Chuan H. Liu

Person

Taipei, TW

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for an external processor to access internal regi...
- Patent number 11,188,339
- Issue date Nov 30, 2021
- Chuan-Wei Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for transmitting physical layer operation administration and...
- Patent number 11,178,004
- Issue date Nov 16, 2021
- Chuan-Wei Liu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor structure and manufacturing method thereof
- Patent number 10,461,200
- Issue date Oct 29, 2019
- United Microelectronics Corp.
- Wen-Chieh Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Handling a failed processor of a multiprocessor information handlin...
- Patent number 8,898,517
- Issue date Nov 25, 2014
- International Business Machines Corporation
- Yao-Chun Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Handling a failed processor of multiprocessor information handling...
- Patent number 8,892,944
- Issue date Nov 18, 2014
- International Business Machines Corporation
- Yao-Chun Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transmission line pulse method for measuring electrostatic discharg...
- Patent number 6,570,388
- Issue date May 27, 2003
- United Microeletronics Corp.
- Ming-Tsan Lee
- G01 - MEASURING TESTING
Information Patent Grant
Reliability testing method of dielectric thin film
- Patent number 6,269,315
- Issue date Jul 31, 2001
- United Microelectronics Corp.
- Kuan-Yu Fu
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating an oxide layer on silicon with carbon ions i...
- Patent number 6,268,269
- Issue date Jul 31, 2001
- United Microelectronics Corp.
- Ming-Tsan Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lifetime measurement of an ultra-thin dielectric layer
- Patent number 6,249,139
- Issue date Jun 19, 2001
- United Microelectronics Corp.
- Kuan-Yu Fu
- G01 - MEASURING TESTING
Information Patent Grant
Method of local oxidation using etchant and oxidizer
- Patent number 6,169,035
- Issue date Jan 2, 2001
- United Microelectronic Corp.
- Chuan H. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge protective circuit formed by use of a silic...
- Patent number 6,072,677
- Issue date Jun 6, 2000
- United Microelectronics Corp.
- Mainn-Gwo Chen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR TRANSMITTING PHYSICAL LAYER OPERATION ADMINISTRATION AND...
- Publication number 20200389351
- Publication date Dec 10, 2020
- 5V Technologies Ltd.
- Chuan-Wei Liu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM AND METHOD FOR AN EXTERNAL PROCESSOR TO ACCESS INTERNAL REGI...
- Publication number 20200387376
- Publication date Dec 10, 2020
- 5V Technologies Ltd.
- Chuan-Wei Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POWER SAVING OUTLET SYSTEM AND METHOD FOR CONTROLLING THEREOF
- Publication number 20130187458
- Publication date Jul 25, 2013
- KUEI-CHIH LIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HANDLING A FAILED PROCESSOR OF MULTIPROCESSOR INFORMATION HANDLING...
- Publication number 20120278653
- Publication date Nov 1, 2012
- International Business Machines Corporation
- Yao-Chun Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR HANDLING FAILED PROCESSOR OF MULTIPROCESSO...
- Publication number 20120173922
- Publication date Jul 5, 2012
- International Business Machiness Corporation
- Yao-Chun Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Transmission line pulse method for measuring electrostatic discharg...
- Publication number 20020171431
- Publication date Nov 21, 2002
- Ming-Tsan Lee
- G01 - MEASURING TESTING

Chuan H. Liu

Person

Patents Grantslast 30 patents

System and method for an external processor to access internal regi...

Method for transmitting physical layer operation administration and...

Semiconductor structure and manufacturing method thereof

Handling a failed processor of a multiprocessor information handlin...

Handling a failed processor of multiprocessor information handling...

Transmission line pulse method for measuring electrostatic discharg...

Reliability testing method of dielectric thin film

Method for fabricating an oxide layer on silicon with carbon ions i...

Lifetime measurement of an ultra-thin dielectric layer

Method of local oxidation using etchant and oxidizer

Electrostatic discharge protective circuit formed by use of a silic...

Patents Applicationslast 30 patents

METHOD FOR TRANSMITTING PHYSICAL LAYER OPERATION ADMINISTRATION AND...

SYSTEM AND METHOD FOR AN EXTERNAL PROCESSOR TO ACCESS INTERNAL REGI...

POWER SAVING OUTLET SYSTEM AND METHOD FOR CONTROLLING THEREOF

HANDLING A FAILED PROCESSOR OF MULTIPROCESSOR INFORMATION HANDLING...

APPARATUS AND METHOD FOR HANDLING FAILED PROCESSOR OF MULTIPROCESSO...

Transmission line pulse method for measuring electrostatic discharg...