Chin-Yi OU YANG

Person

Tao-Yuan, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Temperature control and method for devices under test and image sen...
- Patent number 11,932,498
- Issue date Mar 19, 2024
- CHROMA ATE INC.
- Chin-Yi Ouyang
- G01 - MEASURING TESTING
Information Patent Grant
Chip transfer device capable of floatingly positioning a chip and m...
- Patent number 11,901,213
- Issue date Feb 13, 2024
- CHROMA ATE INC.
- Chien-Ming Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multistory electronic device testing apparatus
- Patent number 11,740,283
- Issue date Aug 29, 2023
- CHROMA ATE INC.
- Chin-Yi Ouyang
- G01 - MEASURING TESTING
Information Patent Grant
Sliding test device for electronic components
- Patent number 11,333,704
- Issue date May 17, 2022
- CHROMA ATE INC.
- Chin-Yi Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Locking mechanism for a press head and electronic device testing ap...
- Patent number 11,169,178
- Issue date Nov 9, 2021
- CHROMA ATE INC.
- Chin-Yi Ouyang
- G01 - MEASURING TESTING
Information Patent Grant
Radiator module system for automatic test equipment
- Patent number 9,658,283
- Issue date May 23, 2017
- CHROMA ATE INC.
- Xin-Yi Wu
- G01 - MEASURING TESTING
Information Patent Grant
Test system with rotational test arms for testing semiconductor com...
- Patent number 9,638,740
- Issue date May 2, 2017
- CHROMA ATE INC.
- Chien-Ming Chen
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus with dry environment
- Patent number 9,470,749
- Issue date Oct 18, 2016
- Chroma Ate Inc.
- Xin-Yi Wu
- G01 - MEASURING TESTING
Information Patent Grant
Radiator module system for automatic test equipment
- Patent number 9,121,898
- Issue date Sep 1, 2015
- CHROMA ATE INC.
- Xin-Yi Wu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...
- Publication number 20240151746
- Publication date May 9, 2024
- CHROMA ATE INC.
- I-Shih TSENG
- G01 - MEASURING TESTING
Information Patent Application
POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...
- Publication number 20240142492
- Publication date May 2, 2024
- CHROMA ATE INC.
- I-Shih TSENG
- G01 - MEASURING TESTING
Information Patent Application
Liquid cooling system, liquid cooling method and electronic device-...
- Publication number 20230400478
- Publication date Dec 14, 2023
- CHROMA ATE INC.
- I-Shih TSENG
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE CONTROL SYSTEM AND METHOD FOR ELECTRONIC DEVICE-TESTING...
- Publication number 20230400506
- Publication date Dec 14, 2023
- CHROMA ATE INC.
- Chin-Yi OUYANG
- G01 - MEASURING TESTING
Information Patent Application
AGING TEST SYSTEM AND AGING TEST METHOD FOR THERMAL INTERFACE MATER...
- Publication number 20230375615
- Publication date Nov 23, 2023
- CHROMA ATE INC.
- I-Shih TSENG
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for testing a package-on-package semiconductor...
- Publication number 20230349968
- Publication date Nov 2, 2023
- CHROMA ATE INC.
- Chin-Yi OUYANG
- G01 - MEASURING TESTING
Information Patent Application
Temperature control system, temperature control method and image se...
- Publication number 20230098042
- Publication date Mar 30, 2023
- CHROMA ATE INC.
- Chin-Yi OUYANG
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE TESTING APPARATUS AND ELECTRONIC DEVICE TESTING M...
- Publication number 20230086266
- Publication date Mar 23, 2023
- CHROMA ATE INC.
- Chin-Yi OUYANG
- G01 - MEASURING TESTING
Information Patent Application
Multistory Electronic Device Testing Apparatus
- Publication number 20230022501
- Publication date Jan 26, 2023
- CHROMA ATE INC.
- Chin-Yi OUYANG
- G01 - MEASURING TESTING
Information Patent Application
POSITION CALIBRATION SYSTEM AND METHOD
- Publication number 20230023844
- Publication date Jan 26, 2023
- CHROMA ATE INC.
- Chin-Yi Ouyang
- G01 - MEASURING TESTING
Information Patent Application
CHIP TRANSFER DEVICE CAPABLE OF FLOATINGLY POSITIONING A CHIP AND M...
- Publication number 20220157639
- Publication date May 19, 2022
- CHROMA ATE INC.
- CHIEN-MING CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOCKING MECHANISM FOR A PRESS HEAD AND ELECTRONIC DEVICE TESTING AP...
- Publication number 20210199690
- Publication date Jul 1, 2021
- CHROMA ATE INC.
- Chin-Yi OUYANG
- G01 - MEASURING TESTING
Information Patent Application
Sliding test device for electronic components
- Publication number 20200081060
- Publication date Mar 12, 2020
- CHROMA ATE INC.
- Chin-Yi Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RADIATOR MODULE SYSTEM FOR AUTOMATIC TEST EQUIPMENT
- Publication number 20150198659
- Publication date Jul 16, 2015
- CHROMA ATE INC.
- XIN-YI WU
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC RETEST METHOD FOR SYSTEM-LEVEL IC TEST EQUIPMENT AND IC T...
- Publication number 20150066414
- Publication date Mar 5, 2015
- CHROMA ATE INC.
- Chin-Yi Ouyang
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS WITH DRY ENVIRONMENT
- Publication number 20140182397
- Publication date Jul 3, 2014
- CHROMA ATE INC.
- Xin-Yi WU
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM WITH ROTATIONAL TEST ARMS FOR TESTING SEMICONDUCTOR COM...
- Publication number 20140103954
- Publication date Apr 17, 2014
- CHROMA ATE INC.
- Chien-Ming CHEN
- G01 - MEASURING TESTING
Information Patent Application
Radiator Module System for Automatic Test Equipment
- Publication number 20130127483
- Publication date May 23, 2013
- Xin-Yi WU
- G01 - MEASURING TESTING
Information Patent Application
Temperature Control System for IC Tester
- Publication number 20130113509
- Publication date May 9, 2013
- Xin-Yi WU
- G01 - MEASURING TESTING

