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Conrad J. Dell'Oca
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Palo Alto, CA, US
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last 30 patents
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Patent Grant
Method of die burn-in
Patent number
5,489,538
Issue date
Feb 6, 1996
LSI Logic Corporation
Michael D. Rostoker
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for isolation of flux materials in "flip-chip"...
Patent number
5,410,805
Issue date
May 2, 1995
LSI Logic Corporation
Nicholas F. Pasch
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for isolation of flux materials in flip-chip m...
Patent number
5,299,730
Issue date
Apr 5, 1994
LSI Logic Corporation
Nicholas F. Pasch
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for isolation of flux materials in flip-chip m...
Patent number
5,168,346
Issue date
Dec 1, 1992
LSI Logic Corporation
Nicholas F. Pasch
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Apparatus for isolation of flux materials in "flip-chip" manufacturing
Patent number
5,111,279
Issue date
May 5, 1992
LSI Logic Corp.
Nicholas F. Pasch
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Double metal HCMOS compacted array
Patent number
4,884,118
Issue date
Nov 28, 1989
LSI Logic Corporation
Alex C. Hui
H01 - BASIC ELECTRIC ELEMENTS