Christophe Wouters

Person

Balen, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus, method and computer program product for defect detection...
- Patent number 11,892,493
- Issue date Feb 6, 2024
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, method and computer program product for defect detection...
- Patent number 11,726,126
- Issue date Aug 15, 2023
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Grant
Combined transmitted and reflected light imaging of internal cracks...
- Patent number 11,340,284
- Issue date May 24, 2022
- KLA Corporation
- Kristiaan Van Rossen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus, method and computer program product for defect detection...
- Patent number 11,105,839
- Issue date Aug 31, 2021
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, method and computer program product for defect detection...
- Patent number 10,935,503
- Issue date Mar 2, 2021
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Grant
Chromatic confocal area sensor
- Patent number 10,866,092
- Issue date Dec 15, 2020
- KLA-Tencor Corporation
- Christophe Wouters
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, method and computer program product for defect detection...
- Patent number 10,324,044
- Issue date Jun 18, 2019
- KLA-Tencor Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Grant
Object carrier, system and method for back light inspection
- Patent number 9,778,192
- Issue date Oct 3, 2017
- KLA-Tencor Corporation
- Christophe Wouters
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for three dimensional inspection of wafer saw...
- Patent number 9,140,546
- Issue date Sep 22, 2015
- KLA-Tencor Corporation
- Benoit Maison
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for three dimensional inspection of wafer saw...
- Patent number 9,103,665
- Issue date Aug 11, 2015
- KLA-Tencor Corporation
- Benoit Maison
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
- Publication number 20230393185
- Publication date Dec 7, 2023
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
- Publication number 20220099725
- Publication date Mar 31, 2022
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
- Publication number 20210048396
- Publication date Feb 18, 2021
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Application
Combined Transmitted and Reflected Light Imaging of Internal Cracks...
- Publication number 20210025934
- Publication date Jan 28, 2021
- KLA Corporation
- Kristiaan Van Rossen
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
- Publication number 20210018450
- Publication date Jan 21, 2021
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Application
CHROMATIC CONFOCAL AREA SENSOR
- Publication number 20200033121
- Publication date Jan 30, 2020
- KLA-Tencor Corporation
- Christophe Wouters
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
- Publication number 20190302033
- Publication date Oct 3, 2019
- KLA-Tencor Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
- Publication number 20160313257
- Publication date Oct 27, 2016
- KLA-Tencor Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Application
OBJECT CARRIER, SYSTEM AND METHOD FOR BACK LIGHT INSPECTION
- Publication number 20150168304
- Publication date Jun 18, 2015
- KLA-Tencor Corporation
- Christophe Wouters
- G01 - MEASURING TESTING
Information Patent Application
MULTI DIRECTIONAL ILLUMINATION FOR A MICROSCOPE AND MICROSCOPE
- Publication number 20140185136
- Publication date Jul 3, 2014
- KLA-Tencor Corporation
- Christophe WOUTERS
- G02 - OPTICS
Information Patent Application
APPARATUS AND METHOD FOR THREE DIMENSIONAL INSPECTION OF WAFER SAW...
- Publication number 20120300039
- Publication date Nov 29, 2012
- KLA-Tencor Corporation
- Benoit Maison
- G01 - MEASURING TESTING

Christophe Wouters

Person

Patents Grantslast 30 patents

Apparatus, method and computer program product for defect detection...

Apparatus, method and computer program product for defect detection...

Combined transmitted and reflected light imaging of internal cracks...

Apparatus, method and computer program product for defect detection...

Apparatus, method and computer program product for defect detection...

Chromatic confocal area sensor

Apparatus, method and computer program product for defect detection...

Object carrier, system and method for back light inspection

Apparatus and method for three dimensional inspection of wafer saw...

Apparatus and method for three dimensional inspection of wafer saw...

Patents Applicationslast 30 patents

APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...

APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...

APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...

Combined Transmitted and Reflected Light Imaging of Internal Cracks...

APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...

CHROMATIC CONFOCAL AREA SENSOR

APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...

APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...

OBJECT CARRIER, SYSTEM AND METHOD FOR BACK LIGHT INSPECTION

MULTI DIRECTIONAL ILLUMINATION FOR A MICROSCOPE AND MICROSCOPE

APPARATUS AND METHOD FOR THREE DIMENSIONAL INSPECTION OF WAFER SAW...