Cheolhong Kim

Person

Yongin-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor memory device
- Patent number 9,935,108
- Issue date Apr 3, 2018
- Samsung Electronics Co., Ltd.
- Chul-Ho Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of revising overlay correction data
- Patent number 9,679,821
- Issue date Jun 13, 2017
- Samsung Electronics Co., Ltd.
- Woojin Jung
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Web thickness measuring equipment and method of measuring thickness...
- Patent number 9,115,979
- Issue date Aug 25, 2015
- Samsung SDI Co., Ltd.
- Pilgoo Jun
- G01 - MEASURING TESTING
Information Patent Grant
Methods of forming a semiconductor device
- Patent number 9,034,765
- Issue date May 19, 2015
- Samsung Electronics Co., Ltd.
- Joonsoo Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for forming fine patterns of a semiconductor device
- Patent number 8,785,319
- Issue date Jul 22, 2014
- Samsung Electronics Co., Ltd.
- Joon-Soo Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for forming fine patterns of a semiconductor device
- Patent number 8,614,148
- Issue date Dec 24, 2013
- Samsung Electronics Co., Ltd.
- Joon-Soo Park
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20170194326
- Publication date Jul 6, 2017
- CHUL-HO KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF REVISING OVERLAY CORRECTION DATA
- Publication number 20160351455
- Publication date Dec 1, 2016
- Samsung Electronics Co., Ltd.
- Woojin Jung
- G01 - MEASURING TESTING
Information Patent Application
PATTERNING METHOD FOR FORMING STAIRCASE STRUCTURE AND METHOD FOR FA...
- Publication number 20140329379
- Publication date Nov 6, 2014
- Samsung Electronics Co., Ltd.
- Chul-Ho Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING A SEMICONDUCTOR DEVICE
- Publication number 20140057440
- Publication date Feb 27, 2014
- Samsung Electronics Co., Ltd.
- Joonsoo PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WEB THICKNESS MEASURING EQUIPMENT AND METHOD
- Publication number 20140028999
- Publication date Jan 30, 2014
- Samsung SDI Co., Ltd.
- Pilgoo Jun
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR FORMING FINE PATTERNS OF A SEMICONDUCTOR DEVICE
- Publication number 20130260559
- Publication date Oct 3, 2013
- Samsung Electronics Co., Ltd.
- Joon-Soo PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR FORMING FINE PATTERNS OF A SEMICONDUCTOR DEVICE
- Publication number 20130260562
- Publication date Oct 3, 2013
- Samsung Electronics Co., Ltd.
- Joon-Soo PARK
- H01 - BASIC ELECTRIC ELEMENTS

Cheolhong Kim

Person

Patents Grantslast 30 patents

Semiconductor memory device

Methods of revising overlay correction data

Web thickness measuring equipment and method of measuring thickness...

Methods of forming a semiconductor device

Methods for forming fine patterns of a semiconductor device

Methods for forming fine patterns of a semiconductor device

Patents Applicationslast 30 patents

SEMICONDUCTOR MEMORY DEVICE

METHODS OF REVISING OVERLAY CORRECTION DATA

PATTERNING METHOD FOR FORMING STAIRCASE STRUCTURE AND METHOD FOR FA...

METHODS OF FORMING A SEMICONDUCTOR DEVICE

WEB THICKNESS MEASURING EQUIPMENT AND METHOD

METHODS FOR FORMING FINE PATTERNS OF A SEMICONDUCTOR DEVICE

METHODS FOR FORMING FINE PATTERNS OF A SEMICONDUCTOR DEVICE