Cohen Yoel

Person

Nes Ziona, IL

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for performing tear film structure measurement
- Patent number 12,023,099
- Issue date Jul 2, 2024
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Apparatus and methods for calibrating optical measurements
- Patent number 11,965,777
- Issue date Apr 23, 2024
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Cohen
- G01 - MEASURING TESTING
Information Patent Grant
System and method for performing tear film structure measurement
- Patent number 11,116,394
- Issue date Sep 14, 2021
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Apparatus and methods for performing tomography and/or topography m...
- Patent number 10,612,913
- Issue date Apr 7, 2020
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and method for detecting surface topography
- Patent number 10,456,029
- Issue date Oct 29, 2019
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for analyzing an object
- Patent number 10,415,954
- Issue date Sep 17, 2019
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Grant
System for analyzing optical properties of an object
- Patent number 10,330,462
- Issue date Jun 25, 2019
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric ellipsometry and method using conical refraction
- Patent number 10,119,903
- Issue date Nov 6, 2018
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing an object using a combination of long and shor...
- Patent number 10,054,419
- Issue date Aug 21, 2018
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Grant
System for tomography and/or topography measurements of a layered o...
- Patent number 10,054,429
- Issue date Aug 21, 2018
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Interferometric ellipsometry and method using conical refraction
- Patent number 10,024,783
- Issue date Jul 17, 2018
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Grant
System for analyzing optical properties of an object
- Patent number 10,024,650
- Issue date Jul 17, 2018
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Grant
System and method for performing tear film structure measurement
- Patent number 9,833,139
- Issue date Dec 5, 2017
- ADOM, Advanced Optical Technologies Ltd.
- Yoel Arieli
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
System and method for performing tear film structure measurement an...
- Patent number 9,757,027
- Issue date Sep 12, 2017
- ADOM, Advanced Optical Technologies Ltd.
- Yoel Arieli
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Monitoring apparatus and method particularly useful in photolithogr...
- Patent number 9,291,911
- Issue date Mar 22, 2016
- Nova Measuring Instruments Ltd.
- Giora Dishon
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for use in monitoring properties of patterned str...
- Patent number 8,964,178
- Issue date Feb 24, 2015
- Nova Measuring Instruments Ltd.
- Yoel Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring apparatus and method particularly useful in photolithogr...
- Patent number 8,780,320
- Issue date Jul 15, 2014
- Nova Measuring Instuments Ltd.
- Giora Dishon
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for use in monitoring properties of patterned str...
- Patent number 8,643,842
- Issue date Feb 4, 2014
- Nova Measuring Instruments Ltd.
- Yoel Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Thin films measurement method and system
- Patent number 8,564,793
- Issue date Oct 22, 2013
- Nova Measuring Instruments Ltd.
- Yoel Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring apparatus and method particularly useful in photolithogr...
- Patent number 8,482,715
- Issue date Jul 9, 2013
- Nova Measuring Instruments Ltd.
- Giora Dishon
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for use in monitoring properties of patterned str...
- Patent number 8,289,515
- Issue date Oct 16, 2012
- Nova Measuring Instruments Ltd.
- Yoel Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring in patterned structures
- Patent number 8,142,965
- Issue date Mar 27, 2012
- Nova Measuring Instruments Ltd.
- Cohen Yoel
- G01 - MEASURING TESTING
Information Patent Grant
Thin films measurement method and system
- Patent number 8,040,532
- Issue date Oct 18, 2011
- Nova Measuring Instruments Ltd.
- Yoel Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring apparatus and method particularly useful in photolithogr...
- Patent number 7,821,614
- Issue date Oct 26, 2010
- Nova Measuring Instruments Ltd.
- Giora Dishon
- G01 - MEASURING TESTING
Information Patent Grant
Thin films measurement method and system
- Patent number 7,595,896
- Issue date Sep 29, 2009
- Nova Measuring Instruments Ltd.
- Yoel Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring apparatus and method particularly useful in photolithogr...
- Patent number 7,525,634
- Issue date Apr 28, 2009
- Nova Measuring Instruments Ltd.
- Giora Dishon
- G01 - MEASURING TESTING
Information Patent Grant
Thin films measurement method and system
- Patent number 7,327,476
- Issue date Feb 5, 2008
- Nova Measuring Instruments Ltd.
- Yoel Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring apparatus and method particularly useful in photolithogr...
- Patent number 7,289,190
- Issue date Oct 30, 2007
- Nova Measuring Instruments Ltd.
- Giora Dishon
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring apparatus and method particularly useful in photolithogr...
- Patent number 7,030,957
- Issue date Apr 18, 2006
- Nova Measuring Instruments Ltd.
- Giora Dishon
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring apparatus and method particularly useful in photolithogr...
- Patent number 6,842,220
- Issue date Jan 11, 2005
- Nova Measuring Instruments Ltd.
- Giora Dishon
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Dual Axis Solar Tracking Module
