Christopher A. Menkus

Person

Munich, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Duty-cycle correction for clock receiver
- Patent number 7,525,358
- Issue date Apr 28, 2009
- National Semiconductor Corporation
- Robert Callaghan Taft
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
On-chip resistor calibration apparatus and method
- Patent number 7,332,904
- Issue date Feb 19, 2008
- National Semiconductor Corporation
- Christopher Alan Menkus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coarse channel calibration for folding ADC architectures
- Patent number 7,088,281
- Issue date Aug 8, 2006
- National Semiconductor Corporation
- Christopher Alan Menkus
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Generating reference voltages
- Patent number 7,071,670
- Issue date Jul 4, 2006
- National Semiconductor Corporation
- Ols Hidri
- G05 - CONTROLLING REGULATING
Information Patent Grant
Accurate sampling technique for ADC
- Patent number 7,068,195
- Issue date Jun 27, 2006
- National Semiconductor Corporation
- Christopher Alan Menkus
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus and method for on-chip ADC calibration
- Patent number 7,046,179
- Issue date May 16, 2006
- National Semiconductor Corporation
- Robert C. Taft
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
ADC linearity improvement
- Patent number 6,847,320
- Issue date Jan 25, 2005
- National Semiconductor Corporation
- Robert C. Taft
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Amplifier array termination
- Patent number 6,822,600
- Issue date Nov 23, 2004
- National Semiconductor Corporation
- Robert C. Taft
- H03 - BASIC ELECTRONIC CIRCUITRY

Christopher A. Menkus

Person

Patents Grantslast 30 patents

Duty-cycle correction for clock receiver

On-chip resistor calibration apparatus and method

Coarse channel calibration for folding ADC architectures

Generating reference voltages

Accurate sampling technique for ADC

Apparatus and method for on-chip ADC calibration

ADC linearity improvement

Amplifier array termination