Christopher C. McQuilkin

Person

Hollis, NH, US

People

Patents Grantslast 30 patents

Information Patent Grant
Comparator with configurable operating modes
- Patent number 12,191,864
- Issue date Jan 7, 2025
- Analog Devices, Inc.
- Christopher C. McQuilkin
- G01 - MEASURING TESTING
Information Patent Grant
Path loss compensation for comparator
- Patent number 11,686,773
- Issue date Jun 27, 2023
- Analog Devices, Inc.
- Christopher C. McQuilkin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Comparator with configurable operating modes
- Patent number 11,637,551
- Issue date Apr 25, 2023
- Analog Devices, Inc.
- Christopher C. McQuilkin
- G11 - INFORMATION STORAGE
Information Patent Grant
Partitioned force-sense system for test equipment
- Patent number 11,340,295
- Issue date May 24, 2022
- Analog Devices, Inc.
- Amit Kumar Singh
- G01 - MEASURING TESTING
Information Patent Grant
Pin driver and test equipment calibration
- Patent number 11,313,903
- Issue date Apr 26, 2022
- Analog Devices, Inc.
- Amit Kumar Singh
- G01 - MEASURING TESTING
Information Patent Grant
Segmented pin driver system
- Patent number 11,300,608
- Issue date Apr 12, 2022
- Analog Devices, Inc.
- Christopher C. McQuilkin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Compound pin driver controller
- Patent number 11,264,906
- Issue date Mar 1, 2022
- Analog Devices, Inc.
- Christopher C. McQuilkin
- G01 - MEASURING TESTING
Information Patent Grant
Compound pin driver
- Patent number 11,125,817
- Issue date Sep 21, 2021
- Analog Devices, Inc.
- Christopher C. McQuilkin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Comparator with configurable operating modes
- Patent number 11,128,287
- Issue date Sep 21, 2021
- Analog Devices, Inc.
- Christopher C. McQuilkin
- G01 - MEASURING TESTING
Information Patent Grant
Robust architecture for mode switching of a force and measure appar...
- Patent number 11,105,843
- Issue date Aug 31, 2021
- Analog Devices International Unlimited Company
- Amit Kumar Singh
- G01 - MEASURING TESTING
Information Patent Grant
Deskew circuit for automated test systems
- Patent number 10,547,294
- Issue date Jan 28, 2020
- Analog Devices, Inc.
- Andrew Nathan Mort
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Multiple-level driver circuit with non-commutating bridge
- Patent number 10,209,307
- Issue date Feb 19, 2019
- Analog Devices, Inc.
- Christopher C. McQuilkin
- G01 - MEASURING TESTING
Information Patent Grant
Comparator circuit with input attenuator
- Patent number 9,813,050
- Issue date Nov 7, 2017
- Analog Devices, Inc.
- Christopher C. McQuilkin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Pin driver circuit with improved swing fidelity
- Patent number 8,901,972
- Issue date Dec 2, 2014
- Analog Devices, Inc.
- Christopher C. McQuilkin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Direct-coupled laser diode driver structures and methods
- Patent number 6,560,258
- Issue date May 6, 2003
- Analog Devices, Inc.
- Christopher McQuilkin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Comparator structures and methods for automatic test equipment
- Patent number 6,414,496
- Issue date Jul 2, 2002
- Analog Devices, Inc.
- Christopher McQuilkin
- G01 - MEASURING TESTING
Information Patent Grant
Test interface circuits with waveform synthesizers having reduced s...
- Patent number 6,166,569
- Issue date Dec 26, 2000
- Analog Devices, Inc.
- Christopher McQuilkin
- G01 - MEASURING TESTING
Information Patent Grant
High-speed comparator with improved latch accuracy
- Patent number 6,121,798
- Issue date Sep 19, 2000
- Analog Devices, Inc.
- Christopher McQuilkin
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
CONFIGURABLE PIN DRIVER CIRCUIT OUTPUT IMPEDANCE BACKGROUND
- Publication number 20240418777
- Publication date Dec 19, 2024
- Analog Devices, Inc.
- Christopher C. McQuilkin
- G01 - MEASURING TESTING
Information Patent Application
COMPARATOR WITH CONFIGURABLE OPERATING MODES
- Publication number 20230231547
- Publication date Jul 20, 2023
- Analog Devices, Inc.
- Christopher C. McQuilkin
- G11 - INFORMATION STORAGE
Information Patent Application
PIN DRIVER AND TEST EQUIPMENT CALIBRATION
- Publication number 20220099738
- Publication date Mar 31, 2022
- Analog Devices, Inc.
- Amit Kumar Singh
- G01 - MEASURING TESTING
Information Patent Application
PARTITIONED FORCE-SENSE SYSTEM FOR TEST EQUIPMENT
- Publication number 20220099739
- Publication date Mar 31, 2022
- Analog Devices, Inc.
- Amit Kumar Singh
- G01 - MEASURING TESTING
Information Patent Application
COMPARATOR WITH CONFIGURABLE OPERATING MODES
- Publication number 20210391854
- Publication date Dec 16, 2021
- Analog Devices, Inc.
- Christopher C. McQuilkin
- G11 - INFORMATION STORAGE
Information Patent Application
COMPARATOR WITH CONFIGURABLE OPERATING MODES
- Publication number 20210297069
- Publication date Sep 23, 2021
- Analog Devices, Inc.
- Christopher C. McQuilkin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
COMPOUND PIN DRIVER CONTROLLER
- Publication number 20210184579
- Publication date Jun 17, 2021
- Analog Devices, Inc.
- Christopher C. McQuilkin
- G01 - MEASURING TESTING
Information Patent Application
COMPOUND PIN DRIVER
- Publication number 20210109155
- Publication date Apr 15, 2021
- Analog Devices, Inc.
- Christopher C. McQuilkin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ROBUST ARCHITECTURE FOR MODE SWITCHING OF A FORCE AND MEASURE APPAR...
- Publication number 20210109151
- Publication date Apr 15, 2021
- Analog Devices International Unlimited Company
- Amit Kumar Singh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DESKEW CIRCUIT FOR AUTOMATED TEST SYSTEMS
- Publication number 20180358957
- Publication date Dec 13, 2018
- Analog Devices, Inc.
- Andrew Nathan Mort
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE-LEVEL DRIVER CIRCUIT WITH NON-COMMUTATING BRIDGE
- Publication number 20170336473
- Publication date Nov 23, 2017
- Analog Devices, Inc.
- Christopher C. McQuilkin
- G01 - MEASURING TESTING
Information Patent Application
COMPARATOR CIRCUIT WITH INPUT ATTENUATOR
- Publication number 20170302257
- Publication date Oct 19, 2017
- Analog Devices, Inc.
- Christopher C. McQuilkin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEGMENTED PIN DRIVER SYSTEM
- Publication number 20170269149
- Publication date Sep 21, 2017
- Analog Devices, Inc.
- Christopher C. McQuilkin
- G01 - MEASURING TESTING
Information Patent Application
PIN DRIVER CIRCUIT WITH IMPROVED SWING FIDELITY
- Publication number 20140191783
- Publication date Jul 10, 2014
- Analog Devices, Inc.
- Christopher C. McQuilkin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Voltage conveyor for changing voltage levels in a controlled manner
- Publication number 20080054970
- Publication date Mar 6, 2008
- Analog Devices, Inc.
- Anthony E. Turvey
- H03 - BASIC ELECTRONIC CIRCUITRY