- Publication number 20240275328
- Publication date Aug 15, 2024
- Asayag Energy Ltd.
- Roni ASAYAG
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SYSTEM AND METHOD FOR DETECTING PHYSICAL CHARACTERISTICS OF A MULTI...
- Publication number 20230157535
- Publication date May 25, 2023
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel COHEN
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
APPARATUS AND METHODS FOR CALIBRATING OPTICAL MEASUREMENTS
- Publication number 20220034716
- Publication date Feb 3, 2022
- Yoel COHEN
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SYSTEM AND METHOD FOR PERFORMING TEAR FILM STRUCTURE MEASUREMENT
- Publication number 20220007933
- Publication date Jan 13, 2022
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SYSTEM AND METHOD FOR PERFORMING TEAR FILM STRUCTURE MEASUREMENT
- Publication number 20190183333
- Publication date Jun 20, 2019
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Method for Analyzing an Object
- Publication number 20190017804
- Publication date Jan 17, 2019
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Methods for Performing Tomography and/or Topography M...
- Publication number 20180340770
- Publication date Nov 29, 2018
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR ANALYZING OPTICAL PROPERTIES OF AN OBJECT
- Publication number 20180299252
- Publication date Oct 18, 2018
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
Interferometric Ellipsometry and Method using Conical Refraction
- Publication number 20180275047
- Publication date Sep 27, 2018
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Detecting Surface Topography
- Publication number 20180070813
- Publication date Mar 15, 2018
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD FOR PERFORMING TEAR FILM STRUCTURE MEASUREMENT
- Publication number 20170332897
- Publication date Nov 23, 2017
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G02 - OPTICS
Information Patent Application
SYSTEM FOR ANALYZING OPTICAL PROPERTIES OF AN OBJECT
- Publication number 20170241766
- Publication date Aug 24, 2017
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
System for Tomography and/or Topography Measurements of a Layered O...
- Publication number 20170074644
- Publication date Mar 16, 2017
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
Method for Analyzing an Object Using a Combination of Long and Shor...
- Publication number 20170038191
- Publication date Feb 9, 2017
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
Interferometric Ellipsometry and Method using Conical Refraction
- Publication number 20170023464
- Publication date Jan 26, 2017
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Performing Tear Film Structure Measurement an...
- Publication number 20160338585
- Publication date Nov 24, 2016
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G02 - OPTICS
Information Patent Application
MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGR...
- Publication number 20140320837
- Publication date Oct 30, 2014
- Giora DISHON
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR USE IN MONITORING PROPERTIES OF PATTERNED STR...
- Publication number 20140142869
- Publication date May 22, 2014
- NOVA MEASURING INSTRUMENTS LTD.
- YOEL COHEN
- G01 - MEASURING TESTING
Information Patent Application
MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGR...
- Publication number 20130293872
- Publication date Nov 7, 2013
- Giora DISHON
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR USE IN MONITORING PROPERTIES OF PATTERNED STR...
- Publication number 20130096876
- Publication date Apr 18, 2013
- NOVA MEASURING INSTRUMENTS LTD.
- YOEL COHEN
- G01 - MEASURING TESTING
Information Patent Application
THIN FILMS MEASUREMENT METHOD AND SYSTEM
- Publication number 20120044506
- Publication date Feb 23, 2012
- NOVA MEASURING INSTRUMENTS LTD.
- Yoel Cohen
- G01 - MEASURING TESTING
Information Patent Application
MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGR...
- Publication number 20110037957
- Publication date Feb 17, 2011
- NOVA MEASURING INSTRUMENTS LTD.
- Giora Dishon
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR USE IN MONITORING PROPERTIES OF PATTERNED STR...
- Publication number 20100141948
- Publication date Jun 10, 2010
- Yoel Cohen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING IN PATTERNED STRUCTURES
- Publication number 20100099033
- Publication date Apr 22, 2010
- Yoel Cohen
- G01 - MEASURING TESTING
Information Patent Application
Thin Films measurment method and system
- Publication number 20100010659
- Publication date Jan 14, 2010
- Nova Measuring Instruments Ltd.
- Yoel Cohen
- G01 - MEASURING TESTING
Information Patent Application
MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGR...
- Publication number 20090231558
- Publication date Sep 17, 2009
- NOVA MEASURING INSTRUMENTS LTD.
- Giora Dishon
- G01 - MEASURING TESTING
Information Patent Application
Thin films measurement method and system
- Publication number 20080204721
- Publication date Aug 28, 2008
- Yoel Cohen
- G01 - MEASURING TESTING
Information Patent Application
MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGR...
- Publication number 20080043229
- Publication date Feb 21, 2008
- NOVA MEASURING INSTRUMENTS LTD.
- Giora Dishon
- G01 - MEASURING TESTING
Information Patent Application
Monitoring apparatus and method particularly useful in photolithogr...
- Publication number 20060193630
- Publication date Aug 31, 2006
- NOVA MEASURING INSTRUMENTS LTD.
- Giora Dishon
- G01 - MEASURING TESTING
Information Patent Application
Display aid
- Publication number 20050183298
- Publication date Aug 25, 2005
- Yoel Cohen
- B42 - BOOKBINDING ALBUMS FILES SPECIAL PRINTED MATTER

