Patent Application
20170023464
This invention relates to the use of conical refraction (CR) at a biaxial crystal for taking multi-polarizations ellipsometric measurements.
When a focused input Gaussian beam propagates along the optic axis of a biaxial crystal, it is transformed into a light ring, as shown in
One feature of the CR effect is that each point of the light ring is linearly polarized, with the polarization plane rotating along the ring so that every pair of diagonally opposite points has orthogonal polarizations. The biaxial crystal projects an input non-polarized beam into an infinite number of linearly polarized states.
Ellipsometry is an optical method for measuring a sample's properties such as thickness, complex refractive index or dielectric function tensor. The change of polarization of light upon transmission or reflection of the sample is measured and the sample's properties are calculated by comparing the results to a model. Typically, ellipsometry is done in the reflection mode. Since the ellipsometry exploits also phase information, very high resolution can be achieved.
Ellipsometry measures the complex reflectance ratio, ρ, of the system:
where rs, and rp are the normalized amplitudes of the s and p polarizations, after reflection from the sample. ρ may also be parameterized by the amplitude component ψ and the phase difference Δ.
In general, the angle of incidence is chosen to be close to the Brewster angle of the sample to ensure a maximal difference in rp and rs.
A typical apparatus for ellipsometric measurement is shown in
Two common ellipsometers are based on rotating the polarizer or the analyzer. For the rotating polarizer configuration, the polarization state of light on the polarization generation arm of the instrument is modulated by rotating the polarizer continuously during measurement at a constant angular frequency while the compensator angle and the analyzer angle are fixed. For the rotating analyzer configuration, the analyzer on the polarization detection arm is rotated continuously, while the polarizer angle and compensator settings (if available) are fixed.
Since in general, the measured ψ and Δ cannot be converted directly into the optical constants of the sample, a model analysis must be performed. Using an iterative procedure (least-squares minimization) unknown optical constants and/or thickness parameters are varied, and ψ and Δ values are calculated using the Fresnel equations. The calculated ψ and Δ values which best match the experimental data provide the optical constants and thickness parameters of the sample.
Single-wavelength ellipsometry employs a monochromatic light source. However, using a monochromatic light source restricts the results to one set of ψ and Δ values per measurement. Spectroscopic ellipsometry (SE) employs broad band light sources, which cover a certain spectral range in the infrared, visible or ultraviolet spectral region. By that the complex refractive index or the dielectric function tensor in the corresponding spectral region can be obtained, which gives access to a large number of fundamental physical properties. In spectroscopic ellipsometry, a white light source along with a monochromator of some sort is used. In some cases, the monochromator is positioned prior to the polarizer and in some cases, after the analyzer.
The complex reflectance ratio, ρ can also be attained by measuring the two complex amplitude of light reflected by the object for the two normal polarizations and dividing one complex amplitude of one polarization by the second complex amplitude of the normal polarization.
For very fast ellipsometric measurements the time needed for rotating the polarizer or the analyzer can be crucial.
There is thus required a method and system that allows parallel measurements and avoids the need for rotating the polarizer or the analyzer.
It is therefore an object of the present invention to provide a method and system that allows parallel measurements at an instant time and avoids the need for rotating the polarizer or the analyzer.
This object is realized in accordance with the invention by an apparatus and method for determining optical properties of an object having the features of the respective independent claims.
What is common to all embodiments is the use of a biaxial birefringent crystal for intercepting light reflected from an object and for propagating the light along an optical axis of the crystal and transforming the reflected light to a ring of light, each point of whose periphery has a different polarization plane. Typically, the polarization plane rotates between each pair of successive points along the periphery. Use of the biaxial birefringent crystal thus avoids the need to use a rotating polarizer or analyzer.
According to one embodiment of the present invention a biaxial crystal is used in conjunction with an ellipsometer for creating a ring of light with polarization plane rotating along the ring.
According to another embodiment of the present invention a dispersive biaxial crystal is used in conjunction with a multi-wavelength ellipsometer for creating different rings of light for each different wavelength with respective coaxial polarization planes rotating along each ring. This configuration also avoids the need for a spectrometer.
According to another embodiment of the present invention a biaxial crystal is used in conjunction with a multi-wavelength ellipsometer and a modulated light source for creating a ring of light with polarization plane rotating along the ring. This configuration also avoids the need for a spectrometer.
