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Choon-Leong Lou

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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    ALIGNMENT METHOD AND ALIGNMENT DEVICE
    • Publication number 20240096716
    • Publication date Mar 21, 2024
    • STAR TECHNOLOGIES (WUHAN) CO., LTD.
    • CHOON LEONG LOU
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    PROBE DEVICE
    • Publication number 20230341439
    • Publication date Oct 26, 2023
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE AND ELASTIC STRUCTURE THEREOF
    • Publication number 20230314473
    • Publication date Oct 5, 2023
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE STRUCTURE
    • Publication number 20230314475
    • Publication date Oct 5, 2023
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE TESTING DEVICE HAVING ELASTIC STRUCTURE
    • Publication number 20230194570
    • Publication date Jun 22, 2023
    • STAR TECHNOLOGIES (WUHAN) CO., LTD.
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    LIGHT GUIDING DEVICE FOR APPLYING TO SILICON PHOTONICS STRUCTURE
    • Publication number 20230185036
    • Publication date Jun 15, 2023
    • STAR TECHNOLOGIES (WUHAN) CO., LTD.
    • CHOON LEONG LOU
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    PROBE CARD DEVICE AND TESTING EQUIPMENT THEREOF
    • Publication number 20230147867
    • Publication date May 11, 2023
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE AND PROBE CARD DEVICE
    • Publication number 20230036268
    • Publication date Feb 2, 2023
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBING SYSTEM
    • Publication number 20220221492
    • Publication date Jul 14, 2022
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR STRUCTURE
    • Publication number 20220199488
    • Publication date Jun 23, 2022
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • Choon Leong LOU
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SHIELDING FOR PROBING SYSTEM
    • Publication number 20210311111
    • Publication date Oct 7, 2021
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD, PROBING SYSTEM AND PROBING METHOD
    • Publication number 20210208182
    • Publication date Jul 8, 2021
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBING DEVICE
    • Publication number 20210199711
    • Publication date Jul 1, 2021
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE APPARATUS
    • Publication number 20210173003
    • Publication date Jun 10, 2021
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • CHANG-MING LIN
    • G01 - MEASURING TESTING
  • Information Patent Application

    TESTING DEVICE
    • Publication number 20140145740
    • Publication date May 29, 2014
    • STAR TECHNOLOGIES, INC.
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    MICROSCOPE HAVING MULTIPLE IMAGE- OUTPUTTING DEVICES AND PROBING AP...
    • Publication number 20090128897
    • Publication date May 21, 2009
    • STAR TECHNOLOGIES INC.
    • Yong Yu Liu
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    INTEGRATED CIRCUIT PROBING APPARATUS HAVING A TEMPERATURE-ADJUSTING...
    • Publication number 20080048700
    • Publication date Feb 28, 2008
    • STAR TECHNOLOGIES INC.
    • Choon Leong Lou
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD FOR INTEGRATED CIRCUITS
    • Publication number 20070069745
    • Publication date Mar 29, 2007
    • STAR TECHNOLOGIES INC.
    • Choon-Leong Lou
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD
    • Publication number 20060186908
    • Publication date Aug 24, 2006
    • Star Technologies Inc.
    • Choon-Leong Lou
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD
    • Publication number 20050174133
    • Publication date Aug 11, 2005
    • STAR TECHNOLOGIES INC.
    • Choon-Leong Lou
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe card for testing a semiconductor
    • Publication number 20040119463
    • Publication date Jun 24, 2004
    • Star Technologies Inc.
    • Choon-Leong Lou
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe card and method for manufacturing the same
    • Publication number 20030122563
    • Publication date Jul 3, 2003
    • Choon-Leong Lou
    • G01 - MEASURING TESTING