Christof Krampe-Zadler

Person

Castrop-Rauxel, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus for the optical inspection of wafers
- Patent number 8,451,440
- Issue date May 28, 2013
- KLA-Tencor MIE GmbH
- Kurt Hahn
- G01 - MEASURING TESTING
Information Patent Grant
Illumination means and inspection means having an illumination means
- Patent number 8,087,799
- Issue date Jan 3, 2012
- Vistec Semiconductor Systems GmbH
- Kurt Hahn
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus for the Optical Inspection of Wafers
- Publication number 20100295938
- Publication date Nov 25, 2010
- KLA-TENCOR MIE GMBH
- Kurt Hahn
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR THE INSPECTION OF DEFECTS ON THE EDGE REGION...
- Publication number 20090279080
- Publication date Nov 12, 2009
- Vistec Semiconductor Systems GmbH
- Lambert Danner
- G01 - MEASURING TESTING
Information Patent Application
Illumination means and inspection means having an illumination means
- Publication number 20090086483
- Publication date Apr 2, 2009
- Vistec Semiconductor System GmbH
- Kurt Hahn
- G01 - MEASURING TESTING
Information Patent Application
Device and method for scanning the whole surface of a wafer
- Publication number 20090034832
- Publication date Feb 5, 2009
- Vistec Semiconductor Systems GmbH
- Wolfgang Vollrath
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for wafer inspection
- Publication number 20080144025
- Publication date Jun 19, 2008
- Vistec Semiconductor Systems GmbH
- Wolfgang Vollrath
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for wafer inspection
- Publication number 20080144014
- Publication date Jun 19, 2008
- Vistec Semiconductor Systems GmbH
- Wolfgang Vollrath
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for Inspecting a Wafer
- Publication number 20070013902
- Publication date Jan 18, 2007
- Vistec Semiconductor Systems GmbH
- Henning Backhauss
- G01 - MEASURING TESTING
Information Patent Application
Method of optically imaging and inspecting a wafer in the context o...
- Publication number 20060286811
- Publication date Dec 21, 2006
- Vistec Semiconductor Systems GmbH
- Michael Heiden
- G01 - MEASURING TESTING

Christof Krampe-Zadler

Person

Patents Grantslast 30 patents

Apparatus for the optical inspection of wafers

Illumination means and inspection means having an illumination means

Patents Applicationslast 30 patents

Apparatus for the Optical Inspection of Wafers

DEVICE AND METHOD FOR THE INSPECTION OF DEFECTS ON THE EDGE REGION...

Illumination means and inspection means having an illumination means

Device and method for scanning the whole surface of a wafer

Apparatus for wafer inspection

Apparatus for wafer inspection

Apparatus for Inspecting a Wafer

Method of optically imaging and inspecting a wafer in the context o...