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Christoph Werner LERCHE
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Herzogenrath, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Dipole antenna array for hybrid MR-PET and MR-SPECT scans and use t...
Patent number
12,123,931
Issue date
Oct 22, 2024
Forschungszentrum Juelich GmbH
Chang-Hoon Choi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for the position and energy determination in scintillation d...
Patent number
11,650,335
Issue date
May 16, 2023
Forschungszentrum Juelich GmbH
Christoph Lerche
G01 - MEASURING TESTING
Information
Patent Grant
Sensor chip
Patent number
11,054,533
Issue date
Jul 6, 2021
Forschungszentrum Juelich GmbH
Christoph Lerche
G01 - MEASURING TESTING
Information
Patent Grant
SIPM sensor chip
Patent number
10,605,931
Issue date
Mar 31, 2020
Forschungszentrum Juelich GmbH
Christoph Lerche
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for the signal processing of a photosensor
Patent number
10,539,686
Issue date
Jan 21, 2020
Forschungszentrum Juelich GmbH
Christoph Lerche
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for the evaluation of gamma radiation events
Patent number
10,061,043
Issue date
Aug 28, 2018
Koninklijke Philips N.V.
Christoph Werner Lerche
G01 - MEASURING TESTING
Information
Patent Grant
Pixel identification for small pitch scintillation crystal arrays
Patent number
9,753,146
Issue date
Sep 5, 2017
Koninklijke Philips N.V.
Christoph Werner Lerche
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR THE POSITION AND ENERGY DETERMINATION IN SCINTILLATION D...
Publication number
20220373699
Publication date
Nov 24, 2022
FORSCHUNGSZENTRUM JUELICH GMBH
Christoph Lerche
G01 - MEASURING TESTING
Information
Patent Application
DIPOLE ANTENNA ARRAY FOR HYBRID MR-PET AND MR-SPECT SCANS AND USE T...
Publication number
20220236353
Publication date
Jul 28, 2022
FORSCHUNGSZENTRUM JUELICH GMBH
Chang-Hoon Choi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SENSOR CHIP FOR DETECTING LIGHT
Publication number
20220128721
Publication date
Apr 28, 2022
FORSCHUNGSZENTRUM JUELICH GMBH
Christoph Lerche
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR THE SIGNAL PROCESSING OF A PHOTOSENSOR
Publication number
20190339399
Publication date
Nov 7, 2019
FORSCHUNGSZENTRUM JUELICH GMBH
Christoph LERCHE
G01 - MEASURING TESTING
Information
Patent Application
SENSOR CHIP
Publication number
20190204461
Publication date
Jul 4, 2019
FORSCHUNGSZENTRUM JUELICH GMBH
Christoph LERCHE
G01 - MEASURING TESTING
Information
Patent Application
SIPM SENSOR CHIP
Publication number
20180329085
Publication date
Nov 15, 2018
FORSCHUNGSZENTRUM JUELICH GMBH
Christoph Lerche
G01 - MEASURING TESTING
Information
Patent Application
PIXEL IDENTIFICATION FOR SMALL PITCH SCINTILLATION CRYSTAL ARRAYS
Publication number
20160187497
Publication date
Jun 30, 2016
Koninklijke Philips N.V.
Christoph Werner LERCHE
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR THE EVALUATION OF GAMMA RADIATION EVENTS
Publication number
20160084974
Publication date
Mar 24, 2016
Koninklijke Philips N.V.
Christoph Werner LERCHE
G01 - MEASURING TESTING
Information
Patent Application
REDUCING INTERFERENCE IN A COMBINED SYSTEM COMPRISING AN MRI SYSTEM...
Publication number
20160045112
Publication date
Feb 18, 2016
Koninklijke Philips N.V.
Bjoern WEISSLER
G01 - MEASURING TESTING