Christina Papagianni

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Cross-temperature mitigation in a memory system
- Patent number 12,141,467
- Issue date Nov 12, 2024
- Micron Technology, Inc.
- Murong Lang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Empty page scan operations adjustment
- Patent number 11,960,745
- Issue date Apr 16, 2024
- Micron Technology, Inc.
- Peng Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Write operation techniques for memory systems
- Patent number 11,710,517
- Issue date Jul 25, 2023
- Micron Technology, Inc.
- Zhongyuan Lu
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods including memory and operation of same
- Patent number 11,615,844
- Issue date Mar 28, 2023
- Micron Technology, Inc.
- Innocenzo Tortorelli
- G11 - INFORMATION STORAGE
Information Patent Grant
Write operations to mitigate write disturb
- Patent number 11,609,712
- Issue date Mar 21, 2023
- Micron Technology, Inc.
- Christina Papagianni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Write operation techniques for memory systems
- Patent number 11,244,717
- Issue date Feb 8, 2022
- Micron Technology, Inc.
- Zhongyuan Lu
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods including memory and operation of same
- Patent number 11,074,971
- Issue date Jul 27, 2021
- Micron Technology, Inc.
- Innocenzo Tortorelli
- G11 - INFORMATION STORAGE
Information Patent Grant
Write operations to mitigate write disturb
- Patent number 11,037,638
- Issue date Jun 15, 2021
- Micron Technology, Inc.
- Christina Papagianni
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods including memory and operation of same
- Patent number 10,418,102
- Issue date Sep 17, 2019
- Micron Technology, Inc.
- Innocenzo Tortorelli
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods including memory and operation of same
- Patent number 10,381,077
- Issue date Aug 13, 2019
- Micron Technology, Inc.
- Innocenzo Tortorelli
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods including memory and operation of same
- Patent number 10,134,470
- Issue date Nov 20, 2018
- Micron Technology, Inc.
- Innocenzo Tortorelli
- G11 - INFORMATION STORAGE
Information Patent Grant
Material test structure
- Patent number 9,645,102
- Issue date May 9, 2017
- Micron Technology, Inc.
- Fabio Pellizzer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Material test structure
- Patent number 8,945,403
- Issue date Feb 3, 2015
- Micron Technology, Inc.
- Fabio Pellizzer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HALF GOOD BLOCK HANDLING WITH DEFECTIVE DECK PRE-PROGRAMING IN A ME...
- Publication number 20240331784
- Publication date Oct 3, 2024
- Micron Technology, Inc.
- Hanping Chen
- G11 - INFORMATION STORAGE
Information Patent Application
EMPTY PAGE SCAN OPERATIONS ADJUSTMENT
- Publication number 20240231666
- Publication date Jul 11, 2024
- Micron Technology, Inc.
- Peng Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROGRAM VERIFY LEVEL ADJUSTMENT FOR PROGRAM OPERATION IN A MEMORY D...
- Publication number 20240203503
- Publication date Jun 20, 2024
- Micron Technology, Inc.
- Yu-Chung Lien
- G11 - INFORMATION STORAGE
Information Patent Application
NAND DETECT EMPTY PAGE SCAN
- Publication number 20240071514
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- Christina Papagianni
- G11 - INFORMATION STORAGE
Information Patent Application
EMPTY PAGE SCAN OPERATIONS ADJUSTMENT
- Publication number 20240061600
- Publication date Feb 22, 2024
- Micron Technology, Inc.
- Peng Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CROSS-TEMPERATURE MITIGATION IN A MEMORY SYSTEM
- Publication number 20240028248
- Publication date Jan 25, 2024
- Micron Technology, Inc.
- Murong Lang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WRITE OPERATION TECHNIQUES FOR MEMORY SYSTEMS
- Publication number 20220130444
- Publication date Apr 28, 2022
- Micron Technology, Inc.
- Zhongyuan Lu
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS INCLUDING MEMORY AND OPERATION OF SAME
- Publication number 20220013173
- Publication date Jan 13, 2022
- Micron Technology, Inc.
- Innocenzo Tortorelli
- G11 - INFORMATION STORAGE
Information Patent Application
WRITE OPERATIONS TO MITIGATE WRITE DISTURB
- Publication number 20210272636
- Publication date Sep 2, 2021
- Micron Technology, Inc.
- Christina Papagianni
- G11 - INFORMATION STORAGE
Information Patent Application
WRITE OPERATIONS TO MITIGATE WRITE DISTURB
- Publication number 20210181976
- Publication date Jun 17, 2021
- Micron Technology, Inc.
- Christina Papagianni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WRITE OPERATION TECHNIQUES FOR MEMORY SYSTEMS
- Publication number 20210166746
- Publication date Jun 3, 2021
- Micron Technology, Inc.
- Zhongyuan Lu
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS INCLUDING MEMORY AND OPERATION OF SAME
- Publication number 20190325957
- Publication date Oct 24, 2019
- Micron Technology, Inc.
- Innocenzo Tortorelli
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS INCLUDING MEMORY AND OPERATION OF SAME
- Publication number 20190027218
- Publication date Jan 24, 2019
- Micron Technology, Inc.
- Innocenzo Tortorelli
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS INCLUDING MEMORY AND OPERATION OF SAME
- Publication number 20170125097
- Publication date May 4, 2017
- Micron Technology, Inc.
- Innocenzo Tortorelli
- G11 - INFORMATION STORAGE
Information Patent Application
MATERIAL TEST STRUCTURE
- Publication number 20150160146
- Publication date Jun 11, 2015
- Micron Technology, Inc.
- Fabio Pellizzer
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL TEST STRUCTURE
- Publication number 20130283936
- Publication date Oct 31, 2013
- Micron Technology, Inc.
- Fabio Pellizzer
- G01 - MEASURING TESTING

Christina Papagianni

Person

Patents Grantslast 30 patents

Cross-temperature mitigation in a memory system

Empty page scan operations adjustment

Write operation techniques for memory systems

Apparatuses and methods including memory and operation of same

Write operations to mitigate write disturb

Write operation techniques for memory systems

Apparatuses and methods including memory and operation of same

Write operations to mitigate write disturb

Apparatuses and methods including memory and operation of same

Apparatuses and methods including memory and operation of same

Apparatuses and methods including memory and operation of same

Material test structure

Material test structure

Patents Applicationslast 30 patents

HALF GOOD BLOCK HANDLING WITH DEFECTIVE DECK PRE-PROGRAMING IN A ME...

EMPTY PAGE SCAN OPERATIONS ADJUSTMENT

PROGRAM VERIFY LEVEL ADJUSTMENT FOR PROGRAM OPERATION IN A MEMORY D...

NAND DETECT EMPTY PAGE SCAN

EMPTY PAGE SCAN OPERATIONS ADJUSTMENT

CROSS-TEMPERATURE MITIGATION IN A MEMORY SYSTEM

WRITE OPERATION TECHNIQUES FOR MEMORY SYSTEMS

APPARATUSES AND METHODS INCLUDING MEMORY AND OPERATION OF SAME

WRITE OPERATIONS TO MITIGATE WRITE DISTURB

WRITE OPERATIONS TO MITIGATE WRITE DISTURB

WRITE OPERATION TECHNIQUES FOR MEMORY SYSTEMS

APPARATUSES AND METHODS INCLUDING MEMORY AND OPERATION OF SAME

APPARATUSES AND METHODS INCLUDING MEMORY AND OPERATION OF SAME

APPARATUSES AND METHODS INCLUDING MEMORY AND OPERATION OF SAME

MATERIAL TEST STRUCTURE

MATERIAL TEST STRUCTURE