Clark Bryan

Person

Mountain View, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optical inspection system with polarization isolation of detection...
- Patent number 8,436,997
- Issue date May 7, 2013
- Xyratex Technology Limited
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Grant
Scatterometer-interferometer and method for detecting and distingui...
- Patent number 7,671,978
- Issue date Mar 2, 2010
- Xyratex Technology Limited
- Bryan Clark
- G01 - MEASURING TESTING
Information Patent Grant
Resonant ellipsometer and method for determining ellipsometric para...
- Patent number 7,330,277
- Issue date Feb 12, 2008
- Xyratex Technology Limited
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Grant
Fabry-perot resonator apparatus and method including an in-resonato...
- Patent number 7,294,825
- Issue date Nov 13, 2007
- Xyratex Technology Limited
- Gregory Toker
- G01 - MEASURING TESTING
Information Patent Grant
Fabry-Perot resonator apparatus and method for observing low reflec...
- Patent number 7,282,729
- Issue date Oct 16, 2007
- Xyratex Technology Limited
- Brunfeld Andrei
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional imaging resonator and method therefor
- Patent number 7,220,955
- Issue date May 22, 2007
- Xyratex Technology Limited
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Grant
Resonator method and system for distinguishing characteristics of s...
- Patent number 7,214,932
- Issue date May 8, 2007
- Xyratex Technology Limited
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for optical measurement via a resonator having a...
- Patent number 7,193,725
- Issue date Mar 20, 2007
- Xyratex Technology Ltd.
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for determining surface feature characteristics u...
- Patent number 7,102,740
- Issue date Sep 5, 2006
- Xyratex Technology Ltd.
- Bryan Clark
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus including in-resonator imaging lens for improv...
- Patent number 7,022,978
- Issue date Apr 4, 2006
- Xyratex Technology Limited
- Bryan Clark
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for determining dimensions of optically recogniza...
- Patent number 6,927,864
- Issue date Aug 9, 2005
- Xyratex Technology Limited
- Bryan Kevin Clark
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for performing swept-wavelength measurements with...
- Patent number 6,879,421
- Issue date Apr 12, 2005
- Beyond 3, Inc.
- Bryan Clark
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for performing swept-wavelength measurements with...
- Patent number 6,778,307
- Issue date Aug 17, 2004
- Beyond 3, Inc.
- Bryan Clark
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for controlling resonance within a resonator-enha...
- Patent number 6,717,707
- Issue date Apr 6, 2004
- Beyond 3, Inc.
- Bryan Clark
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection method and apparatus having an enhanced height s...
- Patent number 6,714,295
- Issue date Mar 30, 2004
- Beyond 3, Inc.
- Bryan Kevin Clark
- G01 - MEASURING TESTING
Information Patent Grant
Optical storage method and apparatus having enhanced resolution
- Patent number 6,700,840
- Issue date Mar 2, 2004
- Beyond 3, Inc.
- Bryan Kevin Clark
- G11 - INFORMATION STORAGE
Information Patent Grant
Optical measurement and inspection method and apparatus having enha...
- Patent number 6,653,649
- Issue date Nov 25, 2003
- Beyond 3
- Bryan Kevin Clark
- G01 - MEASURING TESTING
Information Patent Grant
System of beam narrowing for resolution enhancement and method ther...
- Patent number 6,522,471
- Issue date Feb 18, 2003
- Z Tek Inc.
- Bryan Kevin Clark
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL INSPECTION SYSTEM WITH POLARIZATION ISOLATION OF DETECTION...
- Publication number 20120154806
- Publication date Jun 21, 2012
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING SYSTEM WITH MATCHED COLLECTION LENS AND DETECTOR...
- Publication number 20120057154
- Publication date Mar 8, 2012
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING SYSTEM WITH ILLUMINATION PROVIDED THROUGH A VOID...
- Publication number 20120057172
- Publication date Mar 8, 2012
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENCE-DETECTING DISK INSPECTION SYSTEM
- Publication number 20120008135
- Publication date Jan 12, 2012
- Gregory Toker
- G01 - MEASURING TESTING
Information Patent Application
SCATTEROMETER-INTERFEROMETER AND METHOD FOR DETECTING AND DISTINGUI...
- Publication number 20080266547
- Publication date Oct 30, 2008
- Bryan Clark
- G01 - MEASURING TESTING
Information Patent Application
Three-dimensional imaging resonator and method therefor
- Publication number 20050279954
- Publication date Dec 22, 2005
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Application
Resonator method and system for distinguishing characteristics of s...
- Publication number 20050236589
- Publication date Oct 27, 2005
- Xyratex Technology Limited
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Application
Fabry-perot resonator apparatus and method including an in-resonato...
- Publication number 20050232330
- Publication date Oct 20, 2005
- Xyratex Technology Limited
- Gregory Toker
- G01 - MEASURING TESTING
Information Patent Application
Resonant ellipsometer and method for determining ellipsometric para...
- Publication number 20050225775
- Publication date Oct 13, 2005
- Xyratex Technology Limited
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Application
Fabry-perot resonator apparatus and method for observing low reflec...
- Publication number 20050218350
- Publication date Oct 6, 2005
- Xyratex Technology Limited
- Andrei Brunfeld
- G02 - OPTICS
Information Patent Application
Method and system for determining surface feature characteristics u...
- Publication number 20050046829
- Publication date Mar 3, 2005
- Bryan Clark
- G01 - MEASURING TESTING
Information Patent Application
Method and system for performing swept-wavelength measurements with...
- Publication number 20040190148
- Publication date Sep 30, 2004
- Bryan Clark
- G01 - MEASURING TESTING
Information Patent Application
Method and system for optical measurement via a resonator having a...
- Publication number 20040156085
- Publication date Aug 12, 2004
- Andrei Brunfeld
- G02 - OPTICS
Information Patent Application
Method and apparatus including in-resonator imaging lens for improv...
- Publication number 20040037175
- Publication date Feb 26, 2004
- Bryan Clark
- G02 - OPTICS
Information Patent Application
Method and system for determining dimensions of optically recogniza...
- Publication number 20040021877
- Publication date Feb 5, 2004
- Bryan Kevin Clark
- G01 - MEASURING TESTING
Information Patent Application
Method and system for performing swept-wavelength measurements with...
- Publication number 20030184867
- Publication date Oct 2, 2003
- Bryan Clark
- G02 - OPTICS
Information Patent Application
Method and system for controlling resonance within a resonator-enha...
- Publication number 20030128435
- Publication date Jul 10, 2003
- Bryan Clark
- G02 - OPTICS
Information Patent Application
Optical inspection method and apparatus having an enhanced height s...
- Publication number 20030076490
- Publication date Apr 24, 2003
- Bryan Kevin Clark
- G01 - MEASURING TESTING
Information Patent Application
Optical measurement and inspection method and apparatus having enha...
- Publication number 20030035118
- Publication date Feb 20, 2003
- Bryan Kevin Clark
- G01 - MEASURING TESTING
Information Patent Application
Optical storage method and apparatus having enhanced resolution
- Publication number 20020181342
- Publication date Dec 5, 2002
- Bryan Kevin Clark
- B82 - NANO-TECHNOLOGY
Information Patent Application
System of beam narrowing for resolution enhancement and method ther...
- Publication number 20020113974
- Publication date Aug 22, 2002
- Bryan Kevin Clark
- G01 - MEASURING TESTING

