Membership
Tour
Register
Log in
Chris Talbot
Follow
Person
Emerald Hills, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Controlling an intensity profile of an energy beam in additive manu...
Patent number
10,421,125
Issue date
Sep 24, 2019
Applied Materials, Inc.
Hou T. Ng
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Controlling an intensity profile of an energy beam with a deformabl...
Patent number
10,307,822
Issue date
Jun 4, 2019
Applied Materials, Inc.
Hou T. Ng
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Extreme ultraviolet (EUV) substrate inspection system with simplifi...
Patent number
9,915,621
Issue date
Mar 13, 2018
Applied Materials, Inc.
Majeed A. Foad
G01 - MEASURING TESTING
Information
Patent Grant
System and method for defect localization on electrical test struct...
Patent number
7,969,564
Issue date
Jun 28, 2011
Applied Materials Israel, Ltd.
Gilad Almogy
G01 - MEASURING TESTING
Information
Patent Grant
High current electron beam inspection
Patent number
7,602,197
Issue date
Oct 13, 2009
Applied Materials, Israel, Ltd.
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Grant
Contact opening metrology
Patent number
7,476,875
Issue date
Jan 13, 2009
Applied Materials, Israel, Ltd.
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Grant
Contact opening metrology
Patent number
7,381,978
Issue date
Jun 3, 2008
Applied Materials, Israel, Ltd.
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Grant
Contact opening metrology
Patent number
7,279,689
Issue date
Oct 9, 2007
Applied Materials, Israel, Ltd.
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Grant
Detection of defects in patterned substrates
Patent number
7,253,645
Issue date
Aug 7, 2007
Applied Materials, Inc.
Christopher G. Talbot
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Contact opening metrology
Patent number
7,038,224
Issue date
May 2, 2006
Applied Materials, Israel, Ltd.
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Grant
Detection of defects in patterned substrates
Patent number
6,914,441
Issue date
Jul 5, 2005
Applied Materials, Inc.
Christopher G. Talbot
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for enhanced voltage contrast analysis
Patent number
6,914,443
Issue date
Jul 5, 2005
Applied Materials Israel, Ltd.
Alon Litman
G01 - MEASURING TESTING
Information
Patent Grant
Feature-based defect detection
Patent number
6,539,106
Issue date
Mar 25, 2003
Applied Materials, Inc.
Harry S. Gallarda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Through-the-substrate investigation of flip-chip IC's
Patent number
6,518,571
Issue date
Feb 11, 2003
Schlumberger Technologies, Inc.
Christopher Graham Talbot
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus for detecting defects in patterned substrates
Patent number
6,509,750
Issue date
Jan 21, 2003
Applied Materials, Inc.
Christopher G. Talbot
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and apparatus for testing semiconductor and integrated circ...
Patent number
6,504,393
Issue date
Jan 7, 2003
Applied Materials, Inc.
Chiwoei Wayne Lo
G01 - MEASURING TESTING
Information
Patent Grant
Method of detecting defects in patterned substrates
Patent number
6,252,412
Issue date
Jun 26, 2001
Schlumberger Technologies, Inc.
Christopher G. Talbot
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Through-the-substrate investigation of flip chip IC's
Patent number
6,225,626
Issue date
May 1, 2001
Schlumberger Technologies, Inc.
Christopher Graham Talbot
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for detecting defects in wafers
Patent number
6,091,249
Issue date
Jul 18, 2000
Schlumberger Technologies, Inc.
Christopher Graham Talbot
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring electrical waveforms using atomi...
Patent number
5,959,458
Issue date
Sep 28, 1999
Schlumberger Technologies, Inc.
Christopher Graham Talbot
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Through-the-substrate investigation of flip-chip IC's
Patent number
5,821,549
Issue date
Oct 13, 1998
Schlumberger Technologies, Inc.
Christopher Graham Talbot
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optimal probe point placement
Patent number
5,675,499
Issue date
Oct 7, 1997
Schlumberger Technologies Inc.
