Christopher J. Evans

Person

Concord, NC, US

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement of changes in surfaces of objects
- Patent number 8,456,644
- Issue date Jun 4, 2013
- Zygo Corporation
- Christopher J. Evans
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for tilt corrected lateral shear in a lateral...
- Patent number 7,446,883
- Issue date Nov 4, 2008
- Zygo Corporation
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for interferometric measurement of components...
- Patent number 7,221,461
- Issue date May 22, 2007
- Zygo Corporation
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for high accuracy metrology and positioning o...
- Patent number 6,876,452
- Issue date Apr 5, 2005
- Zygo Corporation
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Grant
Metrology system for precision 3D motion
- Patent number 6,876,453
- Issue date Apr 5, 2005
- Zygo Corporation
- Matthew Van Doren
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for calibrating an interferometer using a sele...
- Patent number 6,816,267
- Issue date Nov 9, 2004
- Zygo Corporation
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for interferometric dimensional metrology
- Patent number 6,801,323
- Issue date Oct 5, 2004
- Zygo Corporation
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Grant
Rapid in situ mastering of an aspheric Fizeau with residual error c...
- Patent number 6,734,979
- Issue date May 11, 2004
- Zygo Corporation
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Grant
Rapid in-situ mastering of an aspheric fizeau
- Patent number 6,714,308
- Issue date Mar 30, 2004
- Zygo Corporation
- Christopher James Evans
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Measurement of Changes in Surfaces of Objects
- Publication number 20110051147
- Publication date Mar 3, 2011
- Zygo Corporation
- Christopher J. Evans
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for tilt corrected lateral shear in a lateral...
- Publication number 20060285123
- Publication date Dec 21, 2006
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Application
Adaptive nulls for testing off-axis segments of aspherics
- Publication number 20060268282
- Publication date Nov 30, 2006
- Christopher J. Evans
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for interferometric measurement of components...
- Publication number 20060033934
- Publication date Feb 16, 2006
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Application
Metrology system for precision 3D motion
- Publication number 20030223078
- Publication date Dec 4, 2003
- Matthew Van Doren
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and methods for high accuracy metrology and positioning o...
- Publication number 20030112445
- Publication date Jun 19, 2003
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for calibrating an interferometer using a sele...
- Publication number 20030090798
- Publication date May 15, 2003
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for interferometric dimensional metrology
- Publication number 20030090677
- Publication date May 15, 2003
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Application
Rapid in situ mastering of an aspheric fizeau with residual error c...
- Publication number 20030090678
- Publication date May 15, 2003
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Application
Rapid in-situ mastering of an aspheric fizeau
- Publication number 20030048457
- Publication date Mar 13, 2003
- Christopher James Evans
- G01 - MEASURING TESTING

Christopher J. Evans

Person

Patents Grantslast 30 patents

Measurement of changes in surfaces of objects

Method and apparatus for tilt corrected lateral shear in a lateral...

Method and apparatus for interferometric measurement of components...

Apparatus and methods for high accuracy metrology and positioning o...

Metrology system for precision 3D motion

Apparatus and method for calibrating an interferometer using a sele...

Methods and apparatus for interferometric dimensional metrology

Rapid in situ mastering of an aspheric Fizeau with residual error c...

Rapid in-situ mastering of an aspheric fizeau

Patents Applicationslast 30 patents

Measurement of Changes in Surfaces of Objects

Method and apparatus for tilt corrected lateral shear in a lateral...

Adaptive nulls for testing off-axis segments of aspherics

Method and apparatus for interferometric measurement of components...

Metrology system for precision 3D motion

Apparatus and methods for high accuracy metrology and positioning o...

Apparatus and method for calibrating an interferometer using a sele...

Methods and apparatus for interferometric dimensional metrology

Rapid in situ mastering of an aspheric fizeau with residual error c...

Rapid in-situ mastering of an aspheric fizeau