Clark Bryan

Person

Patents Grantslast 30 patents

Optical inspection system with polarization isolation of detection...

Scatterometer-interferometer and method for detecting and distingui...

Resonant ellipsometer and method for determining ellipsometric para...

Fabry-perot resonator apparatus and method including an in-resonato...

Fabry-Perot resonator apparatus and method for observing low reflec...

Three-dimensional imaging resonator and method therefor

Resonator method and system for distinguishing characteristics of s...

Method and system for optical measurement via a resonator having a...

Method and system for determining surface feature characteristics u...

Method and apparatus including in-resonator imaging lens for improv...

Method and system for determining dimensions of optically recogniza...

Method and system for performing swept-wavelength measurements with...

Method and system for performing swept-wavelength measurements with...

Method and system for controlling resonance within a resonator-enha...

Optical inspection method and apparatus having an enhanced height s...

Optical storage method and apparatus having enhanced resolution

Optical measurement and inspection method and apparatus having enha...

System of beam narrowing for resolution enhancement and method ther...

Patents Applicationslast 30 patents

OPTICAL INSPECTION SYSTEM WITH POLARIZATION ISOLATION OF DETECTION...

OPTICAL MEASURING SYSTEM WITH MATCHED COLLECTION LENS AND DETECTOR...

OPTICAL MEASURING SYSTEM WITH ILLUMINATION PROVIDED THROUGH A VOID...

FLUORESCENCE-DETECTING DISK INSPECTION SYSTEM

SCATTEROMETER-INTERFEROMETER AND METHOD FOR DETECTING AND DISTINGUI...

Three-dimensional imaging resonator and method therefor

Resonator method and system for distinguishing characteristics of s...

Fabry-perot resonator apparatus and method including an in-resonato...

Resonant ellipsometer and method for determining ellipsometric para...

Fabry-perot resonator apparatus and method for observing low reflec...

Method and system for determining surface feature characteristics u...

Method and system for performing swept-wavelength measurements with...

Method and system for optical measurement via a resonator having a...

Method and apparatus including in-resonator imaging lens for improv...

Method and system for determining dimensions of optically recogniza...

Method and system for performing swept-wavelength measurements with...

Method and system for controlling resonance within a resonator-enha...

Optical inspection method and apparatus having an enhanced height s...

Optical measurement and inspection method and apparatus having enha...

Optical storage method and apparatus having enhanced resolution

System of beam narrowing for resolution enhancement and method ther...