Christopher C. McQuilkin

Person

Patents Grantslast 30 patents

Comparator with configurable operating modes

Path loss compensation for comparator

Comparator with configurable operating modes

Partitioned force-sense system for test equipment

Pin driver and test equipment calibration

Segmented pin driver system

Compound pin driver controller

Compound pin driver

Comparator with configurable operating modes

Robust architecture for mode switching of a force and measure appar...

Deskew circuit for automated test systems

Multiple-level driver circuit with non-commutating bridge

Comparator circuit with input attenuator

Pin driver circuit with improved swing fidelity

Direct-coupled laser diode driver structures and methods

Comparator structures and methods for automatic test equipment

Test interface circuits with waveform synthesizers having reduced s...

High-speed comparator with improved latch accuracy

Patents Applicationslast 30 patents

CONFIGURABLE PIN DRIVER CIRCUIT OUTPUT IMPEDANCE BACKGROUND

COMPARATOR WITH CONFIGURABLE OPERATING MODES

PIN DRIVER AND TEST EQUIPMENT CALIBRATION

PARTITIONED FORCE-SENSE SYSTEM FOR TEST EQUIPMENT

COMPARATOR WITH CONFIGURABLE OPERATING MODES

COMPARATOR WITH CONFIGURABLE OPERATING MODES

COMPOUND PIN DRIVER CONTROLLER

COMPOUND PIN DRIVER

ROBUST ARCHITECTURE FOR MODE SWITCHING OF A FORCE AND MEASURE APPAR...

DESKEW CIRCUIT FOR AUTOMATED TEST SYSTEMS

MULTIPLE-LEVEL DRIVER CIRCUIT WITH NON-COMMUTATING BRIDGE

COMPARATOR CIRCUIT WITH INPUT ATTENUATOR

SEGMENTED PIN DRIVER SYSTEM

PIN DRIVER CIRCUIT WITH IMPROVED SWING FIDELITY

Voltage conveyor for changing voltage levels in a controlled manner