING OF POLYSILICON FEATURES WITH A DUA...
- Publication number 20050196880
- Publication date Sep 8, 2005
- International Business Machines Corporation
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Application
Assessment and optimization for metrology instrument including unce...
- Publication number 20050197772
- Publication date Sep 8, 2005
- Charles N. Archie
- G01 - MEASURING TESTING
Information Patent Application
FORTIFIED, COMPENSATED AND UNCOMPENSATED PROCESS-SENSITIVE SCATTERO...
- Publication number 20050089775
- Publication date Apr 28, 2005
- International Business Machines Corporation
- Charles N. Archie
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Apparatus and method for characterizing features at small dimensions
- Publication number 20030101013
- Publication date May 29, 2003
- International Business Machines Corporation
- Eric P. Solecky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methodology for critical dimension metrology using stepper focus mo...
- Publication number 20030010912
- Publication date Jan 16, 2003
- International Business Machines Corporation
- Charles N. Archie
- G01 - MEASURING TESTING

Charles N. Archie

Person

Patents Grantslast 30 patents

Method and system for planning metrology measurements

Methods and systems involving measuring complex dimensions of silic...

Measurement tool monitoring using fleet measurement precision and t...

Optical measurement using fixed polarizer

Monitoring a photolithographic process using a scatterometry target

Metrology tool recipe validator using best known methods

Assessment and optimization for metrology instrument

Measurement system fleet optimization

Determining root cause of matching problem and/or fleet measurement...

Methodology for critical dimension metrology using stepper focus mo...

Determining fleet matching problem and root cause issue for measure...

Assessment and optimization for metrology instrument including unce...

Assessment and optimization for metrology instrument

Measurement system optimization

Determining fleet matching problem and root cause issue for measure...

Metrology tool recipe validator using best known methods

Assessment and optimization for metrology instrument including unce...

Fortified, compensated and uncompensated process-sensitive scattero...

High resolution cross-sectioning of polysilicon features with a dua...

Apparatus and method for characterizing features at small dimensions

Method to obtain transparent image of resist contact hole or featur...

Automated method for determining several critical dimension propert...

Method characterizing a feature using measurement imaging tool

Method for astigmatism correction in charged particle beam systems

Method and apparatus for critical dimension and tool resolution det...

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR PLANNING METROLOGY MEASUREMENTS

Methods and Systems Involving Measuring Complex Dimensions of Silic...

Measurement Tool Monitoring Using Fleet Measurement Precision and T...

OPTICAL MEASUREMENT USING FIXED POLARIZER

Monitoring a photolithographic process using a scatterometry target

ASSESSMENT AND OPTIMIZATION FOR METROLOGY INSTRUMENT INCLUDING UNCE...

ASSESSMENT AND OPTIMIZATION FOR METROLOGY INSTRUMENT

MEASUREMENT SYSTEM FLEET OPTIMIZATION

METROLOGY TOOL RECIPE VALIDATOR USING BEST KNOWN METHODS

DETERMINING FLEET MATCHING PROBLEM AND ROOT CAUSE ISSUE FOR MEASURE...

METROLOGY TOOL RECIPE VALIDATOR USING BEST KNOWN METHODS

MEASUREMENT SYSTEM OPTIMIZATION

Determining root cause of matching problem and/or fleet measurement...

Determining fleet matching problem and root cause issue for measure...

Assessment and optimization for metrology instrument

HIGH RESOLUTION CROSS-SECTIONING OF POLYSILICON FEATURES WITH A DUA...

Assessment and optimization for metrology instrument including unce...

FORTIFIED, COMPENSATED AND UNCOMPENSATED PROCESS-SENSITIVE SCATTERO...

Apparatus and method for characterizing features at small dimensions

Methodology for critical dimension metrology using stepper focus mo...