According to another embodiment of the present invention a biaxial crystal is used in conjunction with a multi-wavelength interferometer and a modulated light source for creating a ring of light with polarization plane rotating along the ring. This configuration also avoids the need for a spectrometer.
In order to understand the invention and to see how it may be carried out in practice, embodiments will now be described, by way of non-limiting example only, with reference to the accompanying drawing, in which:
Fourier Transform Spectrometry (FTS) utilizes a spectrometer that includes an interferometer which modulates the incoming light differently for different wavelengths due to the destructive and instructive interference. In a FTS based on a Michelson interferometer having a pair of mirrors one of which is moveable relative to the other, one of the mirrors is moved and the spectrometer actually serves as a filter with a varying cosine spectral transmission function dependent on its current optical path difference (OPD) between its mirrors. Since a filter can be located anywhere in the optical path of the light, in a FTS that utilizes a light source to illuminate an object to be analyzed, this filter can be also located just after the light source before impinging on the object. In this configuration the spectrum of the incoming light from the light source is modulated with a varying cosine function before impinging on the object. That is, by modulating the spectrum of the light source with a varying cosine function the need for using an additional spectrometer is avoided. In this case, the spectrum of the light reflected from the object is obtained by Fourier transforming its intensity function.
This embodiment describes a kind of multi wavelength ellipsometer in which there is no need for using a spectrometer or moving mirrors in the interferometer since modulating the spectrum of a broadband light source used performs an equivalent function as an interferometer. After reflecting from the object, the modulated broadband light is focused and it propagates along the optical axis of the biaxial crystal 30. Behind the biaxial crystal, the light is transformed into a light ring where each point of the ring is linearly polarized with a polarization plane rotating along the ring. The light ring is imaged either by propagation or by an optical system onto a detector array 40. Since the polarization plane of each point along the ring is rotated, it is equivalent to rotating an analyzer, therefore in this configuration there no need for the rotating analyzer. Also there is no need for a spectrometer to disperse the different wavelengths since by Fourier transforming the intensity function of the light reflected from the object, the spectrum of the reflected light can be obtained.
In still another embodiment, instead of using a modulated light source, a tunable light source such as a tunable laser is used. In this embodiment, after reflecting from the object, the light is focused and it propagates along the optical axis of the biaxial crystal 30. Behind the biaxial crystal, the light is transformed into a light ring where each point of the ring is linearly polarized with a polarization plane rotating along the ring. The light ring is imaged either by propagation or by an optical system onto a detector array 40. Since the polarization plane of each point along the ring is rotated, it is equivalent to rotating an analyzer, therefore in this configuration there no need for the rotating analyzer. Also there is no need for a spectrometer to disperse the different wavelengths since by tuning the light source, the ellipsometric data is taken at different wavelengths, one at a time.
The interferometer may be located in several different angles relative to the object to implement ellipsometry. Alternatively, the interferometer may be located normal or in several different angles to the object to implement reflectometry. In ellipsometry, the complex reflectance ratio, ρ of light is attained by dividing a complex amplitude of one polarization by the complex amplitude of its normal polarization. This can be done for every two normal polarizations to increase the accuracy. In reflectometry, the complex amplitude attained for each polarization can be compared to a calculated complex amplitude attained by a simulated amplitude. In small features in the object a form birefringence may be obtained and such comparison can increase the accuracy of the measurements.
The light source may also be located normal to the object or in several different angles relative to the object and it may be modulated as described above. The interferometer may be any kind of interferometer, Time Domain Optical Coherence Tomography (OCT), Fourier Domain OCT, Swept Source OCT, Dual Beam OCT, etc. This kind of Ellipsometry or Reflectometry is not sensitive to vibrations since the two polarizations suffer from the same vibrations and cancel each other's vibrations. In all cases described above the birefringent crystal may be omitted.
It should also be understood that in the arrangements shown in
In particular it should be noted that features that are described with reference to one or more embodiments are described by way of example rather than by way of limitation to those embodiments. Thus, unless stated otherwise or unless particular combinations are clearly inadmissible, optional features that are described with reference to only some embodiments are assumed to be likewise applicable to all other embodiments also.
| Filing Document | Filing Date | Country | Kind |
|---|---|---|---|
| PCT/IL2015/050077 | 1/22/2015 | WO | 00 |
| Number | Date | Country | |
|---|---|---|---|
| 61931626 | Jan 2014 | US | |
| 61948116 | Mar 2014 | US |
