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Chikuang Charles Wang
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Deposition methods for uniform and conformal hybrid titanium oxide...
Patent number
9,881,787
Issue date
Jan 30, 2018
Applied Materials, Inc.
Chien-Teh Kao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Measurement system with thickness calculation and method of operati...
Patent number
8,569,692
Issue date
Oct 29, 2013
Applied Materials, Inc.
Biao Liu
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Non-destructive ambient dynamic mode AFM amplitude versus distance...
Patent number
7,963,153
Issue date
Jun 21, 2011
Applied Materials, Inc.
Chikuang Charles Wang
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method for fabricating an integrated gate dielectric layer for fiel...
Patent number
7,601,648
Issue date
Oct 13, 2009
Applied Materials, Inc.
Thai Cheng Chua
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Atomic force microscope technique for minimal tip damage
Patent number
7,509,844
Issue date
Mar 31, 2009
Applied Materials, Inc.
Chikuang C. Wang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS OF LOW TEMPERATURE PLASMA ENHANCED CHEMICAL VA...
Publication number
20220254641
Publication date
Aug 11, 2022
Applied Materials, Inc.
Thai Cheng Chua
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Deposition Methods For Uniform And Conformal Hybrid Titanium Oxide...
Publication number
20160372324
Publication date
Dec 22, 2016
Applied Materials, Inc.
Chien-Teh Kao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STATIC DEPOSITION PROFILE MODULATION FOR LINEAR PLASMA SOURCE
Publication number
20130273262
Publication date
Oct 17, 2013
Applied Materials, Inc.
Manoj Vellaikal
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
NON-DESTRUCTIVE AMBIENT DYNAMIC MODE AFM AMPLITUDE VERSUS DISTANCE...
Publication number
20090139315
Publication date
Jun 4, 2009
Chikuang Charles Wang
G01 - MEASURING TESTING
Information
Patent Application
Method for fabricating an integrated gate dielectric layer for fiel...
Publication number
20080026553
Publication date
Jan 31, 2008
Thai Cheng Chua
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for fabricating a gate dielectric layer utilized in a gate s...
Publication number
20080014759
Publication date
Jan 17, 2008
APPLIED MATERIALS, INC.
Thai Cheng Chua
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ATOMIC FORCE MICROSCOPE TECHNIQUE FOR MINIMAL TIP DAMAGE
Publication number
20070277599
Publication date
Dec 6, 2007
CHIKUANG C. WANG
G01 - MEASURING TESTING