Chih-Huei Wu

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit stack with strengthened wafer bonding
- Patent number 9,343,499
- Issue date May 17, 2016
- OmniVision Technologies, Inc.
- Hsin-Neng Tai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for testing image sensor wafers to identify pi...
- Patent number 8,000,520
- Issue date Aug 16, 2011
- OmniVision Technologies, Inc.
- Chia-Lun Chang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Active pixel having reduced dark current in a CMOS image sensor
- Patent number 7,368,772
- Issue date May 6, 2008
- OmniVision Technologies, Inc.
- Xinping He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active pixel having reduced dark current in a CMOS image sensor
- Patent number 7,105,878
- Issue date Sep 12, 2006
- OmniVision Technologies, Inc.
- Xinping He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sacrificial protective layer for image sensors and method of using
- Patent number 7,091,058
- Issue date Aug 15, 2006
- OmniVision Technologies, Inc.
- Chih-huei Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface passivation to reduce dark current in a CMOS image sensor
- Patent number 6,909,162
- Issue date Jun 21, 2005
- OmniVision Technologies, Inc.
- Chih-huei Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active pixel having reduced dark current in a CMOS image sensor
- Patent number 6,649,950
- Issue date Nov 18, 2003
- OmniVision Technologies, Inc.
- Xinping He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active pixel having reduced dark current in a CMOS image sensor
- Patent number 6,462,365
- Issue date Oct 8, 2002
- OmniVision Technologies, Inc.
- Xinping He
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR TESTING IMAGE SENSOR WAFERS TO IDENTIFY PI...
- Publication number 20090135414
- Publication date May 28, 2009
- OmniVision Technologies, Inc.
- Chia-Lun CHANG
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Sacrificial protective layer for image sensors and method of using
- Publication number 20050130337
- Publication date Jun 16, 2005
- Chih-Huei Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Active pixel having reduced dark current in a CMOS image sensor
- Publication number 20050062085
- Publication date Mar 24, 2005
- Xinping He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Active pixel having reduced dark current in a CMOS image sensor
- Publication number 20040026724
- Publication date Feb 12, 2004
- Xinping He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Active pixel having reduced dark current in a CMOS image sensor
- Publication number 20030085400
- Publication date May 8, 2003
- OMNIVISION TECHNOLOGIES, INC.
- Xinping He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Surface passivation to reduce dark current in a CMOS image sensor
- Publication number 20030086011
- Publication date May 8, 2003
- Chih-huei Wu
- H01 - BASIC ELECTRIC ELEMENTS

Chih-Huei Wu

Person

Patents Grantslast 30 patents

Integrated circuit stack with strengthened wafer bonding

Apparatus and method for testing image sensor wafers to identify pi...

Active pixel having reduced dark current in a CMOS image sensor

Active pixel having reduced dark current in a CMOS image sensor

Sacrificial protective layer for image sensors and method of using

Surface passivation to reduce dark current in a CMOS image sensor

Active pixel having reduced dark current in a CMOS image sensor

Active pixel having reduced dark current in a CMOS image sensor

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR TESTING IMAGE SENSOR WAFERS TO IDENTIFY PI...

Sacrificial protective layer for image sensors and method of using

Active pixel having reduced dark current in a CMOS image sensor

Active pixel having reduced dark current in a CMOS image sensor

Active pixel having reduced dark current in a CMOS image sensor

Surface passivation to reduce dark current in a CMOS image sensor