William T. Lee
G01 - MEASURING TESTING
Information
Patent Grant
Self-masking FIB milling
Patent number
5,616,921
Issue date
Apr 1, 1997
Schlumberger Technologies Inc.
Christopher G. Talbot
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method of probing a net of an IC at an optimal probe-point
Patent number
5,530,372
Issue date
Jun 25, 1996
Schlumberger Technologies, Inc.
William T. Lee
G01 - MEASURING TESTING
Information
Patent Grant
Layout overlay for FIB operations
Patent number
5,401,972
Issue date
Mar 28, 1995
Schlumberger Technologies, Inc.
Christopher G. Talbot
G01 - MEASURING TESTING
Information
Patent Grant
Focused ion beam processing with charge control
Patent number
5,357,116
Issue date
Oct 18, 1994
Schlumberger Technologies, Inc.
Christopher G. Talbot
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Methods and apparatus for acquiring data from intermittently failin...
Patent number
5,144,225
Issue date
Sep 1, 1992
Schlumberger Technologies, Inc.
Christopher G. Talbot
G01 - MEASURING TESTING
Information
Patent Grant
IC modification with focused ion beam system
Patent number
5,140,164
Issue date
Aug 18, 1992
Schlumberger Technologies, Inc.
Christopher G. Talbot
B24 - GRINDING POLISHING
Patents Applications
last 30 patents
Information
Patent Application
DIFFUSE OPTICAL IMAGING/TOMOGRAPHY USING META-OPTICS
Publication number
20240099617
Publication date
Mar 28, 2024
Applied Materials, Inc.
David Alexander SELL
G01 - MEASURING TESTING
Information
Patent Application
CONTROLLING AN INTENSITY PROFILE OF AN ENERGY BEAM WITH A DEFORMABL...
Publication number
20180029126
Publication date
Feb 1, 2018
Hou T. Ng
B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information
Patent Application
CONTROLLING AN INTENSITY PROFILE OF AN ENERGY BEAM IN ADDITIVE MANU...
Publication number
20180029127
Publication date
Feb 1, 2018
Hou T. Ng
B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information
Patent Application
EXTREME ULTRAVIOLET (EUV) SUBSTRATE INSPECTION SYSTEM WITH SIMPLIFI...
Publication number
20160282280
Publication date
Sep 29, 2016
Applied Materials, Inc.
Majeed A. Foad
G01 - MEASURING TESTING
Information
Patent Application
CONTACT OPENING METROLOGY
Publication number
20070257191
Publication date
Nov 8, 2007
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Application
High current electron beam inspection
Publication number
20070057687
Publication date
Mar 15, 2007
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Application
System and method for defect localization on electrical test struct...
Publication number
20060192904
Publication date
Aug 31, 2006
Gilad Almogy
G01 - MEASURING TESTING
Information
Patent Application
Contact opening metrology
Publication number
20060113471
Publication date
Jun 1, 2006
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Application
Detection of defects in patterned substrates
Publication number
20050200841
Publication date
Sep 15, 2005
APPLIED MATERIALS, INC.
Christopher G. Talbot
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Contact opening metrology
Publication number
20050173657
Publication date
Aug 11, 2005
Applied Materials,Inc
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Application
Contact opening metrology
Publication number
20040021076
Publication date
Feb 5, 2004
Applied Materials Israel Ltd.
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for enhanced voltage contrast analysis
Publication number
20040017212
Publication date
Jan 29, 2004
Applied Materials Israel Ltd.
Alon Litman
G01 - MEASURING TESTING
Information
Patent Application
Detection of defects in patterned substrates
Publication number
20020166964
Publication date
Nov 14, 2002
Christopher G. Talbot
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Through-the-substrate investigation of flip-chip IC's
Publication number
20010010356
Publication date
Aug 2, 2001
Christopher Graham Talbot
H01 - BASIC ELECTRIC ELEMENTS