Corey Senowitz

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San Diego, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Detaching probe from TEM sample during sample preparation
- Patent number 10,053,768
- Issue date Aug 21, 2018
- FEI Company
- Corey Senowitz
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Utilization of voltage contrast during sample preparation for trans...
- Patent number 9,779,910
- Issue date Oct 3, 2017
- QUALCOMM Incorporated
- Corey Senowitz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TEM sample preparation
- Patent number 9,378,925
- Issue date Jun 28, 2016
- FEI Company
- Jeffrey Blackwood
- G01 - MEASURING TESTING
Information Patent Grant
TEM sample preparation
- Patent number 9,177,760
- Issue date Nov 3, 2015
- FEI Company
- Jeffrey Blackwood
- G01 - MEASURING TESTING
Information Patent Grant
TEM sample preparation
- Patent number 8,859,998
- Issue date Oct 14, 2014
- FEI Company
- Jeffrey Blackwood
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple sample attachment to nano manipulator for high throughput...
- Patent number 8,729,469
- Issue date May 20, 2014
- FEI Company
- Michael Schmidt
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method of ROI Encapsulation During Axis Conversion of Cross-Section...
- Publication number 20180122652
- Publication date May 3, 2018
- QUALCOMM Incorporated
- Corey Senowitz
- G01 - MEASURING TESTING
Information Patent Application
TEM SAMPLE PREPARATION
- Publication number 20160020069
- Publication date Jan 21, 2016
- FEI Company
- Jeffrey Blackwood
- G01 - MEASURING TESTING
Information Patent Application
Detaching Probe from TEM Sample during Sample Preparation
- Publication number 20150075972
- Publication date Mar 19, 2015
- FEI Company
- Corey Senowitz
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
TEM SAMPLE PREPARATION
- Publication number 20150053548
- Publication date Feb 26, 2015
- FEI Company
- Jeffrey Blackwood
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEM Sample Preparation
- Publication number 20140217283
- Publication date Aug 7, 2014
- FEI Company
- Jeffrey Blackwood
- G01 - MEASURING TESTING