Person

Patents Grantslast 30 patents

System and method for performing tear film structure measurement

Apparatus and methods for calibrating optical measurements

System and method for performing tear film structure measurement

Apparatus and methods for performing tomography and/or topography m...

Apparatus and method for detecting surface topography

Method for analyzing an object

System for analyzing optical properties of an object

Interferometric ellipsometry and method using conical refraction

Method for analyzing an object using a combination of long and shor...

System for tomography and/or topography measurements of a layered o...

Interferometric ellipsometry and method using conical refraction

System for analyzing optical properties of an object

System and method for performing tear film structure measurement

System and method for performing tear film structure measurement an...

Monitoring apparatus and method particularly useful in photolithogr...

Method and system for use in monitoring properties of patterned str...

Monitoring apparatus and method particularly useful in photolithogr...

Method and system for use in monitoring properties of patterned str...

Thin films measurement method and system

Monitoring apparatus and method particularly useful in photolithogr...

Method and system for use in monitoring properties of patterned str...

Method and system for measuring in patterned structures

Thin films measurement method and system

Monitoring apparatus and method particularly useful in photolithogr...

Thin films measurement method and system

Monitoring apparatus and method particularly useful in photolithogr...

Thin films measurement method and system

Monitoring apparatus and method particularly useful in photolithogr...

Monitoring apparatus and method particularly useful in photolithogr...

Monitoring apparatus and method particularly useful in photolithogr...

Patents Applicationslast 30 patents

Dual Axis Solar Tracking Module

SYSTEM AND METHOD FOR DETECTING PHYSICAL CHARACTERISTICS OF A MULTI...

APPARATUS AND METHODS FOR CALIBRATING OPTICAL MEASUREMENTS

SYSTEM AND METHOD FOR PERFORMING TEAR FILM STRUCTURE MEASUREMENT

SYSTEM AND METHOD FOR PERFORMING TEAR FILM STRUCTURE MEASUREMENT

Method for Analyzing an Object

Apparatus and Methods for Performing Tomography and/or Topography M...

SYSTEM FOR ANALYZING OPTICAL PROPERTIES OF AN OBJECT

Interferometric Ellipsometry and Method using Conical Refraction

Apparatus and Method for Detecting Surface Topography

SYSTEM AND METHOD FOR PERFORMING TEAR FILM STRUCTURE MEASUREMENT

SYSTEM FOR ANALYZING OPTICAL PROPERTIES OF AN OBJECT

System for Tomography and/or Topography Measurements of a Layered O...

Method for Analyzing an Object Using a Combination of Long and Shor...

Interferometric Ellipsometry and Method using Conical Refraction

System and Method for Performing Tear Film Structure Measurement an...

MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGR...

METHOD AND SYSTEM FOR USE IN MONITORING PROPERTIES OF PATTERNED STR...

MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGR...

METHOD AND SYSTEM FOR USE IN MONITORING PROPERTIES OF PATTERNED STR...

THIN FILMS MEASUREMENT METHOD AND SYSTEM

MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGR...

METHOD AND SYSTEM FOR USE IN MONITORING PROPERTIES OF PATTERNED STR...

METHOD AND SYSTEM FOR MEASURING IN PATTERNED STRUCTURES

Thin Films measurment method and system

MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGR...

Thin films measurement method and system

MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGR...

Monitoring apparatus and method particularly useful in photolithogr...

Display aid