Chin-Yi OU YANG

Person

Patents Grantslast 30 patents

Temperature control and method for devices under test and image sen...

Chip transfer device capable of floatingly positioning a chip and m...

Multistory electronic device testing apparatus

Sliding test device for electronic components

Locking mechanism for a press head and electronic device testing ap...

Radiator module system for automatic test equipment

Test system with rotational test arms for testing semiconductor com...

Test apparatus with dry environment

Radiator module system for automatic test equipment

Patents Applicationslast 30 patents

POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...

POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...

Liquid cooling system, liquid cooling method and electronic device-...

TEMPERATURE CONTROL SYSTEM AND METHOD FOR ELECTRONIC DEVICE-TESTING...

AGING TEST SYSTEM AND AGING TEST METHOD FOR THERMAL INTERFACE MATER...

Method and apparatus for testing a package-on-package semiconductor...

Temperature control system, temperature control method and image se...

ELECTRONIC DEVICE TESTING APPARATUS AND ELECTRONIC DEVICE TESTING M...

Multistory Electronic Device Testing Apparatus

POSITION CALIBRATION SYSTEM AND METHOD

CHIP TRANSFER DEVICE CAPABLE OF FLOATINGLY POSITIONING A CHIP AND M...

LOCKING MECHANISM FOR A PRESS HEAD AND ELECTRONIC DEVICE TESTING AP...

Sliding test device for electronic components

RADIATOR MODULE SYSTEM FOR AUTOMATIC TEST EQUIPMENT

AUTOMATIC RETEST METHOD FOR SYSTEM-LEVEL IC TEST EQUIPMENT AND IC T...

TEST APPARATUS WITH DRY ENVIRONMENT

TEST SYSTEM WITH ROTATIONAL TEST ARMS FOR TESTING SEMICONDUCTOR COM...

Radiator Module System for Automatic Test Equipment

Temperature Control System for IC Tester