Membership
Tour
Register
Log in
Cher Khng Victor Tan
Follow
Person
Singapore, SG
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method for packaging microelectronic devices
Patent number
7,754,531
Issue date
Jul 13, 2010
Micron Technology, Inc.
Wuu Yean Tay
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods of forming semiconductor assemblies
Patent number
7,569,473
Issue date
Aug 4, 2009
Micron Technology, Inc.
Teck Kheng Lee
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Methods for designing carrier substrates with raised terminals
Patent number
7,368,391
Issue date
May 6, 2008
Micron Technology, Inc.
Cher Khng Victor Tan
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Semiconductor die packages with recessed interconnecting structures
Patent number
7,230,330
Issue date
Jun 12, 2007
Micron Technology, Inc.
Teck Kheng Lee
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method and apparatus for detecting topographical features of microe...
Patent number
7,213,447
Issue date
May 8, 2007
Micron Technology, Inc.
Chee Peng Neo
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor die packages with recessed interconnecting structures...
Patent number
7,112,520
Issue date
Sep 26, 2006
Micron Technology, Inc.
Teck Kheng Lee
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Solder masks including dams for at least partially surrounding term...
Patent number
7,061,124
Issue date
Jun 13, 2006
Micron Technology, Inc.
Cher Khng Victor Tan
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Solder masks for use on carrier substrates, carrier substrates and...
Patent number
7,018,871
Issue date
Mar 28, 2006
Micron Technology, Inc.
Cher Khng Victor Tan
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method and apparatus for detecting topographical features of microe...
Patent number
6,923,045
Issue date
Aug 2, 2005
Micron Technology, Inc.
Chee Peng Neo
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method and apparatus for detecting topographical features of microe...
Publication number
20050229684
Publication date
Oct 20, 2005
Micron Technology, Inc.
Chee Peng Neo
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for detecting topographical features of microe...
Publication number
20030041656
Publication date
Mar 6, 2003
Chee Peng Neo
G01 - MEASURING TESTING